TY - JOUR A1 - Graupner, R. A1 - Seyller, Th. A1 - Ley, L. A1 - Mikalo, Ricardo Pablo A1 - Hoffmann, Patrick A1 - Batchelor, David R. A1 - Schmeißer, Dieter T1 - PEEM Investigation of CVD-Diamond grown on Si Y1 - 2001 ER - TY - JOUR A1 - Sieber, N. A1 - Seyller, Th. A1 - Graupner, R. A1 - Ley, L. A1 - Mikalo, Ricardo Pablo A1 - Batchelor, David R. A1 - Schmeißer, Dieter T1 - PES and LEED study of hydrogen and oxygen terminated 6H-SiC(0001) and (000-1) surfaces Y1 - 2001 ER - TY - JOUR A1 - Gracia, F. A1 - Martin-Concepcion, A. I. A1 - Barranco, A. A1 - Holgado, J. P. A1 - Espinos, J. P. A1 - Yubero, F. A1 - Batchelor, David R. A1 - Schmeißer, Dieter A1 - Gonzalez-Elipe, A. R. T1 - XAS investigation of texture in TiO2 thin films prepared by IBICVD Y1 - 2002 ER - TY - JOUR A1 - Sieber, N. A1 - Seyller, Th. A1 - Graupner, R. A1 - Ley, L. A1 - Mikalo, Ricardo Pablo A1 - Hoffmann, Patrick A1 - Batchelor, David R. A1 - Schmeißer, Dieter T1 - Wet-chemical preparation of silicate adlayer reconstructed SiC(0001) surfaces as studied by PIES and LEED N2 - We have studied the surface chemistry of 6H-SiC(0001) and 6H-SiC (000 (1) over bar) after wet-chemical treatment using photoelectron spectroscopy (PES) andlow-energy electron diffraction (LEED). The origin of chemically shifted components in the Si2p and C1s spectra is discussed in the light of previous studies onwet-chemically prepared surfaces and on silicate adlayer reconstructed surfaces. On 6H-SiC(0001) an ordered silicate adlayer was prepared by etching the surface withsulfuric acid based agents. KW - Core level KW - Photoelectron spectroscopy KW - Synchrotron radiation KW - Wet-chemical preparation OXIDE Y1 - 2002 ER - TY - JOUR A1 - Pop, D. A1 - Winter, B. A1 - Batchelor, David R. A1 - Freyer, W. A1 - Weber, R. A1 - Bröcker, D. A1 - Hertel, I. V. A1 - Schmeißer, Dieter A1 - Widdra, Wolf T1 - Copper Satellite Structure in Porphyrazine Compounds Y1 - 2002 ER - TY - GEN A1 - Hoffmann, Patrick A1 - Mikalo, Ricardo Pablo A1 - Yfantis, Alexandros D. A1 - Batchelor, David R. A1 - Appel, Günter A1 - Schmeißer, Dieter T1 - A Spectro-Microscopic Approach for Thin Film Analysis Grain Boundaries in mc-Si and Sn/SnO2 Nano Particles T2 - Microchimica Acta Y1 - 2001 SN - 1436-5073 SN - 0026-3672 VL - 136 IS - 3-4 SP - 109 EP - 113 ER - TY - CHAP A1 - Batchelor, David R. A1 - Hoffmann, Patrick A1 - Schmeißer, Dieter A1 - Hulea, Iulian A1 - Brinza, Monica T1 - The Al-Fe interface of friction-welded joints T2 - Verhandlungen der Deutschen Physikalischen Gesellschaft N2 - The interface region of friction-welded joints Al-Fe samples is investigated by scanning Auger Spectroscopy, Electron Probe Micro-analysis (EPMA), X-ray Photoelectron spectroscopy, and Photoemission Electron Microscopy, performed at the synchrotron light source (BESSY). We investigated polished samples cut to obtain a cross-section of the Al-Fe joints. At the Al-Fe interface there is a small number of Fe teeth protuding into the adjacent Al-matrix. Beside this mechanical interlock mechanism we identify an Fe-Al alloy which is formed in an almost homogeneous interface layer of approximately 80 micron thickness. We determine the valence band spectra within that layer and notice that the alloying formation is limited to the interface region. In addition, the profile of both, the Fe and O distribution within the Al next to that interface is determined. A model of the friction-welding mechanism is derived and discussed in terms of the ability of achieving low temperature Fe-Al joints. KW - Fe-Al interface KW - friction-welded KW - X-ray photoelectron spectroscopy (XPS) KW - photoemission electron microscopy (PPEM) KW - scanning Auger spectroscopy KW - electron probe micro-analysis (EPMA) Y1 - 2000 PB - Deutsche Physikalische Gesellschaft CY - Bad Honnef ER - TY - JOUR A1 - Zimina, A. A1 - Batchelor, David R. A1 - Eisebitt, S. A1 - Schmeißer, Dieter A1 - Shukalov, A. A1 - Eberhardt, W. T1 - Soft X-ray emission electron microscopy: chemical state microscopy from interface and bulk KW - x-ray KW - microscopy KW - interface KW - bulk Y1 - 2008 ER - TY - CHAP A1 - Batchelor, David R. A1 - Follath, Rolf A1 - Schmeißer, Dieter T1 - Design of a PGM for the U49/2 Undulator at BESSY II T2 - Verhandlungen der Deutschen Physikalischen Gesellschaft N2 - This poster describes the beamline proposed for the BESSY II U49/2 Undulator by the Collaborating Research Group of BTU Cottbus, HMI Berlin and the TU Darmstadt. The beamline is designed with both high resolution electron spectroscopy, valence band measurements and PEEM in mind and utilises the wide energy range of the U49 Undulator 40−1500eV. The design chosen is based on a Petersen PGM [1] but with the grating illuminated with parallel light [2]. This modification allows variation of the monochromator higher order content or resolution, spot size without changing the focus. The performance of the beamline was investigated using various programs available at BESSY. The Undulator character- istics were evaluated using both SMUT and WAVE, and the optical performance of the monochromator was checked using REFLEC and RAY. The calculations show a resolving power of 2×104 with a flux of the order 1013 photons s−1 over the energy range covered by the mono- chromator. The maximum nominal second order contributions are ≈ 2% at 300 eV for the first Undulator harmonic and ≈ 9% for the third harmonic at 500 eV, both of which can be reduced by increasing the grating incidence angle and, or decreasing the Undulator Pinhole size. KW - Bessy II KW - undulator beamline U49/2 KW - design Y1 - 1999 UR - http://www.dpg-verhandlungen.de/year/1999/conference/muenster/part/o/session/36/contribution/81?lang=en PB - Deutsche Physikalische Gesellschaft CY - Bad Honnef ER - TY - CHAP A1 - Hulea, Iulian A1 - Hoffmann, Patrick A1 - Brinza, Monica A1 - Batchelor, David R. A1 - Schmeißer, Dieter T1 - The interface of friction-welded Al-Fe joints. ATB Metallurgy Y1 - 2001 ER -