TY - GEN A1 - Liero, Armin A1 - Dewitz, Mike A1 - Kühn, Silvio A1 - Chaturvedi, Nidhi A1 - Xu, Jijun A1 - Rudolph, Matthias T1 - On the Recovery Time of Highly Robust Low-Noise Amplifiers T2 - IEEE transactions on microwave theory and techniques KW - Amplifier noise KW - integrated circuit noise KW - microwave field-effect transistor (FET) amplifiers KW - monolithic microwave integrated circuit (MMIC) amplifiers KW - noise KW - semiconductor device noise KW - integrated circuit (MMIC) amplifiers Y1 - 2010 U6 - https://doi.org/10.1109/TMTT.2010.2041519 SN - 0018-9480 VL - 58 IS - 4 SP - 781 EP - 787 ER - TY - GEN A1 - Rudolph, Matthias A1 - Dewitz, Mike A1 - Liero, Armin A1 - Khalil, I. A1 - Chaturvedi, Nidhi A1 - Wipf, Christian A1 - Bertenburg, R. M. A1 - Miller, J. A1 - Würfl, Joachim A1 - Heinrich, Wolfgang A1 - Tränkle, Günther T1 - Highly Robust X-Band LNA with Extremely Short Recovery Time Y1 - 2009 ER -