<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>6036</id>
    <completedYear/>
    <publishedYear>1999</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>741</pageFirst>
    <pageLast>744</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>Piscataway, NJ</publisherName>
    <publisherPlace>IEEE</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2011-03-02</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Influence of 2 GHz Harmonic Load-Pull on HBT and MESFET Output Power and Efficiency</title>
    <parentTitle language="eng">1999 IEEE MTT-S International Microwave Symposium digest, June 13 - 19, 1999, Anaheim Convention Center, Anaheim, California</parentTitle>
    <identifier type="isbn">0-7803-5135-5</identifier>
    <enrichment key="UBICOIdent">006929</enrichment>
    <author>
      <firstName>Matthias</firstName>
      <lastName>Rudolph</lastName>
    </author>
    <submitter>
      <firstName>...</firstName>
      <lastName>Administrator</lastName>
    </submitter>
    <author>
      <firstName>Friedrich</firstName>
      <lastName>Lenk</lastName>
    </author>
    <author>
      <firstName>Ralf</firstName>
      <lastName>Dörner</lastName>
    </author>
    <author>
      <firstName>Peter</firstName>
      <lastName>Heymann</lastName>
    </author>
    <collection role="old_institute" number="03045">Ulrich-Rohde-Stiftungsprofessur für Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="old_institute" number="05031">Prof. Nachrichtentechnik</collection>
    <collection role="institutes" number="1121">Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="institutes" number="3182">FG Nachrichtentechnik</collection>
  </doc>
  <doc>
    <id>6038</id>
    <completedYear/>
    <publishedYear>2001</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1967</pageFirst>
    <pageLast>1970</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>IEEE Service Center</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2011-03-02</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Modeling of Low-Frequency Noise in GaInP/GaAs Hetero-Bipolar-Transistors</title>
    <parentTitle language="eng">2001 IEEE MTT-S International Microwave Symposium digest, May 20 - 25, 2001, Phoenix Civic Plaza, Phoenix, AZ, 1967 - 1970, Vol.3</parentTitle>
    <identifier type="isbn">0-7803-6538-0</identifier>
    <enrichment key="UBICOIdent">006931</enrichment>
    <author>
      <firstName>Matthias</firstName>
      <lastName>Rudolph</lastName>
    </author>
    <submitter>
      <firstName>...</firstName>
      <lastName>Administrator</lastName>
    </submitter>
    <author>
      <firstName>Ralf</firstName>
      <lastName>Dörner</lastName>
    </author>
    <author>
      <firstName>Peter</firstName>
      <lastName>Heymann</lastName>
    </author>
    <author>
      <firstName>Friedrich</firstName>
      <lastName>Lenk</lastName>
    </author>
    <collection role="old_institute" number="03045">Ulrich-Rohde-Stiftungsprofessur für Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="old_institute" number="05031">Prof. Nachrichtentechnik</collection>
    <collection role="institutes" number="1121">Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="institutes" number="3182">FG Nachrichtentechnik</collection>
  </doc>
  <doc>
    <id>6039</id>
    <completedYear/>
    <publishedYear>2002</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>725</pageFirst>
    <pageLast>728</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>IEEE Service Center</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2011-03-02</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">New Extraction Algorithm for GaAs-HBTs With Low Intrinsic Base Resistance</title>
    <parentTitle language="eng">IEEE MTT-S International Microwave Symposium digest, June 2 - 7, 2002, Washington State Convention &amp; Trade Center, Seattle, Washington, Vol. 2</parentTitle>
    <identifier type="isbn">0-7803-7239-5</identifier>
    <enrichment key="UBICOIdent">006932</enrichment>
    <author>
      <firstName>Friedrich</firstName>
      <lastName>Lenk</lastName>
    </author>
    <submitter>
      <firstName>...</firstName>
      <lastName>Administrator</lastName>
    </submitter>
    <author>
      <firstName>Matthias</firstName>
      <lastName>Rudolph</lastName>
    </author>
    <collection role="old_institute" number="03045">Ulrich-Rohde-Stiftungsprofessur für Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="old_institute" number="05031">Prof. Nachrichtentechnik</collection>
    <collection role="institutes" number="1121">Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="institutes" number="3182">FG Nachrichtentechnik</collection>
  </doc>
  <doc>
    <id>6040</id>
    <completedYear/>
    <publishedYear>2002</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>997</pageFirst>
