TY - GEN A1 - Bignardi, Luca A1 - Lizzit, Daniel A1 - Bana, Harsh A1 - Travaglia, Elisabetta A1 - Lacovig, Paolo A1 - Sanders, Charlotte E. A1 - Dendzik, Maciej A1 - Michiardi, Matteo A1 - Bianchi, Marco A1 - Ewert, Moritz A1 - Buß, Lars A1 - Falta, Jens A1 - Flege, Jan Ingo A1 - Baraldi, Alessandro A1 - Larciprete, Rosanna A1 - Hofmann, Philip A1 - Lizzit, Silvano T1 - Growth and structure of singly oriented single-layer tungsten disulfide on Au(111) T2 - Physical Review Materials N2 - A singly oriented, single layer of tungsten disulfide (WS2) was epitaxially grown on Au(111) and characterized at the nanoscale by combining photoelectron spectroscopy, photoelectron diffraction, and low-energy electron microscopy. Fast x-ray photoelectron spectroscopy revealed that the growth of a single crystalline orientation is triggered by choosing a low W evaporation rate and performing the process with a high temperature of the substrate. Information about the single orientation of the layer was obtained by acquiring x-ray photoelectron diffraction patterns, revealing a 1H polytype for the WS2 layer and, moreover, determining the structural parameters and registry with the substrate. The distribution, size, and orientation of the WS2 layer were further ascertained by low-energy electron microscopy. KW - tungsten disulfide (WS2) KW - Au (111) KW - photoelectron spectroscopy KW - photoelectron diffraction KW - low-energy electron microscopy Y1 - 2019 U6 - https://doi.org/10.1103/PhysRevMaterials.3.014003 SN - 2475-9953 VL - 3 IS - 1 ER -