TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - An Analysis of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit T2 - 20thInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), 19-21 April 2017 Dresden Y1 - 2017 SN - 978-1-5386-0472-4 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Ilic, Aleksandar A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - An Overview of the Current Models for the Circuit-level Simulations of Single Event Transients T2 - Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro Y1 - 2017 SP - S. 184 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Ilic, Aleksandar A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - An Overview of the Modeling and Simulation of the Single Event Transients at the Circuit Level T2 - 30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia Y1 - 2017 SN - 978-1-5386-2563-7 SN - 978-1-5386-2561-3 U6 - https://doi.org/10.1109/MIEL.2017.8190065 SP - 35 EP - 44 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Assessment of the Amplitude-duration Criterion for SET Robusness Evaluation T2 - 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017 Y1 - 2017 SN - 978-1-5386-0352-9 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Petrovic, Vladimir A1 - Nenadovic, Miljana A1 - Breitenreiter, Anselm A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Design of an On-Chip System for the SET Pulse Width Measurement T2 - Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017 Y1 - 2017 SN - 978-1-5386-2146-2 SP - 111 EP - 118 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf A1 - Veeravalli, Varadan Savulimedu A1 - Steininger, Andreas T1 - Erstellung eines Modells der kritischen Ladung zur Bewertung der Robustheit gegenüber SETs und SEUs: Fallstudie Muller C-Element T2 - Zuverlässigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus Y1 - 2017 SN - 978-3-8007-4444-2 SP - 17 EP - 24 PB - Berlin CY - VDE Verlag ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Nenadovic, Miljana A1 - Petrovic, Vladimir A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Evaluation of the Pulse Stretcher for Detection of Very Short Single Event Transients T2 - Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017 Y1 - 2017 UR - http://rad2017.rad-conference.org/news.php SP - S. 214 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology T2 - 30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia Y1 - 2017 SN - 978-1-5386-2563-7 SN - 978-1-5386-2561-3 U6 - https://doi.org/10.1109/MIEL.2017.8190106 SP - 217 EP - 220 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Jagdhold, Ulrich A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - 2D TCAD Simulation of Single Event Transients in 250 nm Bulk CMOS Technology T2 - Zuverlässigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus Y1 - 2017 SN - 978-3-8007-4444-2 SP - 90 EP - 96 PB - Berlin CY - VDE Verlag ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf A1 - Veeravalli, Varadan Savulimedu A1 - Steininger, Andreas T1 - A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study T2 - IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017 Y1 - 2017 SN - 978-1-5386-2437-1 U6 - https://doi.org/10.1109/ATS.2017.27 SP - 78 EP - 83 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Impact of Resistive Open and Bridge Defects on the SET Robustness of CMOS Combinational Logic T2 - IEEE East-West Design & Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018 Y1 - 2018 SN - 978-1-5386-5709-6 U6 - https://doi.org/10.1109/EWDTS.2018.8524748 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Study of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit T2 - Microelectronics Reliability Y1 - 2018 U6 - https://doi.org/10.1016/j.microrel.2017.12.022 SN - 0026-2714 SN - 1872-941X VL - 82 SP - 100 EP - 112 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Babic, Milan A1 - Li, Yuanqing A1 - Schrape, Oliver A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates T2 - 25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018 Y1 - 2018 SN - 978-1-5386-9562-3 SN - 978-1-5386-9116-8 U6 - https://doi.org/10.1109/ICECS.2018.8617996 SP - 361 EP - 364 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Andjelkovic, Marko A1 - Li, Yuanqing A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells T2 - 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019 Y1 - 2019 SN - 978-1-7281-2490-2 SN - 978-1-7281-2489-6 SN - 978-1-7281-2491-9 U6 - https://doi.org/10.1109/IOLTS.2019.8854379 SN - 1942-9401 PB - IEEE ER - TY - GEN A1 - Andjelkovic, Marko A1 - Chen, Junchao A1 - Simevski, Aleksandar A1 - Stamenkovic, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - A Review of Particle Detectors for Space-Borne Self-Adaptive Fault Tolerant Systems T2 - 18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020 Y1 - 2020 SN - 978-1-7281-9899-6 SN - 978-1-7281-9898-9 SN - 978-1-7281-9900-9 U6 - https://doi.org/10.1109/EWDTS50664.2020.9225138 SN - 2472-761X PB - IEEE ER -