    <pageLast>1000</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>IEEE Service Center</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2011-03-02</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Towards a Unified Method to Implement Transit-Time Effects in Pi-Topology HBT CompactModels</title>
    <parentTitle language="eng">IEEE MTT-S International Microwave Symposium digest, June 2 - 7, 2002, Washington State Convention &amp; Trade Center, Seattle, Washington, Vol. 2</parentTitle>
    <identifier type="isbn">0-7803-7239-5</identifier>
    <enrichment key="UBICOIdent">006933</enrichment>
    <author>
      <firstName>Matthias</firstName>
      <lastName>Rudolph</lastName>
    </author>
    <submitter>
      <firstName>...</firstName>
      <lastName>Administrator</lastName>
    </submitter>
    <author>
      <firstName>Friedrich</firstName>
      <lastName>Lenk</lastName>
    </author>
    <author>
      <firstName>Ralf</firstName>
      <lastName>Dörner</lastName>
    </author>
    <author>
      <firstName>Peter</firstName>
      <lastName>Heymann</lastName>
    </author>
    <collection role="old_institute" number="03045">Ulrich-Rohde-Stiftungsprofessur für Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="old_institute" number="05031">Prof. Nachrichtentechnik</collection>
    <collection role="institutes" number="1121">Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="institutes" number="3182">FG Nachrichtentechnik</collection>
  </doc>
  <doc>
    <id>6023</id>
    <completedYear/>
    <publishedYear>2006</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>2954</pageFirst>
    <pageLast>2961</pageLast>
    <pageNumber/>
    <edition/>
    <issue>7</issue>
    <volume>54</volume>
    <type>articler</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2011-03-01</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">On the Simulation of Low-Frequency Noise Upconversion in InGaP/GaAs HBTs</title>
    <parentTitle language="eng">IEEE transactions on microwave theory and techniques</parentTitle>
    <identifier type="issn">0018-9480</identifier>
    <enrichment key="UBICOIdent">006916</enrichment>
    <author>
      <firstName>Matthias</firstName>
      <lastName>Rudolph</lastName>
    </author>
    <submitter>
      <firstName>...</firstName>
      <lastName>Administrator</lastName>
    </submitter>
    <author>
      <firstName>Friedrich</firstName>
      <lastName>Lenk</lastName>
    </author>
    <author>
      <firstName>O.</firstName>
      <lastName>Llopis</lastName>
    </author>
    <author>
      <firstName>Wolfgang</firstName>
      <lastName>Heinrich</lastName>
    </author>
    <collection role="old_institute" number="03045">Ulrich-Rohde-Stiftungsprofessur für Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="old_institute" number="05031">Prof. Nachrichtentechnik</collection>
    <collection role="institutes" number="1121">Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="institutes" number="3182">FG Nachrichtentechnik</collection>
  </doc>
  <doc>
    <id>6752</id>
    <completedYear/>
    <publishedYear>2011</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber>Paper 2-4</pageNumber>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>Piscataway, NJ</publisherName>
    <publisherPlace>IEEE</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2012-01-18</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Calibration Residual Error Propagation Analysis Using Conformal Mapping</title>
    <parentTitle language="eng">77th ARFTG Microwave Measurement Conference (ARFTG 2011), Baltimore, Maryland, USA, 10 June 2011</parentTitle>
    <identifier type="isbn">978-1-61284-959-1</identifier>
    <enrichment key="UBICOIdent">007936</enrichment>
    <author>
      <firstName>Friedrich</firstName>
      <lastName>Lenk</lastName>
    </author>
    <submitter>
      <firstName>...</firstName>
      <lastName>Administrator</lastName>
    </submitter>
    <author>
      <firstName>Ralf</firstName>
      <lastName>Dörner</lastName>
    </author>
    <author>
      <firstName>Andrej</firstName>
      <lastName>Rumiantsev</lastName>
    </author>
    <author>
      <firstName>Matthias</firstName>
      <lastName>Rudolph</lastName>
    </author>
    <collection role="old_institute" number="03045">Ulrich-Rohde-Stiftungsprofessur für Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="old_institute" number="05031">Prof. Nachrichtentechnik</collection>
    <collection role="institutes" number="1121">Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="institutes" number="3182">FG Nachrichtentechnik</collection>
  </doc>
  <doc>
    <id>10402</id>
    <completedYear/>
    <publishedYear>2012</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>593</pageFirst>
    <pageLast>596</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>IEEE</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2014-03-14</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Impact of in-situ TRL reference impedance determination on parameter extraction</title>
