@misc{KoutevaArguirovaOrlovSeifertetal., author = {Kouteva-Arguirova, Simona and Orlov, Valeri and Seifert, Winfried and Richter, Hans and Reif, J{\"u}rgen}, title = {Residual stress distribution and silicon phase transformation induced by Rockwell indentation at different temperatures, studied by means of micro-Raman spectroscopy}, series = {Solid State Phenomena}, volume = {95-96}, journal = {Solid State Phenomena}, issn = {1662-9779}, pages = {513 -- 518}, language = {en} } @inproceedings{ReifCostacheEckertetal., author = {Reif, J{\"u}rgen and Costache, Florenta Adriana and Eckert, Sebastian and Kouteva-Arguirova, Simona and Bestehorn, Michael and Georgescu, Ionut and Semorek, A. F. and Martin, P. and Gobert, O. and Seifert, Winfried}, title = {Formation of self-organized regular nanostructures upon femtosecond laser ablation}, series = {Fifth International Symposium on Laser Precision Microfabrication, 11 - 14 May, 2004, Nara, Japan}, booktitle = {Fifth International Symposium on Laser Precision Microfabrication, 11 - 14 May, 2004, Nara, Japan}, publisher = {SPIE}, address = {Bellingham, Wash.}, isbn = {0-8194-5623-3}, pages = {S. 737}, language = {en} } @misc{ArguirovSeifertKittleretal., author = {Arguirov, Tzanimir V. and Seifert, Winfried and Kittler, Martin and Reif, J{\"u}rgen}, title = {Temperature behaviour of photoluminescence and electron-beam-induced current recombination behaviour of extended defects in solar grade silicon}, series = {Journal of Physics: Condensed Matter}, volume = {14}, journal = {Journal of Physics: Condensed Matter}, number = {48}, issn = {1361-648X}, pages = {13169 -- 13177}, language = {en} } @misc{PandelovSeifertKittleretal., author = {Pandelov, Stanislaw and Seifert, Winfried and Kittler, Martin and Reif, J{\"u}rgen}, title = {Analysis of local electric properties of grain boundaries in Si by electron-beam-induced-current techniques}, series = {Journal of Physics: Condensed Matter}, volume = {14}, journal = {Journal of Physics: Condensed Matter}, number = {48}, issn = {0953-8984}, pages = {13161 -- 13168}, language = {en} } @misc{KoutevaArguirovaSeifertKittleretal., author = {Kouteva-Arguirova, Simona and Seifert, Winfried and Kittler, Martin and Reif, J{\"u}rgen}, title = {Raman Measurement of Stress Distribution in Multicrystalline Silicon Materials}, series = {Materials Science and Engineering B}, volume = {102}, journal = {Materials Science and Engineering B}, number = {1/3}, issn = {0921-5107}, pages = {37 -- 42}, language = {en} } @inproceedings{KittlerArguirovSchmidetal., author = {Kittler, Martin and Arguirov, Tzanimir V. and Schmid, Reiner P. and Seifert, Winfried}, title = {Photoluminescence and EBIC for Process Control and Failure Analysis in Si-Based Photovoltaics}, series = {ISTFA 2010, conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010}, booktitle = {ISTFA 2010, conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010}, publisher = {ASM International Materials Park}, address = {Texas, USA}, isbn = {978-1-61503-041-5}, pages = {137 -- 142}, language = {en} }