@misc{MaldonadoAcalOrtizetal., author = {Maldonado, D. and Acal, C. and Ortiz, H. and Aguilera, A.M. and Ruiz-Castro, J.E. and Cantudo, A. and Baroni, A. and Dorai Swamy Reddy, K. and Pechmann, S. and Uhlmann, M. and Wenger, Christian and P{\´e}rez, E. and Rold{\´a}n, J.B.}, title = {A comprehensive statistical study of the post-programming conductance drift in HfO2-based memristive devices}, series = {Materials science in semiconductor processing}, volume = {196}, journal = {Materials science in semiconductor processing}, publisher = {Elsevier BV}, address = {Amsterdam}, issn = {1369-8001}, doi = {10.1016/j.mssp.2025.109668}, pages = {1 -- 8}, abstract = {The conductance drift in HfO2-based memristors is a critical reliability concern that impacts in their application in non-volatile memory and neuromorphic computing integrated circuits. In this work we present a comprehensive statistical analysis of the conductance drift behavior in resistive random access memories (RRAM) whose physics is based on valence change mechanisms. We experimentally characterize the conductance time evolution in six different resistance states and analyze the suitability of various probability distributions to model the observed variability. Our results reveal that the log-logistic probability distribution provides the best fit to the experimental data for the resistance multilevels and the measured post-programming times under consideration. Additionally, we employ an analysis of variance (ANOVA) to statistically analyze the post-programming time and current level effects on the observed variability. Finally, in the context of the Stanford compact model, we describe how variability has to be implemented to obtain the probability distribution of measured current values.}, language = {en} } @misc{FuenningPaulManganellietal., author = {F{\"u}nning, Tabea and Paul, Martin and Manganelli, Costanza Lucia and Wenger, Christian and Mai, Andreas and Steglich, Patrick}, title = {Comparative simulation analysis of photonic ultrasound sensors based on silicon waveguides}, series = {Scientific reports}, volume = {15}, journal = {Scientific reports}, number = {1}, publisher = {Springer Science and Business Media LLC}, address = {[London]}, issn = {2045-2322}, doi = {10.1038/s41598-025-01953-9}, pages = {1 -- 13}, abstract = {Pressure sensors based on photonic integrated circuits (PIC) offer the prospect of outstanding sensitivities, extreme miniaturization and have the potential for highly scalable production using CMOS compatible processing. PIC-based pressure sensors detect the change in optical properties, i.e. the intensity or phase of the optical carrier wave inside miniaturized waveguide structures. The detection of ultrasound is achieved by engineering the waveguide architecture such that a pressure causes a high change in the effective refractive index of the waveguide. A range of PIC-based pressure sensors have been reported, but a comparison of the sensitivity of the different approaches is not straightforward, since different pressure sensitive waveguide architectures as well as photonic layouts and measurement setups impact the performance. Additionally, the used sensitivity unit is not uniform throughout the different studies, further complicating a comparison. In this work, a detailed simulation study is carried out by finite element modeling of different pressure sensitive waveguide architectures for a consistent comparison. We analyze three different sensor architectures: (A) a free standing membrane located within a tiny air gap above the waveguide, (B) a waveguide located on top of a deflectable membrane as well as (C) a waveguide embedded inside a pressure-sensitive polymer cladding. The mechanical response of the structures and the resulting changes in mode propagation, i.e. the change of the effective refractive index, are analyzed. The waveguide sensitivities in RIU/MPa for different waveguide types (strip, slot) and polarization states (TE, TM) are compared. The results reveal inherent limitations of the different waveguide designs and create a basis for the selection of suitable designs for further ultrasound sensor development. Possibilities for enhancing waveguide sensitivity are identified and discussed. Additionally, we have shown that the studied approaches are extensible to SiN waveguides.}, language = {en} } @misc{UhlmannKrysikWenetal., author = {Uhlmann, Max and Krysik, Milosz and Wen, Jianan and Frohberg, Max and Baroni, Andrea and Reddy, Keerthi Dorai Swamy and P{\´e}rez, Eduardo and Ostrovskyy, Philip and Piotrowski, Krzysztof and Carta, Corrado and Wenger, Christian and Kahmen, Gerhard}, title = {A compact one-transistor-multiple-RRAM characterization platform}, series = {IEEE transactions on circuits and systems I : regular papers}, journal = {IEEE transactions on circuits and systems I : regular papers}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, address = {New York}, issn = {1549-8328}, doi = {10.1109/TCSI.2025.3555234}, pages = {1 -- 12}, abstract = {Emerging non-volatile memories (eNVMs) such as resistive random-access memory (RRAM) offer an alternative solution compared to standard CMOS technologies for implementation of in-memory computing (IMC) units used in artificial neural network (ANN) applications. Existing measurement equipment for device characterisation and programming of such eNVMs are usually bulky and expensive. In this work, we present a compact size characterization platform for RRAM devices, including a custom programming unit IC that occupies less than 1 mm2 of silicon area. Our platform is capable of testing one-transistor-one-RRAM (1T1R) as well as one-transistor-multiple-RRAM (1TNR) cells. Thus, to the best knowledge of the authors, this is the first demonstration of an integrated programming interface for 1TNR cells. The 1T2R IMC cells were fabricated in the IHP's 130 nm BiCMOS technology and, in combination with other parts of the platform, are able to provide more synaptic weight resolution for ANN model applications while simultaneously decreasing the energy consumption by 50 \%. The platform can generate programming voltage pulses with a 3.3 mV accuracy. Using the incremental step pulse with verify algorithm (ISPVA) we achieve 5 non-overlapping resistive states per 1T1R device. Based on those 1T1R base states we measure 15 resulting state combinations in the 1T2R cells.