<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>35115</id>
    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1019</pageFirst>
    <pageLast>1050</pageLast>
    <pageNumber>32</pageNumber>
    <edition/>
    <issue>2</issue>
    <volume>138</volume>
    <type>articler</type>
    <publisherName>Tech Science Press</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-01-13</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">A Survey on sensor- and communication-based issues of autonomous UAVs</title>
    <parentTitle language="eng">Computer Modeling in Engineering &amp; Sciences</parentTitle>
    <identifier type="doi">10.32604/cmes.2023.029075</identifier>
    <identifier type="issn">1526-1506</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_doi_json">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,12,7]],"date-time":"2024-12-07T05:19:52Z","timestamp":1733548792482,"version":"3.30.1"},"reference-count":0,"publisher":"Tech Science Press","issue":"2","license":[{"start":{"date-parts":[[2023,11,16]],"date-time":"2023-11-16T00:00:00Z","timestamp":1700092800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/doi.org\/10.32604\/TSP-CROSSMARKPOLICY"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["CMES"],"published-print":{"date-parts":[[2024]]},"DOI":"10.32604\/cmes.2023.029075","type":"journal-article","created":{"date-parts":[[2023,11,13]],"date-time":"2023-11-13T08:48:23Z","timestamp":1699865303000},"page":"1019-1050","update-policy":"https:\/\/doi.org\/10.32604\/tsp-crossmarkpolicy","source":"Crossref","is-referenced-by-count":1,"title":["A Survey on Sensor- and Communication-Based Issues of Autonomous UAVs"],"prefix":"10.32604","volume":"138","author":[{"given":"Pavlo","family":"Mykytyn","sequence":"first","affiliation":[]},{"given":"Marcin","family":"Brzozowski","sequence":"additional","affiliation":[]},{"given":"Zoya","family":"Dyka","sequence":"additional","affiliation":[]},{"given":"Peter","family":"Langendoerfer","sequence":"additional","affiliation":[]}],"member":"17807","published-online":{"date-parts":[[2024]]},"container-title":["Computer Modeling in Engineering &amp;amp; Sciences"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.techscience.com\/files\/CMES\/2024\/TSP_CMES-138-2\/TSP_CMES_29075\/TSP_CMES_29075.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,6]],"date-time":"2024-12-06T21:38:49Z","timestamp":1733521129000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.techscience.com\/CMES\/v138n2\/54591"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":0,"journal-issue":{"issue":"2","published-online":{"date-parts":[[2024]]},"published-print":{"date-parts":[[2024]]}},"URL":"https:\/\/doi.org\/10.32604\/cmes.2023.029075","relation":{},"ISSN":["1526-1506"],"issn-type":[{"type":"electronic","value":"1526-1506"}],"subject":[],"published":{"date-parts":[[2024]]},"assertion":[{"value":"2023-02-01","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2023-06-20","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2023-11-17","order":2,"name":"published","label":"Published Online","group":{"name":"publication_history","label":"Publication History"}}]}}</enrichment>
    <enrichment key="opus_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="opus_crossrefLicence">https://doi.org/10.32604/TSP-CROSSMARKPOLICY</enrichment>
    <enrichment key="opus_import_origin">crossref</enrichment>
    <enrichment key="opus_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorFirstName_4,PersonAuthorLastName_4,PublisherName,TitleMain_1,Language,TitleParent_1,PageNumber,PageFirst,PageLast,Issue,Volume,PublishedYear,IdentifierIssn,Enrichmentopus_crossrefLicence</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <enrichment key="Referiert">Beitrag ist referiert / Article peer-reviewed</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <author>
      <firstName>Pavlo</firstName>
      <lastName>Mykytyn</lastName>
    </author>
    <submitter>
      <firstName>Elisabeth</firstName>
      <lastName>Vogel</lastName>
    </submitter>
    <author>
      <firstName>Marcin</firstName>
      <lastName>Brzozowski</lastName>
    </author>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <collection role="institutes" number="1222">FG Systeme</collection>
  </doc>
  <doc>
    <id>35104</id>
    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>4</pageLast>
    <pageNumber>4</pageNumber>
    <edition/>
    <issue/>
    <volume/>
    <type>articler</type>
    <publisherName>IEEE</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-01-13</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Exploiting static power consumption in side-channel analysis</title>
    <parentTitle language="eng">2024 IEEE 25th Latin American Test Symposium (LATS)</parentTitle>
    <identifier type="doi">10.1109/LATS62223.2024.10534604</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_doi_json">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T02:49:39Z","timestamp":1725763779951},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,9]],"date-time":"2024-04-09T00:00:00Z","timestamp":1712620800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,9]],"date-time":"2024-04-09T00:00:00Z","timestamp":1712620800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,9]]},"DOI":"10.1109\/lats62223.2024.10534604","type":"proceedings-article","created":{"date-parts":[[2024,5,28]],"date-time":"2024-05-28T17:35:14Z","timestamp":1716917714000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Exploiting Static Power Consumption in Side-Channel Analysis"],"prefix":"10.1109","author":[{"given":"Ievgen","family":"Kabin","sequence":"first","affiliation":[{"name":"IHP GmbH &amp;#x2013; Leibniz Institute for High Performance Microelectronics,Frankfurt,Germany,15236"}]},{"given":"Peter","family":"Langendoerfer","sequence":"additional","affiliation":[{"name":"IHP GmbH &amp;#x2013; Leibniz Institute for High Performance Microelectronics,Frankfurt,Germany,15236"}]},{"given":"Zoya","family":"Dyka","sequence":"additional","affiliation":[{"name":"IHP GmbH &amp;#x2013; Leibniz Institute for High Performance Microelectronics,Frankfurt,Germany,15236"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_25"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48059-5_25"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36400-5_11"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45238-6_30"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/date.2010.5456907"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ewdts.2017.8110037"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/csr57506.2023.10224968"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48059-5_27"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s22083083"},{"journal-title":"U.S. Department of Commerce, Federal Information Processing Standard (FIPS) 186-4","article-title":"Digital Signature Standard (DSS)","year":"2013","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.6028\/nist.fips.186-5"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2019.2948141"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ecctd.2017.8093333"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36400-5_22"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/hst.2010.5513110"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-16350-1_3"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2996366.2996371"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/reconfig.2017.8279800"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08302-5_12"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-42051-2_5"},{"key":"ref21","article-title":"Horizontal address-bit SCA attacks against ECC and appropriate countermeasures","author":"Kabin","year":"2023","journal-title":"BTU Cottbus - Senftenberg"}],"event":{"name":"2024 IEEE 25th Latin American Test Symposium (LATS)","start":{"date-parts":[[2024,4,9]]},"location":"Maceio, Brazil","end":{"date-parts":[[2024,4,12]]}},"container-title":["2024 IEEE 25th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10534343\/10534590\/10534604.pdf?arnumber=10534604","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,29]],"date-time":"2024-05-29T04:41:45Z","timestamp":1716957705000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10534604\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,9]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/lats62223.2024.10534604","relation":{},"subject":[],"published":{"date-parts":[[2024,4,9]]}}}</enrichment>
    <enrichment key="opus_crossrefDocumentType">proceedings-article</enrichment>
    <enrichment key="opus_crossrefLicence">https://doi.org/10.15223/policy-029</enrichment>
    <enrichment key="opus_import_origin">crossref</enrichment>
    <enrichment key="opus_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,EnrichmentConferenceTitle,EnrichmentConferencePlace,PublisherName,TitleMain_1,TitleParent_1,PageNumber,PageFirst,PageLast,PublishedYear,Enrichmentopus_crossrefLicence</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <enrichment key="Referiert">Beitrag ist referiert / Article peer-reviewed</enrichment>
    <enrichment key="ConferencePlace">Maceio, Brazil</enrichment>
    <enrichment key="ConferenceTitle">2024 IEEE 25th Latin American Test Symposium (LATS)</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <author>
      <firstName>Ievgen</firstName>
      <lastName>Kabin</lastName>
    </author>
    <submitter>
      <firstName>Elisabeth</firstName>
      <lastName>Vogel</lastName>
    </submitter>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <collection role="institutes" number="1222">FG Systeme</collection>
  </doc>
  <doc>
    <id>36197</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>21</pageLast>
    <pageNumber>21</pageNumber>
    <edition/>
    <issue>10</issue>
    <volume>14</volume>
    <type>articler</type>
    <publisherName>MDPI</publisherName>
    <publisherPlace>Basel</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>2025-05-20</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Horizontal attack against EC kP accelerator under laser illumination</title>
