@misc{SchmidMankovicsArguirovetal., author = {Schmid, Reiner P. and Mankovics, Daniel and Arguirov, Tzanimir V. and Ratzke, Markus and Mtchedlidze, T. and Kittler, Martin}, title = {Rapid dislocation-related D1-photoluminescence imaging of multicrystalline Si wafers at room temperature}, series = {Physica Status Solidi : A}, volume = {208}, journal = {Physica Status Solidi : A}, number = {4}, issn = {1610-1642}, doi = {10.1002/pssa.201026269}, pages = {888 -- 892}, language = {en} } @misc{SchmidMankovicsArguirovetal., author = {Schmid, Reiner P. and Mankovics, Daniel and Arguirov, Tzanimir V. and Mtchedlidze, T. and Kittler, Martin}, title = {Novel imaging techniques for dislocation-related D1-photo-luminescence of multicrystalline Si wafers - two different approaches}, language = {en} } @inproceedings{MuthSchmidSchnitzlein, author = {Muth, Marco and Schmid, Reiner P. and Schnitzlein, Klaus}, title = {Specific modifications to enhance sensitivity in null-ellipsometry}, series = {Book of abstracts, 8th Workshop Ellipsometry, March 10 - 12, 2014, Dresden, Germany}, booktitle = {Book of abstracts, 8th Workshop Ellipsometry, March 10 - 12, 2014, Dresden, Germany}, pages = {S. 84}, language = {en} } @misc{WolfframmKoutevaArguirovaArguirovetal., author = {Wolfframm, Dirk and Kouteva-Arguirova, Simona and Arguirov, Tzanimir V. and Schmid, Reiner P. and Dittmar, K. and Zienert, I. and Reif, J{\"u}rgen}, title = {Hafnium oxide on silicon: A non-destructive characterization of the interfacial layer}, series = {Solid State Phenomena}, volume = {95-96}, journal = {Solid State Phenomena}, issn = {1662-9779}, pages = {653 -- 658}, language = {en} } @inproceedings{MuthSchmidSchnitzlein, author = {Muth, Marco and Schmid, Reiner P. and Schnitzlein, Klaus}, title = {Einfache Methode zur Steigerung der Empfindlichkeit in Null-Ellipsometrie}, series = {DPG Fr{\"u}hjahrstagung 2013 in Regensburg}, booktitle = {DPG Fr{\"u}hjahrstagung 2013 in Regensburg}, publisher = {DPG}, address = {Bad Honnef}, language = {de} } @inproceedings{ReifSchneiderSchmidetal., author = {Reif, J{\"u}rgen and Schneider, Thomas and Schmid, Reiner P. and Wolfframm, Dirk}, title = {Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress}, series = {Laser Applications in Microelectronics and Optoelectronic Manufacturing V, 24 - 26 January 2000, San Jose, USA}, booktitle = {Laser Applications in Microelectronics and Optoelectronic Manufacturing V, 24 - 26 January 2000, San Jose, USA}, editor = {Helvajian, Henry}, publisher = {SPIE}, address = {Bellingham, Wash.}, isbn = {0-8194-3550-3}, language = {en} } @inproceedings{ReifSchmid, author = {Reif, J{\"u}rgen and Schmid, Reiner P.}, title = {Efficient instantaneous optical switching, frequency conversion and simple logic operations on a femtosecond time scale}, series = {25th International Congress on High-Speed Photography and Photonics, 29 September - 4 October 2002, Beaune, France}, booktitle = {25th International Congress on High-Speed Photography and Photonics, 29 September - 4 October 2002, Beaune, France}, publisher = {SPIE}, address = {Bellingham, Wash.}, isbn = {0-8194-4744-7}, doi = {10.1117/12.516816}, pages = {137 -- 140}, language = {en} } @article{ReifSchmidSchneideretal., author = {Reif, J{\"u}rgen and Schmid, Reiner P. and Schneider, Thomas and Wolfframm, Dirk}, title = {Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress}, language = {en} }