}, language = {en} } @misc{DubeyRajuLukoseetal., author = {Dubey, Pawan Kumar and Raju, Ashraful Islam and Lukose, Rasuole and Wenger, Christian and Lukosius, Mindaugas}, title = {Optimizing graphene ring modulators : a comparative study of straight, bent, and racetrack geometries}, series = {Nanomaterials}, volume = {15}, journal = {Nanomaterials}, number = {15}, publisher = {MDPI AG}, address = {Basel}, issn = {2079-4991}, doi = {10.3390/nano15151158}, pages = {1 -- 17}, abstract = {Graphene-based micro-ring modulators are promising candidates for next-generation optical interconnects, offering compact footprints, broadband operation, and CMOS compatibility. However, most demonstrations to date have relied on conventional straight bus coupling geometries, which limit design flexibility and require extremely small coupling gaps to reach critical coupling. This work presents a comprehensive comparative analysis of straight, bent, and racetrack bus geometries in graphene-on-silicon nitride (Si₃N₄) micro-ring modulators operating near 1.31 µm. Based on finite-difference time-domain simulation results, a proposed racetrack-based modulator structure demonstrates that extending the coupling region enables critical coupling at larger gaps—up to 300 nm—while preserving high modulation efficiency. With only 6-12\% graphene coverage, this geometry achieves extinction ratios of up to 28 dB and supports electrical bandwidths approaching 90 GHz. Findings from this work highlight a new co-design framework for coupling geometry and graphene coverage, offering a pathway to high-speed and high-modulation-depth graphene photonic modulators suitable for scalable integration in next-generation photonic interconnects devices.}, language = {en} } @misc{WenBaroniUhlmannetal., author = {Wen, Jianan and Baroni, Andrea and Uhlmann, Max and Perez, Eduardo and Wenger, Christian and Krstic, Milos}, title = {ReFFT : an energy-efficient RRAM-based FFT accelerator}, series = {IEEE transactions on computer-aided design of integrated circuits and systems}, journal = {IEEE transactions on computer-aided design of integrated circuits and systems}, publisher = {IEEE}, address = {Piscataway, NJ}, issn = {0278-0070}, doi = {10.1109/TCAD.2025.3627146}, pages = {1 -- 14}, abstract = {The fast Fourier transform (FFT) is a highly efficient algorithm for computing the discrete Fourier transform (DFT). It is widely employed in various applications, including digital communication, image processing, and signal analysis. Recently, in-memory computing architectures based on emerging technologies, such as resistive RAM (RRAM), have demonstrated promising performance with low hardware cost for data-intensive applications. However, directly mapping FFT onto RRAM crossbars is challenging because the algorithm relies on many small, sequential butterfly operations, while cross-bars are optimized for large-scale, highly parallel vector-matrix multiplications (VMMs). In this paper, we introduce ReFFT, a system architecture that reformulates FFT computations for efficient execution on RRAM crossbars. ReFFT combines the reduced computational complexity of FFT with the parallel VMM capability of RRAM. We incorporate measured device data into our framework to analyze the effect of variability and develop an adaptive mapping scheme that improves twiddle-factor programming accuracy, leading to a 9.9 dB peak signal-to-noise ratio (PSNR) improvement for a 256-point FFT. Compared with prior RRAM-based DFT designs, ReFFT achieves up to 4.6× and 19.5× higher energy efficiency for 256- and 2048-point FFTs, respectively. The system is further validated in digital communication and satellite image compression tasks.}, language = {en} } @misc{SchlipfCutoloManganellietal., author = {Schlipf, Jon and Cutolo, Maria Alessandra and Manganelli, Costanza Lucia and Reiter, Sebastian and Seibold, G{\"o}tz and Skibitzki, Oliver and Wenger, Christian and Fischer, Inga Anita}, title = {Fabrication and optical characterization of CMOS-compatible honeycomb-like large-scale lattices of near-field coupled plasmonic TiN nanotriangles}, series = {Advanced optical materials}, volume = {2025}, journal = {Advanced optical materials}, publisher = {Wiley-VCH}, address = {Weinheim}, issn = {2195-1071}, doi = {10.1002/adom.202403408}, pages = {1 -- 8}, abstract = {Honeycomb-like plasmonic titanium nitride nanotriangle arrays defined by photolithography and fabricated in a modified silicon-germanium electronic-photonic integrated circuit process in a state-of-the-art pilot line. The nanotriangle arrays are characterized in experiments and simulations. The momentum-dependent reflectance spectra exhibit not only features that are consistent with surface lattice resonances in the honeycomb lattice but also minima governed by near-field coupling of the individual nanotriangles. The optical characterization results in combination with simulation-based predictions indicate that such nanotriangle arrays are capable of supporting collective plasmonic resonances that can be described as massless Dirac particles. The fabrication approach opens up the possibility of integrating the structures into device fabrication processes, and avenues toward near-infrared sensing and communication applications are predicted.}, language = {en} }