    <abstract language="eng">Devices employing cryptographic approaches have to be resistant to physical attacks. Side-Channel Analysis (SCA) and Fault Injection (FI) attacks are frequently used to reveal cryptographic keys. In this paper, we present a combined SCA and laser illumination attack against an Elliptic Curve Scalar Multiplication accelerator, while using different equipment for the measurement of its power traces, i.e., we performed the measurements using a current probe from Riscure and a differential probe from Teledyne LeCroy, with an attack success of 70% and 90%, respectively. Our experiments showed that laser illumination increased the power consumption of the chip, especially its static power consumption, but the success of the horizontal power analysis attacks changed insignificantly. After applying 100% of the laser beam output power and illuminating the smallest area of 143 µm² , we observed an offset of 17 mV in the measured trace. We assume that using a laser with a high laser beam power, as well as concentrating on measuring and analysing only static current, can significantly improve the attack’s success. The attacks exploiting the Static Current under Laser Illumination (SCuLI attacks) are novel, and their potential has not yet been fully investigated. These attacks can be especially dangerous against cryptographic chips manufactured in downscaling technologies. If such attacks are feasible, appropriate countermeasures have to be proposed in the future.</abstract>
    <parentTitle language="eng">Electronics</parentTitle>
    <identifier type="issn">2079-9292</identifier>
    <identifier type="doi">10.3390/electronics14102072</identifier>
    <enrichment key="opus.import.date">2025-06-09T14:41:41+00:00</enrichment>
    <enrichment key="opus.source">sword</enrichment>
    <enrichment key="opus.import.user">deepgreen</enrichment>
    <enrichment key="opus.import.file">attachment; filename=deposit.zip</enrichment>
    <enrichment key="opus.import.checksum">e8737a42e3fb045476d6ba3c4a2c69c7</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>
      <firstName>Dmytro</firstName>
      <lastName>Petryk</lastName>
    </author>
    <editor>
      <firstName>Zbigniew</firstName>
      <lastName>Kotulski</lastName>
    </editor>
    <author>
      <firstName>Ievgen</firstName>
      <lastName>Kabin</lastName>
    </author>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Power analysis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Dynamic power</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Static leakage power</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Laser illumination</value>
    </subject>
    <collection role="institutes" number="1200">Institut für Informatik</collection>
  </doc>
  <doc>
    <id>36888</id>
    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>5</pageLast>
    <pageNumber>5</pageNumber>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject_ref</type>
    <publisherName>IEEE</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-12-01</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">On the influence of cell libraries and other parameters to SCA resistance of crypto IP cores</title>
    <abstract language="eng">The ever-growing complexity of modern systems as well as the shrinking time to market enforces the use of already designed hardware components i.e. hard and soft IP cores. The fact that also requirements with respect to security significantly increased and that side-channel analysis (SCA) attacks are meanwhile a well-known threat it is paramount to ensure SCA resistance of ASICs and FPGA implementations derived from cryptographic IP cores. This requires to evaluate this feature for each IP core and target technology even down to the level of the cell library. The experiments reported here clearly show that the three available cell libraries even though developed for the same 130nm technology of IHP exhibit different sensitivity to SCA attacks ranging from quite resistant to very vulnerable.</abstract>
    <parentTitle language="eng">2024 13th Mediterranean Conference on Embedded Computing (MECO)</parentTitle>
    <identifier type="doi">10.1109/MECO62516.2024.10577776</identifier>
    <identifier type="isbn">979-8-3503-8756-8</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:50:56Z","timestamp":1725785456559},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,6,11]],"date-time":"2024-06-11T00:00:00Z","timestamp":1718064000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,11]],"date-time":"2024-06-11T00:00:00Z","timestamp":1718064000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,6,11]]},"DOI":"10.1109\/meco62516.2024.10577776","type":"proceedings-article","created":{"date-parts":[[2024,7,3]],"date-time":"2024-07-03T17:26:54Z","timestamp":1720027614000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["On the Influence of Cell Libraries and Other Parameters to SCA Resistance of Crypto IP Cores"],"prefix":"10.1109","author":[{"given":"Zoya","family":"Dyka","sequence":"first","affiliation":[{"name":"Leibniz Institute for High Performance Microelectronics,IHP GmbH,Frankfurt (Oder),Germany"}]},{"given":"Ievgen","family":"Kabin","sequence":"additional","affiliation":[{"name":"Leibniz Institute for High Performance Microelectronics,IHP GmbH,Frankfurt (Oder),Germany"}]},{"given":"Marcin","family":"Brzozowski","sequence":"additional","affiliation":[{"name":"Leibniz Institute for High Performance Microelectronics,IHP GmbH,Frankfurt (Oder),Germany"}]},{"given":"Goran","family":"Panic","sequence":"additional","affiliation":[{"name":"Leibniz Institute for High Performance Microelectronics,IHP GmbH,Frankfurt (Oder),Germany"}]},{"given":"Cristiano","family":"Calligaro","sequence":"additional","affiliation":[{"name":"Redcat Devices Srl,Milan,Italy"}]},{"given":"Milos","family":"Krstic","sequence":"additional","affiliation":[{"name":"Leibniz Institute for High Performance Microelectronics,IHP GmbH,Frankfurt (Oder),Germany"}]},{"given":"Peter","family":"Langendoerfer","sequence":"additional","affiliation":[{"name":"Leibniz Institute for High Performance Microelectronics,IHP GmbH,Frankfurt (Oder),Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_25"},{"volume-title":"Power Analysis Attacks: Revealing the Secrets of Smart Cards","year":"2010","author":"Mangard","key":"ref2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/reconfig48160.2019.8994807"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-42051-2_5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-021-05951-3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/lats57337.2022.9937007"},{"volume-title":"Common Criteria for Information Technology Security Evaluation, Part 3: Security assurance components Version 3.1","year":"2017","key":"ref7"},{"article-title":"Cryptographic Module Validation Program | CSRC | CSRC","volume-title":"CSRC | NIST","year":"2016","key":"ref8"},{"key":"ref9","article-title":"DPA Resistant Core - Rambus"},{"key":"ref10","article-title":"EnforcIT - Defense-in-Depth Solutions for Protecting Critical Information - Microsemi"},{"key":"ref11","article-title":"RSA, Diffie-Hellman and Modular Exponentiation Cores for FPGA (Xilinx, Altera, Microsemi, Lattice) and ASIC - Helion Technology"},{"volume-title":"German Federal Office for Information Security (Bundesamt f\u00fcr Sicherheit in der Informationstechnik (BSI)). Version 2024-01","key":"ref12","article-title":"Guidelines for Evaluating Side-Channel-Attack Resistance of RSA, DSA and Dife-Hellman Key Exchange Implementations, Part of AIS 46"},{"volume-title":"German Federal Office for Information Security (Bundesamt f\u00fcr Sicherheit in der Informationstechnik (BSI)). Version 3.0","key":"ref13","article-title":"Guidelines for Evaluating Side-Channel and Fault Attack Resistance of Elliptic Curve Implementations, Part of AIS 46"},{"volume-title":"Cortex M33 r0p4 Certification Report","key":"ref14"},{"key":"ref15","article-title":"FPGA IP (Intellectual Property) Cores - Intel\u00ae FPGA"},{"key":"ref16","article-title":"Xilinx Partner Program"},{"volume-title":"Silex Insight","key":"ref17","article-title":"Crypto Coprocessors"},{"key":"ref18","article-title":"Protected AES Core - FortifyIQ"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.6028\/nist.fips.186-4"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s22083083"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s102070100002"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2020.03.001"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/reconfig.2017.8279800"},{"key":"ref24","article-title":"IHP : SiGe:C-BiCMOS-Technologies"},{"journal-title":"River Publishers","article-title":"Rad-hard Semiconductor Memories","author":"Calligaro","key":"ref25"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/icecs.2008.4674813"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/dft.2019.8875489"}],"event":{"name":"2024 13th Mediterranean Conference on Embedded Computing (MECO)","start":{"date-parts":[[2024,6,11]]},"location":"Budva, Montenegro","end":{"date-parts":[[2024,6,14]]}},"container-title":["2024 13th Mediterranean Conference on Embedded Computing (MECO)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10577658\/10577767\/10577776.pdf?arnumber=10577776","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,6]],"date-time":"2024-07-06T05:11:05Z","timestamp":1720242665000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10577776\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,11]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/meco62516.2024.10577776","relation":{},"subject":[],"published":{"date-parts":[[2024,6,11]]}}}</enrichment>
    <enrichment key="opus_crossrefDocumentType">proceedings-article</enrichment>
    <enrichment key="local_crossrefLicence">https://doi.org/10.15223/policy-029</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorFirstName_4,PersonAuthorLastName_4,PersonAuthorFirstName_5,PersonAuthorLastName_5,PersonAuthorFirstName_6,PersonAuthorLastName_6,PersonAuthorFirstName_7,PersonAuthorLastName_7,EnrichmentConferenceTitle,EnrichmentConferencePlace,PublisherName,TitleMain_1,TitleParent_1,PageNumber,PageFirst,PageLast,PublishedYear,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <enrichment key="Referiert">Beitrag ist referiert / Article peer-reviewed</enrichment>
    <enrichment key="ConferencePlace">Budva, Montenegro</enrichment>
    <enrichment key="ConferenceTitle">2024 13th Mediterranean Conference on Embedded Computing (MECO)</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <submitter>
      <firstName>Vogel</firstName>
      <lastName>Elisabeth</lastName>
    </submitter>
    <author>
      <firstName>Ievgen</firstName>
      <lastName>Kabin</lastName>
    </author>
    <author>
      <firstName>Marcin</firstName>
      <lastName>Brzozowski</lastName>
    </author>
    <author>
      <firstName>Goran</firstName>
