TY - GEN A1 - Lachnitt, Jan A1 - Das, Shuvankar A1 - Menon, Krishnakumar S. R. A1 - Mandal, Suman A1 - Flege, Jan Ingo T1 - The dependence of structure on thickness of NiO(100) films on Ag(100) studied by IV-LEED T2 - Verhandlungen der DPG N2 - Ultrathin NiO films have prospective applications especially in heterogeneous catalysis, microelectronics, and spintronics and are thus an object of active research. The Ag(100) surface is the usual support for these films, as its cubic lattice parameter is only 2.2 % smaller than that of NiO, which enables pseudomorphic growth at very low thicknesses. We have studied the NiO(100) surface for three thicknesses of the oxide: 2 ML on Ag(100), 20 ML on the same substrate, and a bulk single crystal. We have used intensity-voltage low-energy electron diffraction (IV-LEED) in combination with X-ray photoelectron spectroscopy (XPS) and density-functional theory (DFT) calculations. We focus on differences among the three thicknesses, mainly in terms of lattice parameters and surface defects, and our study deepens existing knowledge of the growth of ultrathin NiO films. The IV-LEED calculations have been carried out using the AQuaLEED package, which will also be briefly presented. KW - IV-LEED KW - X-ray photoelectron spectroscopy (XPS) KW - NiO KW - Ag KW - density-functional theory (DFT) Y1 - 2023 UR - https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/o/session/92/contribution/4 SN - 0420-0195 PB - Deutsche Physikalische Gesellschaft CY - Bad Honnef ER -