TY - GEN A1 - Petryk, Dmytro A1 - Kabin, Ievgen A1 - Langendoerfer, Peter A1 - Dyka, Zoya ED - Kotulski, Zbigniew T1 - Horizontal attack against EC kP accelerator under laser illumination T2 - Electronics N2 - Devices employing cryptographic approaches have to be resistant to physical attacks. Side-Channel Analysis (SCA) and Fault Injection (FI) attacks are frequently used to reveal cryptographic keys. In this paper, we present a combined SCA and laser illumination attack against an Elliptic Curve Scalar Multiplication accelerator, while using different equipment for the measurement of its power traces, i.e., we performed the measurements using a current probe from Riscure and a differential probe from Teledyne LeCroy, with an attack success of 70% and 90%, respectively. Our experiments showed that laser illumination increased the power consumption of the chip, especially its static power consumption, but the success of the horizontal power analysis attacks changed insignificantly. After applying 100% of the laser beam output power and illuminating the smallest area of 143 µm² , we observed an offset of 17 mV in the measured trace. We assume that using a laser with a high laser beam power, as well as concentrating on measuring and analysing only static current, can significantly improve the attack’s success. The attacks exploiting the Static Current under Laser Illumination (SCuLI attacks) are novel, and their potential has not yet been fully investigated. These attacks can be especially dangerous against cryptographic chips manufactured in downscaling technologies. If such attacks are feasible, appropriate countermeasures have to be proposed in the future. KW - Power analysis KW - Dynamic power KW - Static leakage power KW - Laser illumination Y1 - 2025 U6 - https://doi.org/10.3390/electronics14102072 SN - 2079-9292 VL - 14 IS - 10 SP - 1 EP - 21 PB - MDPI CY - Basel ER - TY - GEN A1 - Petryk, Dmytro A1 - Kabin, Ievgen A1 - Langendoerfer, Peter A1 - Dyka, Zoya T1 - Case study : horizontal side-channel analysis attack against elliptic curve scalar multiplication accelerator under laser illumination T2 - 2025 IEEE 26th Latin American Test Symposium (LATS) N2 - Devices employing cryptographic approaches have to be resistant to physical attacks. Side-Channel Analysis (SCA) and Fault Injection (FI) attacks are frequently used to reveal cryptographic keys. In this paper, we present a combined SCA and laser illumination attack against an Elliptic Curve Scalar Multiplication accelerator using a differential probe from Teledyne LeCroy. Our experiments show that laser illumination increases the power consumption of the chip, especially its static power consumption but the success of the horizontal power analysis attacks was changed insignificantly. We assume that using a laser with a high laser beam power and concentrating on measuring and analysing only static current can improve the attack success significantly. The horizontal attacks against public key cryptosystems exploiting the Static Consumption under Laser Illumination (SCuLI attacks) are novel and their potential is not investigated yet. These attacks can be especially dangerous against cryptographic chips manufactured in scaled technologies. If such attacks are feasible, appropriate countermeasures have to be proposed in the future. KW - Security KW - Side-Channel Analysis (SCA) KW - Laser illumination KW - Power consumption KW - Static Consumption under Laser Illumination (SCuLI) attacks Y1 - 2025 U6 - https://doi.org/10.1109/LATS65346.2025.10963958 SP - 1 EP - 4 PB - Institute of Electrical and Electronics Engineers (IEEE) CY - Piscataway, NJ ER -