    <abstract language="eng">This paper investigates the impact of possible parameter extraction errors caused by inaccurate definition of the calibration reference impedance of in-situ multiline TRL. Two calibration sets implemented on GaAs and Si/SiGe:C wafer processes were quantitatively analyzed. Obtained results demonstrated that for most practical cases, the desired 5%-level of confidence of extracted parameters of high-reflective devices can easily be achieved without additional efforts. Thus, implementation of the in-situ TRL into a characterization workflow of high-performance microwave devices can be significantly simplified.</abstract>
    <parentTitle language="eng">Microwave Conference (EuMC), 2012 42nd European, Amsterdam, Netherlands, 29 October - 1 November 2012</parentTitle>
    <identifier type="isbn">978-1-4673-2215-7</identifier>
    <identifier type="isbn">978-2-87487-026-2</identifier>
    <identifier type="url">http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6459080</identifier>
    <enrichment key="BTU">nicht an der BTU erstellt / not created at BTU</enrichment>
    <author>
      <firstName>Andrej</firstName>
      <lastName>Rumiantsev</lastName>
    </author>
    <submitter>
      <firstName>Friedrich</firstName>
      <lastName>Lenk</lastName>
    </submitter>
    <author>
      <firstName>Ralf</firstName>
      <lastName>Dörner</lastName>
    </author>
    <author>
      <firstName>Friedrich</firstName>
      <lastName>Lenk</lastName>
    </author>
    <collection role="old_institute" number="03045">Ulrich-Rohde-Stiftungsprofessur für Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="old_institute" number="05031">Prof. Nachrichtentechnik</collection>
    <collection role="institutes" number="1121">Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="institutes" number="3182">FG Nachrichtentechnik</collection>
  </doc>
  <doc>
    <id>10375</id>
    <completedYear/>
    <publishedYear>2013</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>4</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>IEEE</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2014-03-11</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Measurement uncertainties due to non-ideal calibration standards for unknown thru calibration</title>
    <parentTitle language="eng">Microwave Measurement Conference (ARFTG), 2013 81st ARFTG</parentTitle>
    <identifier type="doi">10.1109/ARFTG.2013.6579057</identifier>
    <identifier type="isbn">978-1-4673-4981-9</identifier>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <author>
      <firstName>Friedrich</firstName>
      <lastName>Lenk</lastName>
    </author>
    <submitter>
      <firstName>Antina</firstName>
      <lastName>Schmidt</lastName>
    </submitter>
    <author>
      <firstName>Ralf</firstName>
      <lastName>Dörner</lastName>
    </author>
    <author>
      <firstName>Paul</firstName>
      <lastName>Kurpas</lastName>
    </author>
    <author>
      <firstName>Andrej</firstName>
      <lastName>Rumiantsev</lastName>
    </author>
    <collection role="old_institute" number="03045">Ulrich-Rohde-Stiftungsprofessur für Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="old_institute" number="05031">Prof. Nachrichtentechnik</collection>
    <collection role="institutes" number="1121">Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="institutes" number="3182">FG Nachrichtentechnik</collection>
  </doc>
  <doc>
    <id>10373</id>
    <completedYear/>
    <publishedYear>2013</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>3800</pageFirst>
    <pageLast>3807</pageLast>
    <pageNumber/>
    <edition/>
    <issue>10</issue>
    <volume>61</volume>
    <type>articler</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>2014-03-11</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Sensitivity Analysis of S-Parameter Measurements Due to Calibration Standards Uncertainty</title>
    <parentTitle language="eng">IEEE Transactions on Microwave Theory and Techniques</parentTitle>
    <identifier type="doi">10.1109/TMTT.2013.2279774</identifier>
    <identifier type="issn">0018-9480</identifier>
    <enrichment key="BTU">an der BTU erstellt / created at BTU</enrichment>
    <author>
      <firstName>Friedrich</firstName>
      <lastName>Lenk</lastName>
    </author>
    <submitter>
      <firstName>Antina</firstName>
      <lastName>Schmidt</lastName>
    </submitter>
    <author>
      <firstName>Ralf</firstName>
      <lastName>Dörner</lastName>
    </author>
    <author>
      <firstName>Andrej</firstName>
      <lastName>Rumiantsev</lastName>
    </author>
    <collection role="old_institute" number="03045">Ulrich-Rohde-Stiftungsprofessur für Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="old_institute" number="05031">Prof. Nachrichtentechnik</collection>
    <collection role="institutes" number="1121">Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik</collection>
    <collection role="institutes" number="3182">FG Nachrichtentechnik</collection>
  </doc>
</export-example>