      <lastName>Panic</lastName>
    </author>
    <author>
      <firstName>Cristiano</firstName>
      <lastName>Calligaro</lastName>
    </author>
    <author>
      <firstName>Milos</firstName>
      <lastName>Krstic</lastName>
    </author>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Cryptographic IP cores</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Elliptic curve cryptography (ECC)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Side-channel analysis (SCA) attacks</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SCA resistance</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Differential power analysis (DPA)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Horizontal attacks</value>
    </subject>
    <collection role="institutes" number="1222">FG Systeme</collection>
  </doc>
  <doc>
    <id>37020</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>15</pageLast>
    <pageNumber>15</pageNumber>
    <edition/>
    <issue>16</issue>
    <volume>14</volume>
    <type>articler</type>
    <publisherName>MDPI</publisherName>
    <publisherPlace>Basel</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-12-11</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">On the SCA resistance of TMR-protected cryptographic designs</title>
    <abstract language="eng">The influence of redundant implementations on success of physical attacks against cryptographic devices is currently under-researched. This is especially an issue in application fields such as wearable health, industrial control systems and the like in which devices are accessible to potential attackers. This paper presents results of an investigation of the TMR application impact on the vulnerability of FPGA-based asymmetric cryptographic accelerators to side-channel analysis attacks. We implemented our cryptographic cores using full- and partial-TMR application approaches and experimentally conducted evaluation of their side-channel resistance. Our results reveal that TMR can significantly impact side-channel leakage, either increasing resistance by introducing noise or amplifying leakage depending on the part of the design where redundancy was applied.</abstract>
    <parentTitle language="eng">Electronics</parentTitle>
    <identifier type="doi">10.3390/electronics14163318</identifier>
    <identifier type="issn">2079-9292</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T01:38:20Z","timestamp":1760060300928,"version":"build-2065373602"},"reference-count":34,"publisher":"MDPI AG","issue":"16","license":[{"start":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T00:00:00Z","timestamp":1755648000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Electronics"],"abstract":"&lt;jats:p&gt;The influence of redundant implementations on success of physical attacks against cryptographic devices is currently under-researched. This is especially an issue in application fields such as wearable health, industrial control systems and the like in which devices are accessible to potential attackers. This paper presents results of an investigation of the TMR application impact on the vulnerability of FPGA-based asymmetric cryptographic accelerators to side-channel analysis attacks. We implemented our cryptographic cores using full- and partial-TMR application approaches and experimentally conducted evaluation of their side-channel resistance. Our results reveal that TMR can significantly impact side-channel leakage, either increasing resistance by introducing noise or amplifying leakage depending on the part of the design where redundancy was applied.&lt;\/jats:p&gt;","DOI":"10.3390\/electronics14163318","type":"journal-article","created":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T15:53:37Z","timestamp":1755705217000},"page":"3318","update-policy":"https:\/\/doi.org\/10.3390\/mdpi_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["On the SCA Resistance of TMR-Protected Cryptographic Designs"],"prefix":"10.3390","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3838-6493","authenticated-orcid":false,"given":"Ievgen","family":"Kabin","sequence":"first","affiliation":[{"name":"IHP\u2014Leibniz-Institut f\u00fcr Innovative Mikroelektronik, 15236 Frankfurt (Oder), Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6209-9048","authenticated-orcid":false,"given":"Peter","family":"Langendoerfer","sequence":"additional","affiliation":[{"name":"IHP\u2014Leibniz-Institut f\u00fcr Innovative Mikroelektronik, 15236 Frankfurt (Oder), Germany"},{"name":"Chair of Wireless Systems, Institute of Computer Science, Faculty 1: Mathematics, Computer Science, Physics, Electrical Engineering and Information Technology, Brandenburg University of Technology Cottbus-Senftenberg, 03046 Cottbus, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6819-0467","authenticated-orcid":false,"given":"Zoya","family":"Dyka","sequence":"additional","affiliation":[{"name":"IHP\u2014Leibniz-Institut f\u00fcr Innovative Mikroelektronik, 15236 Frankfurt (Oder), Germany"},{"name":"Chair of Wireless Systems, Institute of Computer Science, Faculty 1: Mathematics, Computer Science, Physics, Electrical Engineering and Information Technology, Brandenburg University of Technology Cottbus-Senftenberg, 03046 Cottbus, Germany"}]}],"member":"1968","published-online":{"date-parts":[[2025,8,20]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Regazzoni, F., Eisenbarth, T., Grobschadl, J., Breveglieri, L., Ienne, P., Koren, I., and Paar, C. (2007, January 26\u201328). Power Attacks Resistance of Cryptographic S-boxes with added Error Detection Circuits. Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), Rome, Italy.","DOI":"10.1109\/DFT.2007.61"},{"key":"ref_2","doi-asserted-by":"crossref","unstructured":"Regazzoni, F., Eisenbarth, T., Breveglieri, L., Ienne, P., and Koren, I. (2008, January 1\u20133). Can Knowledge Regarding the Presence of Countermeasures Against Fault Attacks Simplify Power Attacks on Cryptographic Devices?. Proceedings of the 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, Boston, MA, USA.","DOI":"10.1109\/DFT.2008.53"},{"key":"ref_3","unstructured":"(2025, June 19). UMC. Available online: https:\/\/www.umc.com\/en\/Home\/Index."},{"key":"ref_4","doi-asserted-by":"crossref","unstructured":"Luo, P., Fei, Y., Zhang, L., and Ding, A.A. (2014, January 8\u201310). 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Proceedings of the Cryptographic Hardware and Embedded Systems\u2014CHES 2007, Vienna, Austria.","DOI":"10.1007\/978-3-540-74735-2"},{"key":"ref_14","first-page":"28","article-title":"The Generalization of \u2018Student\u2019s\u2019 Problem when Several Different Population Variances are Involved","volume":"34","author":"Welch","year":"1947","journal-title":"Biometrika"},{"key":"ref_15","doi-asserted-by":"crossref","unstructured":"Almeida, F., Aksoy, L., Raik, J., and Pagliarini, S. (2021, January 22\u201325). Side-Channel Attacks on Triple Modular Redundancy Schemes. Proceedings of the 2021 IEEE 30th Asian Test Symposium (ATS), Matsuyama, Japan.","DOI":"10.1109\/ATS52891.2021.00026"},{"key":"ref_16","unstructured":"Synopsys (2025, June 19). FPGA Design Solution for High-Reliability Applications. 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Proceedings of the 2019 14th International Conference on Design &amp; Technology of Integrated Systems in Nanoscale Era (DTIS), Mykonos, Greece.","DOI":"10.1109\/DTIS.2019.8735011"},{"key":"ref_25","doi-asserted-by":"crossref","first-page":"50","DOI":"10.1016\/j.vlsi.2020.03.001","article-title":"Methods increasing inherent resistance of ECC designs against horizontal attacks","volume":"73","author":"Kabin","year":"2020","journal-title":"Integration"},{"key":"ref_26","doi-asserted-by":"crossref","unstructured":"Kabin, I., Dyka, Z., and Langendoerfer, P. (2022). Atomicity and Regularity Principles Do Not Ensure Full Resistance of ECC Designs against Single-Trace Attacks. Sensors, 22.","DOI":"10.3390\/s22083083"},{"key":"ref_27","unstructured":"Kabin, I. (2023). Horizontal Address-Bit SCA Attacks Against ECC and Appropriate Countermeasures. [Ph.D. Thesis, BTU Cottbus-Senftenberg]."},{"key":"ref_28","unstructured":"(2025, June 19). Arty Z7\u2014Digilent Reference. 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Teledyne LeCroy\u2014WavePro 254HD. Available online: https:\/\/www.teledynelecroy.com\/oscilloscope\/wavepro-hd-oscilloscope\/wavepro-254hd."},{"key":"ref_34","doi-asserted-by":"crossref","unstructured":"Kabin, I., Dyka, Z., Klann, D., Mentens, N., Batina, L., and Langendoerfer, P. (2020, January 26\u201328). Breaking a fully Balanced ASIC Coprocessor Implementing Complete Addition Formulas on Weierstrass Elliptic Curves. Proceedings of the 2020 23rd Euromicro Conference on Digital System Design (DSD), Kranj, Slovenia.","DOI":"10.1109\/DSD51259.2020.00051"}],"container-title":["Electronics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.mdpi.com\/2079-9292\/14\/16\/3318\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,9]],"date-time":"2025-10-09T18:32:12Z","timestamp":1760034732000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.mdpi.com\/2079-9292\/14\/16\/3318"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8,20]]},"references-count":34,"journal-issue":{"issue":"16","published-online":{"date-parts":[[2025,8]]}},"alternative-id":["electronics14163318"],"URL":"https:\/\/doi.org\/10.3390\/electronics14163318","relation":{},"ISSN":["2079-9292"],"issn-type":[{"type":"electronic","value":"2079-9292"}],"subject":[],"published":{"date-parts":[[2025,8,20]]}}}</enrichment>
    <enrichment key="opus_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="local_crossrefLicence">https://creativecommons.org/licenses/by/4.0/</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorIdentifierOrcid_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorIdentifierOrcid_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorIdentifierOrcid_3,PublisherName,TitleMain_1,Language,TitleAbstract_1,TitleParent_1,ArticleNumber,Issue,Volume,PublishedYear,IdentifierIssn,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <enrichment key="Referiert">Beitrag ist referiert / Article peer-reviewed</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>
      <firstName>Ievgen</firstName>
      <lastName>Kabin</lastName>
    </author>
    <submitter>
      <firstName>Pavlo</firstName>
      <lastName>Mykytyn</lastName>
