TY - JOUR A1 - Hoffmann, Patrick A1 - Mikalo, Ricardo Pablo A1 - Schmeißer, Dieter T1 - Si(001) surface oxidation by N2O N2 - Ultra-thin homogeneous oxynitride films are prepared on Si(001). The Si surface is cleaned in UHV by heating (flashing) and is exposed to different pressures of N2Oat altered temperatures. Thus oxynitride layers of different thickness and different properties are grown depending on the N2O pressure and the Si temperature. This isillustrated by a schematic diagram. The properties of the different oxynitride layers were studied by a combined photoemission electron microscopy (PEEM) andphotoelectron spectroscopy (PES) investigation using highly monochromatic synchrotron radiation. The amount of oxygen and nitrogen incorporated in the oxynitridelayers is determined from the PES measurements. The typical surface morphology for different preparation conditions is shown in PEEM images. KW - SI(100) KW - dielectric KW - Oxynitride KW - Interface KW - SI KW - NO Y1 - 2002 ER - TY - JOUR A1 - Mikalo, Ricardo Pablo A1 - Schmeißer, Dieter T1 - Electric contacts on conductive polymers: sodium on poly(3-hexylthiophene-2,5-diyl) N2 - Sodium as a model contact with low work function on regioregular poly(3-hexylthiophene-2,5-diyl) (P3HT) films was investigated. The interface was studied by X-rayand ultraviolet photoelectron spectroscopy in the range of 0.13 up to 1.8 metal atoms per hexylthiophene unit. In the range of 0.13-0.26 sodium atoms per hexylthiophenering we find a change inthe surface potentials which is interpreted as a discharge of positive surface charges. Sodium exposures above 0.5 sodium atoms perhexylthiophene unit exhibit a reduction of the thiophene sulfur due to the formation of sodium sulfide and breaking of the thiophene ring. Y1 - 2002 ER - TY - GEN A1 - Lewerenz, Hans-Joachim A1 - Aggour, Mohammed A1 - Murrell, Chris A1 - Kanis, M. A1 - Hoffmann, Patrick A1 - Jungblut, H. A1 - Schmeißer, Dieter T1 - Interface engineering of photoelectrochemically prepared Si surfaces N2 - The oxide of Si(111) formed by electropolishing in dilute ammonium fluoride solution is analysed by photoelectron spectroscopy using synchrotron radiation. The oxidiclayer is about 3.1 nm thick and contains Si-F-x species as well as oxyfluorides. The oxyfluorides are found preferentially at the electropolishing layer surface. SiOHspecies are concentrated at the oxidic film/substrate interface. The full width half maximum of the Si 2p line indicates that the Si/electropolishing oxide interface issmoother than the Si/natural oxide interface. KW - Mean Free Paths KW - Silicon KW - Range Y1 - 2002 ER - TY - CHAP A1 - Larcher, Thomas von A1 - Egbers, Christoph T1 - LDA-Messungen zur Untersuchung barokliner Instabilitäten, Lasermethoden in der Strömungsmesstechnik Y1 - 2002 ER - TY - JOUR A1 - Sieber, N. A1 - Seyller, Th. A1 - Graupner, R. A1 - Ley, L. A1 - Mikalo, Ricardo Pablo A1 - Hoffmann, Patrick A1 - Batchelor, David R. A1 - Schmeißer, Dieter T1 - Wet-chemical preparation of silicate adlayer reconstructed SiC(0001) surfaces as studied by PIES and LEED N2 - We have studied the surface chemistry of 6H-SiC(0001) and 6H-SiC (000 (1) over bar) after wet-chemical treatment using photoelectron spectroscopy (PES) andlow-energy electron diffraction (LEED). The origin of chemically shifted components in the Si2p and C1s spectra is discussed in the light of previous studies onwet-chemically prepared surfaces and on silicate adlayer reconstructed surfaces. On 6H-SiC(0001) an ordered silicate adlayer was prepared by etching the surface withsulfuric acid based agents. KW - Core level KW - Photoelectron spectroscopy KW - Synchrotron radiation KW - Wet-chemical preparation OXIDE Y1 - 2002 ER - TY - CHAP A1 - Egbers, Christoph T1 - Simulation of Geophysical Fluid Flows under Microgravity (GeoFlow): Flow diagnostics and experiment concept for Fluid Science experiments T2 - Proceedings of 11th International Symposium on Applications of Laser Techniques to Fluid Mechanics, Lisbon, 8-11th July 2002 Y1 - 2002 UR - http://in3.dem.ist.utl.pt/lxlaser2002/papers/paper_28_2.pdf ER - TY - CHAP A1 - Futterer, Birgit T1 - Minimierung von Diskretisierungsfehlern bei gitterunabhängiger Elektrodenpositionierung T2 - 62. Jahrestagung der Deutschen Geophysikalischen Gesellschaft im Jahr der Geowissenschaften Y1 - 2002 PB - Deutsche Geophysikalische Gesellschaft CY - Hannover ER - TY - CHAP A1 - Rolland, Wolfgang A1 - Arnold, Ingolf ED - Bayerl, Günter T1 - Anthropogene Veränderungen des Wasserhaushaltes der Spree vom 15. bis 19. Jahrhundert T2 - Die Niederlausitz vom 18. Jahrhundert bis heute: eine gestörte Kulturlandschaft? KW - Spree KW - Wasserhaushalt Y1 - 2002 SN - 3-8309-1197-1 SP - 199 EP - 235 PB - Waxmann CY - Münster [u.a.] ER - TY - JOUR A1 - Richter, Frank A1 - Wichter, Lutz T1 - Zur Bemessung von wasserdurchlässigen Pflaster- und Plattenbelägen Y1 - 2002 ER - TY - CHAP A1 - Wichter, Lutz A1 - Kügler, Marcus T1 - Fehlstellen in Düsenstrahlkörpern durch Inhomogenitäten im Baugrund T2 - Vorträge der Baugrundtagung 2002 in Mainz Y1 - 2002 SN - 3-7739-5968-0 SP - 99 EP - 105 PB - Glückauf-Verlag CY - Essen ER - TY - CHAP A1 - Grünewald, Uwe T1 - "Oderflut 1997" - "Weichselflut 2001" - "Elbeflut 2002" T2 - Die Gefahrentage des DKKV Leipzig 2001/Potsdam 2002 : Dokumentation von Vorträgen KW - Hochwasser KW - Elbe Y1 - 2002 SN - 3-933181-30-5 SP - 62 EP - 67 PB - DKKV CY - Bonn ER -