TY - GEN A1 - Andjelkovic, Marko A1 - Li, Yuanqing A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells T2 - 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019 Y1 - 2019 SN - 978-1-7281-2490-2 SN - 978-1-7281-2489-6 SN - 978-1-7281-2491-9 U6 - https://doi.org/10.1109/IOLTS.2019.8854379 SN - 1942-9401 PB - IEEE ER - TY - GEN A1 - Andjelkovic, Marko A1 - Veleski, Mitko A1 - Chen, Junchao A1 - Simevski, Aleksandar A1 - Krstic, Milos T1 - A Particle Detector Based on Pulse Stretching Inverter Chain T2 - 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2019), Genova Y1 - 2019 SN - 978-1-7281-0996-1 SN - 978-1-7281-0997-8 U6 - https://doi.org/10.1109/ICECS46596.2019.8964644 ER - TY - GEN A1 - Andjelkovic, Marko A1 - Chen, Junchao A1 - Simevski, Aleksandar A1 - Stamenkovic, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - A Review of Particle Detectors for Space-Borne Self-Adaptive Fault Tolerant Systems T2 - 18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020 Y1 - 2020 SN - 978-1-7281-9899-6 SN - 978-1-7281-9898-9 SN - 978-1-7281-9900-9 U6 - https://doi.org/10.1109/EWDTS50664.2020.9225138 SN - 2472-761X PB - IEEE ER -