    </submitter>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Triple modular redundancy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>TMR</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Side-channel analysis attacks</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SCA; Cryptographic hardware</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>FPGA security</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Fault tolerance</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Hardware redundancy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Physical attacks</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Secure design</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Elliptic curve cryptosystems</value>
    </subject>
    <collection role="institutes" number="1222">FG Systeme</collection>
  </doc>
  <doc>
    <id>37021</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>322</pageFirst>
    <pageLast>327</pageLast>
    <pageNumber>6</pageNumber>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject_ref</type>
    <publisherName>IEEE</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-12-11</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Channel state information analysis for jamming attack detection in static and dynamic UAV networks – an experimental study</title>
    <abstract language="eng">Networks built on the IEEE 802.11 standard have experienced rapid growth in the last decade. Their field of application is vast, including smart home applications, Internet of Things (IoT), and short-range high throughput static and dynamic inter-vehicular communication networks. In this work, we conduct an experimental study on the feasibility of jamming attack detection in static and dynamic vehicular networks by using real-time Channel State Information (CSI) analysis of the communication channel. To set up a communication network between an Unmanned Aerial Vehicle (UAV) and a Ground Control Station (GCS), we utilize the ESP32-S3 modules from Espressif Systems. The configured link is then subjected to experimental testing of the constant jammer impact on the CSI parameters, including individual subcarrier amplitude attenuation, phase shift, temporal variation (jitter) and Packet Delivery Ratio (PDR) in static and dynamic conditions. Our study experimentally confirms the feasibility of jamming attack detection through CSI analysis in both static and dynamic communication scenarios.</abstract>
    <parentTitle language="eng">2025 21st International Conference on Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT)</parentTitle>
    <identifier type="doi">10.1109/DCOSS-IoT65416.2025.00060</identifier>
    <identifier type="isbn">979-8-3315-4372-3</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,15]],"date-time":"2025-08-15T00:41:25Z","timestamp":1755218485640,"version":"3.43.0"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,9]],"date-time":"2025-06-09T00:00:00Z","timestamp":1749427200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,9]],"date-time":"2025-06-09T00:00:00Z","timestamp":1749427200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,9]]},"DOI":"10.1109\/dcoss-iot65416.2025.00060","type":"proceedings-article","created":{"date-parts":[[2025,8,5]],"date-time":"2025-08-05T18:00:11Z","timestamp":1754416811000},"page":"322-327","source":"Crossref","is-referenced-by-count":0,"title":["Channel State Information Analysis for Jamming Attack Detection in Static and Dynamic UAV Networks \u2013 An Experimental Study"],"prefix":"10.1109","author":[{"given":"Pavlo","family":"Mykytyn","sequence":"first","affiliation":[{"name":"IHP GmbH - Leibniz Institute for High Performance Microelectronics,Frankfurt Oder,Germany"}]},{"given":"Ronald","family":"Chitauro","sequence":"additional","affiliation":[{"name":"IHP GmbH - Leibniz Institute for High Performance Microelectronics,Frankfurt Oder,Germany"}]},{"given":"Zoya","family":"Dyka","sequence":"additional","affiliation":[{"name":"IHP GmbH - Leibniz Institute for High Performance Microelectronics,Frankfurt Oder,Germany"}]},{"given":"Peter","family":"Langendoerfer","sequence":"additional","affiliation":[{"name":"IHP GmbH - Leibniz Institute for High Performance Microelectronics,Frankfurt Oder,Germany"}]}],"member":"263","reference":[{"volume-title":"Autofi: Towards automatic wifi human sensing via geometric self-supervised learning","year":"2022","author":"Yang","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2018.2849655"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"100265","DOI":"10.1016\/j.iot.2020.100265","article-title":"Customized novel routing metrics for wireless mesh-based swarm-of-drones applications","volume":"11","author":"Bautista","year":"2020","journal-title":"Internet of Things"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11277-006-9073-2"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"87","DOI":"10.1016\/j.comcom.2022.10.027","article-title":"Csi-based location-independent human activity recognition with parallel convolutional networks","volume":"197","author":"Zhang","year":"2023","journal-title":"Computer Communications"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/INFOCOM41043.2020.9155539"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/INFOCOM52122.2024.10621199"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3262940"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"1566","DOI":"10.1109\/TSMC.2017.2679725","article-title":"Passive indoor localization based on csi and naive bayes classification","volume":"48","author":"Wu","year":"2018","journal-title":"IEEE Transactions on Systems, Man, and Cybernetics: Systems"},{"issue":"2","key":"ref10","doi-asserted-by":"crossref","first-page":"1019","DOI":"10.32604\/cmes.2023.029075","article-title":"A survey on sensor- and communication-based issues of autonomous uavs","volume":"138","author":"Mykytyn","year":"2024","journal-title":"Computer Modeling in Engineering &amp; Sciences"},{"volume-title":"Definition of ISM band","year":"2025","author":"Freedman","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MECO58584.2023.10154998"},{"article-title":"BladeRF","volume-title":"Nuand","year":"2025","key":"ref13"},{"article-title":"USRP Software Defined Radio (SDR) Online Catalog","volume-title":"Ettus Research","year":"2025","key":"ref14"},{"article-title":"HackRF One - Great Scott Gadgets","volume-title":"Great Scott Gadgets","year":"2025","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3230895"},{"volume-title":"E. R. Brand, a National Instruments","key":"ref17","article-title":"USRP B210 USB Software Defined Radio (SDR)"},{"article-title":"GNU Radio - the Free and Open Software Radio Ecosystem","volume-title":"GNU Radio Foundation","year":"2025","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2694478"},{"journal-title":"Dataset: Iq samples of lte, 5g nr, wi-fi, its-g5, and c-v2x pc5","year":"2023","author":"Girmay","key":"ref20"},{"volume-title":"espressif\/esp-csi","year":"2025","author":"Xiang","key":"ref21"},{"key":"ref22","doi-asserted-by":"crossref","DOI":"10.1109\/VTC2020-Fall49728.2020.9348854","article-title":"A Robustness Comparison of Measured Narrowband CSI vs RSSI for IoT Localization","volume-title":"2020 IEEE 92nd Vehicular Technology Conference: VTC2020-Fall","author":"Ghany"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MECO52532.2021.9460250"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3293404"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3371673"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/1755-1315\/655\/1\/012006"}],"event":{"name":"2025 21st International Conference on Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT)","start":{"date-parts":[[2025,6,9]]},"location":"Lucca, Italy","end":{"date-parts":[[2025,6,11]]}},"container-title":["2025 21st International Conference on Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11096125\/11096132\/11096274.pdf?arnumber=11096274","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,6]],"date-time":"2025-08-06T05:26:07Z","timestamp":1754457967000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11096274\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,9]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/dcoss-iot65416.2025.00060","relation":{},"subject":[],"published":{"date-parts":[[2025,6,9]]}}}</enrichment>
    <enrichment key="opus_crossrefDocumentType">proceedings-article</enrichment>
    <enrichment key="local_crossrefLicence">https://doi.org/10.15223/policy-029</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorFirstName_4,PersonAuthorLastName_4,EnrichmentConferenceTitle,EnrichmentConferencePlace,PublisherName,TitleMain_1,TitleParent_1,PageNumber,PageFirst,PageLast,PublishedYear,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <enrichment key="Referiert">Beitrag ist referiert / Article peer-reviewed</enrichment>
    <enrichment key="ConferencePlace">Lucca, Italy</enrichment>
    <enrichment key="ConferenceTitle">2025 21st International Conference on Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT)</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <author>
      <firstName>Pavlo</firstName>
      <lastName>Mykytyn</lastName>
    </author>
    <submitter>
      <firstName>Pavlo</firstName>
      <lastName>Mykytyn</lastName>
    </submitter>
    <author>
      <firstName>Ronald</firstName>
      <lastName>Chitauro</lastName>
    </author>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>IEEE 802.11</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Internet of Things (IoT)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>UAV</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Wireless Security</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>CSI</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Jamming Attack</value>
    </subject>
    <collection role="institutes" number="1222">FG Systeme</collection>
  </doc>
  <doc>
    <id>37038</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>4</pageLast>
    <pageNumber>4</pageNumber>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject_ref</type>
    <publisherName>Institute of Electrical and Electronics Engineers (IEEE)</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-12-11</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Impact of thermal effects on cryptographic resilience : a study of an ASIC implementation of the Montgomery ladder</title>
