@phdthesis{Scheit, author = {Scheit, Daniel}, title = {Fault-tolerant integrated interconnections based on built-in self-repair and codes}, url = {http://nbn-resolving.de/urn:nbn:de:kobv:co1-opus-22679}, pages = {II, V, 87}, language = {en} } @inproceedings{OPUS4-7067, title = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, editor = {Vierhaus, Heinrich Theodor and Steininger, Andreas and Pawlak, A. and Kraemer, Rolf and Sch{\"o}lzel, Mario and Raik, Jaan}, isbn = {978-1-4244-9755-3}, pages = {464}, abstract = {Konferenzband, erstellt und gedruckt von BTU Cottbus, Rechte bei IEEE Computer Society}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Optimal Spare Utilization for Reliability and Men Litetime Improvement for Logic Built-in Self Repair}, series = {Proceedings, IEEE DDECS 2011, Cottbus}, booktitle = {Proceedings, IEEE DDECS 2011, Cottbus}, isbn = {978-1-4244-9753-9}, abstract = {Tagungsbeitrag DDECS 2011, Cottbus}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors}, series = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, booktitle = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, isbn = {978-1-4244-9755-3}, pages = {143 -- 146}, abstract = {Tagungsbeitrag DDECS 2011, Cottbus}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hiararchical Built-In SElf Test with On-Chip Diagnosis for VLIW Processors}, abstract = {Tagungsbeitrag 23. ITG-Tagung "Test und Zuverl{\"a}ssigeit von Schaltungen und Systemen", Passau, 2011}, language = {en} } @inproceedings{KoalBeckVierhaus, author = {Koal, Tobias and Beck, Matthias-Stephan and Vierhaus, Heinrich Theodor}, title = {Rekonfigurierbare Logik f{\"u}r Ausbeute-Optimierung und Verschleiß-Kompensation}, abstract = {Tagungsbeitrag ITG-GI-GMM-Tagung "Zuverl{\"a}ssigeit und Entwurf", Hamburg, 2011}, language = {de} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A Software Based Self Test and Hardware Reconfiguration Solution for VLIW Processors}, series = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, booktitle = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4244-6612-2}, pages = {40 -- 43}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Combining De-Stressing and Self Repair for Long-Term Dependable Systems}, series = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, booktitle = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4244-6613-9}, pages = {99 -- 104}, language = {en} } @inproceedings{GleichnerKoalVierhaus, author = {Gleichner, Christian and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Effiziente Verfahren der Selbstreparatur von Logik}, abstract = {Tagungsbeitrag ITG-GI-GMM Workshop "Test und Zuverl{\"a}ssigkeit von Schaltungen und Systemen", Paderborn, Februar 2010}, language = {de} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {A Comprehensive Scheme for Logic Self Repair}, series = {Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings}, booktitle = {Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings}, publisher = {Univ. of Technology, Fac. of Computing Science and Management}, address = {Poznan}, isbn = {978-83-62065-00-4}, pages = {13 -- 18}, language = {en} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {A Concept for Logic Self Repair}, series = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, booktitle = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-424-44768-8}, pages = {621 -- 624}, language = {en} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Reliability Estimation Process}, series = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, booktitle = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-424-44768-8}, pages = {221 -- 224}, language = {en} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Dependability and Life Time Enhancement for Nano-Electronic Systems}, series = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, booktitle = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, publisher = {Univ. of Technology, Fac. of Computing, Chair of Control and System Engineering}, address = {Poznan}, isbn = {978-83-62065-02-8}, pages = {61 -- 67}, language = {en} } @inproceedings{KoalScheitSchoelzeletal., author = {Koal, Tobias and Scheit, Daniel and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {On the Feasibility of Built-in Self Repair for Logic Circuits}, series = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-1713-0}, pages = {316 -- 324}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Fine-Grained Software-Based Self Repair of VLIW Processors}, series = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-1713-0}, pages = {41 -- 49}, language = {en} } @inproceedings{GleichnerKoalVierhaus, author = {Gleichner, Christian and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Effective Logic Self Repair Based on Extracted Logic Clusters}, series = {Signal Processing Algorithms, Architectures, Arrangements, and Applications Conference Proceedings (SPA), 2010, Poznan}, booktitle = {Signal Processing Algorithms, Architectures, Arrangements, and Applications Conference Proceedings (SPA), 2010, Poznan}, publisher = {IEEE}, isbn = {978-1-4577-1485-6}, pages = {6}, language = {en} } @inproceedings{MuellerSchoelzel, author = {M{\"u}ller, Sebastian and Sch{\"o}lzel, Mario}, title = {Combining Hardware and Software Based Self Repair Methods for Statically Scheduled Data Paths}, series = {2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), Kyoto, Japan, 6 - 8 October 2010}, booktitle = {2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), Kyoto, Japan, 6 - 8 October 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-424-48447-8}, pages = {90 -- 98}, language = {en} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Selbstreparatur durch Regularisierung von Logik-Strukturen}, series = {Zuverl{\"a}ssigkeit und Entwurf, 3. GMM/GI/ITG-Fachtagung vom 21. bis 23. September 2009 in Stuttgart}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 3. GMM/GI/ITG-Fachtagung vom 21. bis 23. September 2009 in Stuttgart}, isbn = {978-3-8007-3178-7}, pages = {29 -- 36}, language = {de} } @inproceedings{ScheitVierhaus, author = {Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Zentrale und dezentrale Selbstreparatur von Bussen}, series = {Proceedings, EdaWorkshop 09, Dresden (Germany), May 26 - 28, 2009}, booktitle = {Proceedings, EdaWorkshop 09, Dresden (Germany), May 26 - 28, 2009}, publisher = {VDE-Verlag}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3165-7}, pages = {37 -- 42}, language = {de} } @inproceedings{ScheitVierhaus, author = {Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Zentrale und dezentrale Selbstreparatur von Bussen}, abstract = {Tagungsband ITG-GI-GMM- Workshop "Test und Zuverl{\"a}ssigkeit von Schaltungen und Systemen", Bremen, 2009}, language = {de} }