TY - GEN A1 - Steffens, S. A1 - Becker, C. A1 - Amkreutz, Daniel A1 - Klossek, André A1 - Kittler, Martin A1 - Chen, Y.-Y. A1 - Schnegg, Alexander A1 - Klingsporn, Max A1 - Abou-Ras, Daniel A1 - Lips, Klaus A1 - Rech, Bernd T1 - Impact of Dislocations and Dangling Bond Defects on The Electrical Performance of Crystalline Silicon Thin Films T2 - Applied Physics Letters Y1 - 2014 U6 - https://doi.org/10.1063/1.4890625 SN - 1077-3118 SN - 0003-6951 VL - 105 IS - 2 SP - 022108 ER - TY - GEN A1 - Gref, Orman A1 - Teodoreanu, Ana-Maria A1 - Leihkauf, Rainer A1 - Lohrke, Heiko A1 - Kittler, Martin A1 - Amkreutz, Daniel A1 - Boit, Christian A1 - Friedrich, Felice T1 - Grain boundary light beam induced current: A characterization of bonded silicon wafers and polycrystalline silicon thin films for diffusion length extraction T2 - Physica Status Solid A Y1 - 2016 U6 - https://doi.org/10.1002/pssa.201532987 SN - 1862-6319 VL - 213 IS - 7 SP - 1728 EP - 1737 ER -