    <abstract language="deu">The side-channel attack resistance of hardware implementations of cryptographic algorithms can vary significantly with operating parameters, such as operating voltage, clock frequency, temperature, etc. This study investigates the influence of temperature on the resilience of an ASIC implementation of the Montgomery ladder against SCA. We conducted a series of experiments to evaluate how varying temperature conditions impact the resistance of our ASIC to horizontal attacks. Our results reveal that in contrast to the state-of-the-art approach of increasing the operating temperature, operating under sub-zero temperatures can result in increased vulnerability to side-channel attacks compared to high temperature experiments. We present a detailed analysis of the thermal sensitivity of our ASIC, correlating specific temperature ranges with potential security degradation.</abstract>
    <parentTitle language="eng">2025 IEEE 26th Latin American Test Symposium (LATS)</parentTitle>
    <identifier type="doi">10.1109/LATS65346.2025.10963949</identifier>
    <identifier type="isbn">978-1-6654-7763-5</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,19]],"date-time":"2025-04-19T04:05:12Z","timestamp":1745035512250,"version":"3.40.4"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T00:00:00Z","timestamp":1741651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T00:00:00Z","timestamp":1741651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,11]]},"DOI":"10.1109\/lats65346.2025.10963949","type":"proceedings-article","created":{"date-parts":[[2025,4,17]],"date-time":"2025-04-17T17:38:31Z","timestamp":1744911511000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Impact of Thermal Effects on Cryptographic Resilience: A Study of an ASIC Implementation of the Montgomery Ladder"],"prefix":"10.1109","author":[{"given":"Ievgen","family":"Kabin","sequence":"first","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}]},{"given":"Peter","family":"Langendoerfer","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}]},{"given":"Zoya","family":"Dyka","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_25"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/lats62223.2024.10534604"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/csr61664.2024.10679507"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1228784.1228808"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2008.4541402"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-44709-3_31"},{"key":"ref7","first-page":"145","article-title":"Side-channel attacks from static power: When should we care?","volume-title":"2015 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)","author":"Del Pozo","year":"2024"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2024.3394736"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927198"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2020.i4.416-442"},{"key":"ref11","first-page":"13-1","article-title":"Circuit techniques for leakage reduction","volume-title":"Low-Power Electronics Design","author":"Roy","year":"2004"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1949.tb03645.x"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2017.8093333"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2948141"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2019.i3.202-232"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2019.i3.233-256"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2021.i3.780-805"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48059-5_27"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-42051-2_5"},{"volume-title":"Guide to Elliptic Curve Cryptography","year":"2003","author":"Hankerson","key":"ref20"},{"volume-title":"AEC Documents","year":"2024","key":"ref21"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48059-5_25"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/RECONFIG.2018.8641732"}],"event":{"name":"2025 IEEE 26th Latin American Test Symposium (LATS)","start":{"date-parts":[[2025,3,11]]},"location":"San Andres Islas, Colombia","end":{"date-parts":[[2025,3,14]]}},"container-title":["2025 IEEE 26th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10963875\/10963934\/10963949.pdf?arnumber=10963949","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T05:13:47Z","timestamp":1744953227000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10963949\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,11]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/lats65346.2025.10963949","relation":{},"subject":[],"published":{"date-parts":[[2025,3,11]]}}}</enrichment>
    <enrichment key="opus_crossrefDocumentType">proceedings-article</enrichment>
    <enrichment key="local_crossrefLicence">https://doi.org/10.15223/policy-029</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,EnrichmentConferenceTitle,EnrichmentConferencePlace,PublisherName,TitleMain_1,TitleParent_1,PageNumber,PageFirst,PageLast,PublishedYear,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <enrichment key="Referiert">Beitrag ist referiert / Article peer-reviewed</enrichment>
    <enrichment key="ConferencePlace">San Andres Islas, Colombia</enrichment>
    <enrichment key="ConferenceTitle">2025 IEEE 26th Latin American Test Symposium (LATS)</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <author>
      <firstName>Ievgen</firstName>
      <lastName>Kabin</lastName>
    </author>
    <submitter>
      <firstName>Pavlo</firstName>
      <lastName>Mykytyn</lastName>
    </submitter>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Side-channel analysis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SCA</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Static power</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Static current</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Leakage current</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Leakage current attacks</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Leakage power analysis (LPA)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Attacks exploiting static current</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Operating parameters</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Thermal sensitivity horizontal attacks</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>ECC</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Montgomery Ladder</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Static current SCA</value>
    </subject>
    <collection role="institutes" number="1222">FG Systeme</collection>
  </doc>
  <doc>
    <id>37086</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>410</pageFirst>
    <pageLast>423</pageLast>
    <pageNumber>14</pageNumber>
    <edition/>
    <issue>3</issue>
    <volume>25</volume>
    <type>articler</type>
    <publisherName>Institute of Electrical and Electronics Engineers (IEEE)</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-12-12</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Sensitivity of logic cells to laser fault injections : an overview of experimental results for IHP technologies</title>
    <abstract language="eng">In this work, we provide an overview of our front-side Fault Injection (FI) experiments with different logic cells manufactured in two IHP BiCMOS technologies using Riscure equipment for laser FIs. We were able to inject faults into different types of cells including standard library cells as well as into two types of radiation tolerant flip-flops. Experimenting with radiation-tolerant flip-flops faults were injected illuminating areas with PMOS transistors in OFF state. We determined the cells areas, which were sensitive to the laser FI attacks. Only few works discussed this aspect in the past determining NMOS transistors as the sensitive part of the logic cells. Knowledge about the areas which are sensitive to the laser FI attacks can be generalized experimenting with other technologies and used in future by designers to implement corresponding countermeasure(s) at the initial stage of chip development.</abstract>
    <parentTitle language="eng">IEEE transactions on device and materials reliability</parentTitle>
    <identifier type="doi">10.1109/TDMR.2025.3596380</identifier>
    <identifier type="issn">1530-4388</identifier>
    <identifier type="issn">1558-2574</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,16]],"date-time":"2025-09-16T16:21:59Z","timestamp":1758039719930,"version":"3.44.0"},"reference-count":90,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Device Mater. Relib."],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tdmr.2025.3596380","type":"journal-article","created":{"date-parts":[[2025,8,6]],"date-time":"2025-08-06T18:02:00Z","timestamp":1754503320000},"page":"410-423","source":"Crossref","is-referenced-by-count":0,"title":["Sensitivity of Logic Cells to Laser Fault Injections: An Overview of Experimental Results for IHP Technologies"],"prefix":"10.1109","volume":"25","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4636-8831","authenticated-orcid":false,"given":"Dmytro","family":"Petryk","sequence":"first","affiliation":[{"name":"IHP &amp;#x2013; Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6209-9048","authenticated-orcid":false,"given":"Peter","family":"Langendoerfer","sequence":"additional","affiliation":[{"name":"IHP &amp;#x2013; Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6819-0467","authenticated-orcid":false,"given":"Zoya","family":"Dyka","sequence":"additional","affiliation":[{"name":"IHP &amp;#x2013; Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.6028\/nist.fips.197"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1145\/359340.359342"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.2307\/2007884"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1007\/3-540-39799-X_31"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.6028\/NIST.SP.800-57pt1r5"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.vlsi.2020.03.001"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.3390\/s22083083"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/meco49872.2020.9134146"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/DSD53832.2021.00062"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/LATS57337.2022.9936987"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/EWDTS50664.2020.9225092"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1145\/2845999"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/23.983195"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/TNS.1965.4323904"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1007\/3-540-36400-5_2"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1145\/2732198.2732206"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/FDTC.2017.18"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/HST.2016.7495583"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1145\/3133956.3134039"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/FDTC.2016.16"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/j.micpro.2016.01.018"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/TCAD.2015.2391773"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/HST.2013.6581576"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/FDTC.2009.37"},{"key":"ref25","first-page":"61","article-title":"Optical and EM fault attacks on CRT-based RSA: Concrete results","volume-title":"Proc. 15th Austrian Workshop Microelectron.","author":"Schmidt"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/FDTC.2010.14"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/FDTC.2017.11"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1109\/ASPDAC.2017.7858291"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1007\/978-3-319-49445-6_2"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/FDTC.2016.13"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1007\/s41635-017-0020-3"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1109\/HST.2010.5513110"},{"key":"ref33","first-page":"1","article-title":"Optical fault injections: A setup comparison","volume-title":"Proc. Ph.D Forum 8th BELAS Summer School","author":"Petryk"},{"volume-title":"Leibniz-Institut f\u00fcr innovative Mikroelektronik","year":"2024","key":"ref34"},{"volume-title":"Diode laser station datasheet","year":"2011","key":"ref35"},{"volume-title":"Security tool: Inspector fault injection","year":"2024","key":"ref36"},{"volume-title":"Opto GmbH","year":"2024","key":"ref37"},{"volume-title":"Rise time comparison between a PDM HPP at 1064 and 980nm and a standard PDM+","year":"2024","key":"ref38"},{"volume-title":"VC Glitcher Datasheet","year":"2011","key":"ref39"},{"volume-title":"Tango 2 desktop","year":"2024","key":"ref40"},{"volume-title":"SiGe BiCMOS and silicon photonics technologies: Technologies for MPW &amp; prototyping","year":"2024","key":"ref41"},{"key":"ref42","first-page":"1","article-title":"Optimizing design of fault-tolerant computing systems","volume-title":"Proc. 1st Workshop Hardw. Design Theory (HDT)","author":"Krstic"},{"doi-asserted-by":"publisher","key":"ref43","DOI":"10.1109\/TWIOS.2018.8311401"},{"doi-asserted-by":"publisher","key":"ref44","DOI":"10.1109\/radecs.2011.6131321"},{"doi-asserted-by":"publisher","key":"ref45","DOI":"10.1109\/TCSI.2021.3109080"},{"doi-asserted-by":"publisher","key":"ref46","DOI":"10.1109\/DDECS.2015.65"},{"doi-asserted-by":"publisher","key":"ref47","DOI":"10.1109\/HST.2019.8741030"},{"doi-asserted-by":"publisher","key":"ref48","DOI":"10.1109\/FDTC51366.2020.00013"},{"doi-asserted-by":"publisher","key":"ref49","DOI":"10.7567\/1347-4065\/ab65d3"},{"doi-asserted-by":"publisher","key":"ref50","DOI":"10.1007\/s41635-019-00083-9"},{"doi-asserted-by":"publisher","key":"ref51","DOI":"10.1109\/FDTC.2019.00014"},{"doi-asserted-by":"publisher","key":"ref52","DOI":"10.1109\/WF-IoT51360.2021.9595075"},{"doi-asserted-by":"publisher","key":"ref53","DOI":"10.1109\/WF-IoT51360.2021.9595075"},{"doi-asserted-by":"publisher","key":"ref54","DOI":"10.1007\/978-3-030-97348-3_9"},{"doi-asserted-by":"publisher","key":"ref55","DOI":"10.1109\/FDTC.2011.12"},{"key":"ref56","first-page":"1","article-title":"Using supply voltage metal layers as low cost means to hinder several types of physical attacks","volume-title":"Proc. Int. Conf. Inf. Security Digit. Forensics (ISDF)","author":"Dyka"},{"doi-asserted-by":"publisher","key":"ref57","DOI":"10.1109\/JPROC.2012.2188769"},{"volume-title":"Kokyo beam profiler LaseView camera set series: LaseView-CA50-NCG-BE laser beam profiler","year":"2024","key":"ref58"},{"volume-title":"Diode laser station: Inspector data sheet","year":"2011","key":"ref59"},{"volume-title":"Alphanov PDM 2+HP datasheet","year":"2024","key":"ref60"},{"doi-asserted-by":"publisher","key":"ref61","DOI":"10.1007\/978-3-540-74735-2_31"},{"doi-asserted-by":"publisher","key":"ref62","DOI":"10.1007\/978-3-540-68351-3_8"},{"key":"ref63","first-page":"1","article-title":"ChaCha, a variant of Salsa20","volume-title":"Proc. Workshop Record SASC State Art Stream Ciphers","author":"Bernstein"},{"doi-asserted-by":"publisher","key":"ref64","DOI":"10.1007\/3-540-36400-5_11"},{"doi-asserted-by":"publisher","key":"ref65","DOI":"10.1007\/978-3-642-17650-0_5"},{"doi-asserted-by":"publisher","key":"ref66","DOI":"10.1109\/ReConFig48160.2019.8994807"},{"doi-asserted-by":"publisher","key":"ref67","DOI":"10.1109\/LATS57337.2022.9937007"},{"doi-asserted-by":"publisher","key":"ref68","DOI":"10.1007\/978-3-642-15031-9_13"},{"doi-asserted-by":"publisher","key":"ref69","DOI":"10.1007\/11894063_6"},{"doi-asserted-by":"publisher","key":"ref70","DOI":"10.1109\/AsianHOST.2016.7835564"},{"doi-asserted-by":"publisher","key":"ref71","DOI":"10.1109\/ICECS58634.2023.10382757"},{"doi-asserted-by":"publisher","key":"ref72","DOI":"10.1016\/j.microrel.2021.114281"},{"doi-asserted-by":"publisher","key":"ref73","DOI":"10.6028\/nist.fips.186-5"},{"volume-title":"Cryptographic Algorithms Usage and Key Management: EPC342-08","year":"2022","key":"ref74"},{"year":"2024","author":"Petryk","article-title":"Investigation of sensitivity of different logic and memory cells to laser fault injections","key":"ref75"},{"doi-asserted-by":"publisher","key":"ref76","DOI":"10.1007\/978-3-319-66787-4_9"},{"doi-asserted-by":"publisher","key":"ref77","DOI":"10.1109\/IOLTS.2015.7229820"},{"doi-asserted-by":"publisher","key":"ref78","DOI":"10.1109\/FDTC.2013.17"},{"doi-asserted-by":"publisher","key":"ref79","DOI":"10.1109\/DTIS.2014.6850664"},{"volume-title":"Algorithms, key size and parameters report 2014","year":"2024","key":"ref80"},{"volume-title":"Electronic Signatures and Infrastructures (ESI); Cryptographic Suites, V1.2.1","year":"2017","key":"ref81"},{"year":"2013","author":"Sarafianos","article-title":"Injection de fautes par impulsion laser dans des circuits s\u00e9curis\u00e9s","key":"ref82"},{"volume-title":"Will the Supply\u2013Demand Mismatch Persist for Automotive Semiconductors?","year":"2022","key":"ref83"},{"volume-title":"It\u2019s time for the automotive industry to hit the brakes on legacy technology","year":"2022","key":"ref84"},{"volume-title":"Infineon launches SLC26P security controller based on 28 nm technology for payment applications; expands its supply option to enable long-term, dependable sourcing for smart card and embedded security ICs","year":"2022","key":"ref85"},{"volume-title":"90 nm lithography process","year":"2024","key":"ref86"},{"doi-asserted-by":"publisher","key":"ref87","DOI":"10.1007\/978-3-319-47238-6_17"},{"doi-asserted-by":"publisher","key":"ref88","DOI":"10.1109\/9780470544389"},{"doi-asserted-by":"publisher","key":"ref89","DOI":"10.1109\/TNS.2004.839154"},{"doi-asserted-by":"publisher","key":"ref90","DOI":"10.1109\/23.819140"}],"container-title":["IEEE Transactions on Device and Materials Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/7298\/11157712\/11115104.pdf?arnumber=11115104","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,11]],"date-time":"2025-09-11T04:53:35Z","timestamp":1757566415000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11115104\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":90,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tdmr.2025.3596380","relation":{},"ISSN":["1530-4388","1558-2574"],"issn-type":[{"type":"print","value":"1530-4388"},{"type":"electronic","value":"1558-2574"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}</enrichment>
    <enrichment key="opus_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="local_crossrefLicence">https://creativecommons.org/licenses/by-nc-nd/4.0/</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorIdentifierOrcid_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorIdentifierOrcid_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorIdentifierOrcid_3,PublisherName,TitleMain_1,TitleParent_1,PageNumber,PageFirst,PageLast,Issue,Volume,PublishedYear,IdentifierIssn,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <enrichment key="Referiert">Beitrag ist referiert / Article peer-reviewed</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <licence>Creative Commons - CC BY-NC-ND - Namensnennung - Nicht kommerziell - Keine Bearbeitungen 4.0 International</licence>
    <author>
      <firstName>Dmytro</firstName>
      <lastName>Petryk</lastName>
    </author>
    <submitter>
      <firstName>Pavlo</firstName>
      <lastName>Mykytyn</lastName>
    </submitter>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Laser fault injection attack</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Radiation tolerant cells</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Cell’s sensitive area</value>
    </subject>
    <collection role="institutes" number="1222">FG Systeme</collection>
  </doc>
  <doc>
    <id>37085</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>252</pageFirst>
    <pageLast>258</pageLast>
    <pageNumber>7</pageNumber>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject_ref</type>
    <publisherName>Institute of Electrical and Electronics Engineers (IEEE)</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-12-12</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Revisiting atomic patterns for elliptic curve scalar multiplication revealing inherent vulnerability to simple SCA</title>
    <abstract language="eng">Elliptic Curve Scalar Multiplication, denoted as kP operation, is the basic operation in all Elliptic Curve-based cryptographic protocols. The atomicity principle and different atomic patterns for kP algorithms were proposed in the past as countermeasures against simple side-channel analysis. In this work, we investigated the resistance of a kP algorithm implemented in hardware using Longa’s atomic patterns. We analysed its simulated power trace. We show in the example of our kP implementation for the NIST EC P-256 that the field squaring operations are distinguishable from the field multiplications even if they are performed by the same field multiplier, due to the addressing of the second multiplicand. This inherent vulnerability of atomic patterns can be successfully exploited to reveal the scalar k.</abstract>
    <parentTitle language="eng">2025 12th IFIP International Conference on New Technologies, Mobility and Security (NTMS)</parentTitle>
    <identifier type="doi">10.1109/NTMS65597.2025.11076762</identifier>
    <identifier type="isbn">979-8-3315-5276-3</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,9]],"date-time":"2025-10-09T13:02:23Z","timestamp":1760014943960,"version":"3.41.2"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T00:00:00Z","timestamp":1750204800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T00:00:00Z","timestamp":1750204800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,18]]},"DOI":"10.1109\/ntms65597.2025.11076762","type":"proceedings-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T17:42:27Z","timestamp":1752860547000},"page":"252-258","source":"Crossref","is-referenced-by-count":1,"title":["Revisiting Atomic Patterns for Elliptic Curve Scalar Multiplication Revealing Inherent Vulnerability to Simple SCA"],"prefix":"10.1109","author":[{"given":"Alkistis Aikaterini","family":"Sigourou","sequence":"first","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt(Oder),Germany"}]},{"given":"Zoya","family":"Dyka","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt(Oder),Germany"}]},{"given":"Sze Hei","family":"Li","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt(Oder),Germany"}]},{"given":"Peter","family":"Langendoerfer","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt(Oder),Germany"}]},{"given":"Ievgen","family":"Kabin","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt(Oder),Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-39799-X_31"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1090\/s0025-5718-1987-0866109-5"},{"key":"ref3","article-title":"Introduction to differential power analysis and related attacks","author":"Kocher","year":"1998","journal-title":"Cryptography Research"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2004.13"},{"key":"ref5","article-title":"Accelerating the Scalar Multiplication on Elliptic Curve Cryptosystems over Prime Fields","author":"Longa","year":"2008"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-12510-2_7"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08302-5_12"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ewdts59469.2023.10297074"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48059-5_25"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1090\/s0025-5718-1987-0866113-7"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/icecs.2010.5724745"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45238-6_30"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/date.2010.5456907"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/581199.581218"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/b97644"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36400-5_22"},{"key":"ref17","article-title":"Distinguishability Investigation on Longa Atomic Patterns when used as a Basis for Implementing Elliptic Curve Scalar Multiplication Algorithms","author":"Li","year":"2024"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ewdts63723.2024.10873728"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/meco58584.2023.10154940"},{"key":"ref20","article-title":"IHP: Leibniz Institute for High Performance Microelectronics","year":"2024"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.6028\/nist.fips.186-4"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/date.2005.67"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ewdts.2019.8884393"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/reconfig.2018.8641730"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-47238-6_12"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-22829-2_7"}],"event":{"name":"2025 12th IFIP International Conference on New Technologies, Mobility and Security (NTMS)","location":"Paris, France","start":{"date-parts":[[2025,6,18]]},"end":{"date-parts":[[2025,6,20]]}},"container-title":["2025 12th IFIP International Conference on New Technologies, Mobility and Security (NTMS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11076604\/11076612\/11076762.pdf?arnumber=11076762","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T05:05:48Z","timestamp":1752901548000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11076762\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,18]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/ntms65597.2025.11076762","relation":{},"subject":[],"published":{"date-parts":[[2025,6,18]]}}}</enrichment>
    <enrichment key="opus_crossrefDocumentType">proceedings-article</enrichment>
    <enrichment key="local_crossrefLicence">https://doi.org/10.15223/policy-029</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorFirstName_4,PersonAuthorLastName_4,PersonAuthorFirstName_5,PersonAuthorLastName_5,EnrichmentConferenceTitle,EnrichmentConferencePlace,PublisherName,TitleMain_1,TitleParent_1,PageNumber,PageFirst,PageLast,PublishedYear,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <enrichment key="Referiert">Beitrag ist referiert / Article peer-reviewed</enrichment>
    <enrichment key="ConferencePlace">Paris, France</enrichment>
    <enrichment key="ConferenceTitle">2025 12th IFIP International Conference on New Technologies, Mobility and Security (NTMS)</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <author>
      <firstName>Alkistis Aikaterini</firstName>
      <lastName>Sigourou</lastName>
    </author>
    <submitter>
      <firstName>Pavlo</firstName>
      <lastName>Mykytyn</lastName>
    </submitter>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <author>
      <firstName>Sze Hei</firstName>
      <lastName>Li</lastName>
    </author>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <author>
      <firstName>Ievgen</firstName>
      <lastName>Kabin</lastName>
    </author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Elliptic Curve Cryptosystem (ECC)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>kP</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Atomic patterns</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Simple Power Analysis (SPA)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Side-Channel Analysis (SCA) attacks</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Longa’s atomic patterns</value>
    </subject>
    <collection role="institutes" number="1222">FG Systeme</collection>
  </doc>
  <doc>
    <id>37084</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>4</pageLast>
    <pageNumber>4</pageNumber>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject_ref</type>
    <publisherName>Institute of Electrical and Electronics Engineers (IEEE)</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-12-12</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Case study : horizontal side-channel analysis attack against elliptic curve scalar multiplication accelerator under laser illumination</title>
    <abstract language="eng">Devices employing cryptographic approaches have to be resistant to physical attacks. Side-Channel Analysis (SCA) and Fault Injection (FI) attacks are frequently used to reveal cryptographic keys. In this paper, we present a combined SCA and laser illumination attack against an Elliptic Curve Scalar Multiplication accelerator using a differential probe from Teledyne LeCroy. Our experiments show that laser illumination increases the power consumption of the chip, especially its static power consumption but the success of the horizontal power analysis attacks was changed insignificantly. We assume that using a laser with a high laser beam power and concentrating on measuring and analysing only static current can improve the attack success significantly. The horizontal attacks against public key cryptosystems exploiting the Static Consumption under Laser Illumination (SCuLI attacks) are novel and their potential is not investigated yet. These attacks can be especially dangerous against cryptographic chips manufactured in scaled technologies. If such attacks are feasible, appropriate countermeasures have to be proposed in the future.</abstract>
    <parentTitle language="eng">2025 IEEE 26th Latin American Test Symposium (LATS)</parentTitle>
    <identifier type="doi">10.1109/LATS65346.2025.10963958</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T05:40:08Z","timestamp":1744954808946,"version":"3.40.4"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T00:00:00Z","timestamp":1741651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T00:00:00Z","timestamp":1741651200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,3,11]]},"DOI":"10.1109\/lats65346.2025.10963958","type":"proceedings-article","created":{"date-parts":[[2025,4,17]],"date-time":"2025-04-17T17:38:31Z","timestamp":1744911511000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Case Study: Horizontal Side-Channel Analysis Attack Against Elliptic Curve Scalar Multiplication Accelerator Under Laser Illumination"],"prefix":"10.1109","author":[{"given":"Dmytro","family":"Petryk","sequence":"first","affiliation":[{"name":"IHP &amp;#x2013; Leibniz-Institut f&amp;#x00F9;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}]},{"given":"Ievgen","family":"Kabin","sequence":"additional","affiliation":[{"name":"IHP &amp;#x2013; Leibniz-Institut f&amp;#x00F9;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}]},{"given":"Peter","family":"Langendoerfer","sequence":"additional","affiliation":[{"name":"IHP &amp;#x2013; Leibniz-Institut f&amp;#x00F9;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}]},{"given":"Zoya","family":"Dyka","sequence":"additional","affiliation":[{"name":"IHP &amp;#x2013; Leibniz-Institut f&amp;#x00F9;r innovative Mikroelektronik,Frankfurt (Oder),Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36400-5_2"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-15031-9_13"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/11894063_6"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST.2016.7835564"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS58634.2023.10382757"},{"volume-title":"IHP. About us","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/s22083083"},{"volume-title":"FIPS 186-4, Digital Signature Standard; Request for Comments on the NIST-Recommended Elliptic Curves","year":"2015","key":"ref8"},{"key":"ref9","article-title":"Horizontal address-bit SCA attacks against ECC and appropriate countermeasures","volume-title":"Doctoral thesis, BTU Cottbus \u2500 Senftenberg","author":"Kabin","year":"2023"},{"volume-title":"Differential probe ZD1500","key":"ref10"},{"volume-title":"Diode Laser Station Datasheet","year":"2011","key":"ref11"},{"volume-title":"Alphanov PDM 2+ HP.","key":"ref12"},{"key":"ref13","article-title":"Investigation of sensitivity of different logic and memory cells to Laser Fault Injections","volume-title":"Doctoral thesis, BTU Cottbus \u2500 Senftenberg","author":"Petryk","year":"2024"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MECO62516.2024.10577919"},{"key":"ref15","first-page":"1","article-title":"Optical Fault Injections: a Setup Comparison","volume-title":"Proc. PhD Forum of the 8th BELAS Summer School","author":"Petryk"},{"volume-title":"Microsope units and objectives.","key":"ref16"},{"volume-title":"Kokyo LaseView-CA50-NCG-BE laser beam profiler.","key":"ref17"}],"event":{"name":"2025 IEEE 26th Latin American Test Symposium (LATS)","start":{"date-parts":[[2025,3,11]]},"location":"San Andres Islas, Colombia","end":{"date-parts":[[2025,3,14]]}},"container-title":["2025 IEEE 26th Latin American Test Symposium (LATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10963875\/10963934\/10963958.pdf?arnumber=10963958","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T05:03:53Z","timestamp":1744952633000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10963958\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3,11]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/lats65346.2025.10963958","relation":{},"subject":[],"published":{"date-parts":[[2025,3,11]]}}}</enrichment>
    <enrichment key="opus_crossrefDocumentType">proceedings-article</enrichment>
    <enrichment key="local_crossrefLicence">https://doi.org/10.15223/policy-029</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorFirstName_4,PersonAuthorLastName_4,EnrichmentConferenceTitle,EnrichmentConferencePlace,PublisherName,TitleMain_1,TitleParent_1,PageNumber,PageFirst,PageLast,PublishedYear,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <enrichment key="Referiert">Beitrag ist referiert / Article peer-reviewed</enrichment>
    <enrichment key="ConferencePlace">San Andres Islas, Colombia</enrichment>
    <enrichment key="ConferenceTitle">2025 IEEE 26th Latin American Test Symposium (LATS)</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <author>
      <firstName>Dmytro</firstName>
      <lastName>Petryk</lastName>
    </author>
    <submitter>
      <firstName>Pavlo</firstName>
      <lastName>Mykytyn</lastName>
    </submitter>
    <author>
      <firstName>Ievgen</firstName>
      <lastName>Kabin</lastName>
    </author>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Security</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Side-Channel Analysis (SCA)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Laser illumination</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Power consumption</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Static Consumption under Laser Illumination (SCuLI) attacks</value>
    </subject>
    <collection role="institutes" number="1222">FG Systeme</collection>
  </doc>
  <doc>
    <id>37082</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>990</pageFirst>
    <pageLast>995</pageLast>
    <pageNumber>6</pageNumber>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject_ref</type>
    <publisherName>Institute of Electrical and Electronics Engineers (IEEE)</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2025-12-12</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Atomic patterns : field operation distinguishability on cryptographic ASICs</title>
    <abstract language="deu">Scalar multiplication kP is the most frequently attacked operation in Elliptic Curve Cryptosystems (ECC) protocols. To counter simple Side-Channel Analysis (SCA), the atomicity principle and various atomic block constructions have been proposed in the past. In this paper, we demonstrate that binary kP algorithms based on atomic patterns remain vulnerable to simple SCA, due to different energy consumption of the field multiplier while obtaining the second multiplicand for field multiplication or squaring operations. The reasons for this difference are the data-bit as well as the address-bit effects. Please note, this leakage does not depend on the multiplication formula used. We validate this vulnerability through experiments using Longa’s atomic patterns, revealing that such leakage significantly compromises the SCA resistance of numerous atomic implementations and facilitates potential key extraction. We conclude by providing some potential solutions to mitigate the revealed vulnerability.</abstract>
    <parentTitle language="eng">2025 IEEE International Conference on Cyber Security and Resilience (CSR)</parentTitle>
    <identifier type="doi">10.1109/CSR64739.2025.11130154</identifier>
    <identifier type="isbn">979-8-3315-3591-9</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,27]],"date-time":"2025-08-27T05:10:17Z","timestamp":1756271417353,"version":"3.44.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,8,4]],"date-time":"2025-08-04T00:00:00Z","timestamp":1754265600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,8,4]],"date-time":"2025-08-04T00:00:00Z","timestamp":1754265600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,8,4]]},"DOI":"10.1109\/csr64739.2025.11130154","type":"proceedings-article","created":{"date-parts":[[2025,8,26]],"date-time":"2025-08-26T19:04:27Z","timestamp":1756235067000},"page":"990-995","source":"Crossref","is-referenced-by-count":0,"title":["Atomic Patterns: Field Operation Distinguishability on Cryptographic ASICs"],"prefix":"10.1109","author":[{"given":"Alkistis Aikaterini","family":"Sigourou","sequence":"first","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}]},{"given":"Zoya","family":"Dyka","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}]},{"given":"Peter","family":"Langendoerfer","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}]},{"given":"Ievgen","family":"Kabin","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-39799-x_31"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1090\/s0025-5718-1987-0866109-5"},{"key":"ref3","article-title":"Introduction to differential power analysis and related attacks","author":"Kocher","year":"1998","journal-title":"Cryptography Research"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-17650-0_5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2004.13"},{"article-title":"Accelerating the Scalar Multiplication on Elliptic Curve Cryptosystems over Prime Fields","year":"2008","author":"Longa","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-12510-2_7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08302-5_12"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s22083083"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45238-6_30"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-43414-7_28"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/581199.581218"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/b97644"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/reconfig.2017.8279800"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.6028\/nist.fips.186-4"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ewdts63723.2024.10873728"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/date.2005.67"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/dtis.2018.8368560"},{"year":"2024","key":"ref19","article-title":"IHP: Leibniz Institute for High Performance Microelectronics"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2007.70815"},{"key":"ref21","article-title":"Cryptographic hardware accelerator with dummy block addressing for protection against side channel attacks","volume-title":"US20240111908A1","author":"Kabin","year":"2024"}],"event":{"name":"2025 IEEE International Conference on Cyber Security and Resilience (CSR)","start":{"date-parts":[[2025,8,4]]},"location":"Chania, Crete, Greece","end":{"date-parts":[[2025,8,6]]}},"container-title":["2025 IEEE International Conference on Cyber Security and Resilience (CSR)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11129696\/11129957\/11130154.pdf?arnumber=11130154","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,27]],"date-time":"2025-08-27T04:50:56Z","timestamp":1756270256000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11130154\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8,4]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/csr64739.2025.11130154","relation":{},"subject":[],"published":{"date-parts":[[2025,8,4]]}}}</enrichment>
    <enrichment key="opus_crossrefDocumentType">proceedings-article</enrichment>
    <enrichment key="local_crossrefLicence">https://doi.org/10.15223/policy-029</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorFirstName_4,PersonAuthorLastName_4,EnrichmentConferenceTitle,EnrichmentConferencePlace,PublisherName,TitleMain_1,TitleParent_1,PageNumber,PageFirst,PageLast,PublishedYear,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <enrichment key="Referiert">Beitrag ist referiert / Article peer-reviewed</enrichment>
    <enrichment key="ConferencePlace">Chania, Crete, Greece</enrichment>
    <enrichment key="ConferenceTitle">2025 IEEE International Conference on Cyber Security and Resilience (CSR)</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <author>
      <firstName>Alkistis Aikaterini</firstName>
      <lastName>Sigourou</lastName>
    </author>
    <submitter>
      <firstName>Pavlo</firstName>
      <lastName>Mykytyn</lastName>
    </submitter>
    <author>
      <firstName>Zoya</firstName>
      <lastName>Dyka</lastName>
    </author>
    <author>
      <firstName>Peter</firstName>
      <lastName>Langendoerfer</lastName>
    </author>
    <author>
      <firstName>Ievgen</firstName>
      <lastName>Kabin</lastName>
    </author>
    <subject>
      <language>eng</language>
      <type>psyndex</type>
      <value>Elliptic Curve (EC)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>psyndex</type>
      <value>Elliptic Curve Cryptosystem (ECC)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>psyndex</type>
      <value>kP</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>psyndex</type>
      <value>Atomic block</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>psyndex</type>
      <value>Atomic patterns</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>psyndex</type>
      <value>Simple Power Analysis (SPA)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>psyndex</type>
      <value>Side-Channel Analysis (SCA) attacks</value>
    </subject>
    <collection role="institutes" number="1222">FG Systeme</collection>
  </doc>
</export-example>
