@inproceedings{SchoelzelSkoncejVater, author = {Sch{\"o}lzel, Mario and Skoncej, Patryk and Vater, Frank}, title = {On the Feasibility of Handling Manufacturing Faults in Embedded Memories by Software Means}, series = {IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM)}, booktitle = {IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM)}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6972-2}, pages = {6}, language = {en} } @inproceedings{SchoelzelSkoncejVater, author = {Sch{\"o}lzel, Mario and Skoncej, Patryk and Vater, Frank}, title = {Software-based Repair for Memories in Tiny Embedded Systems}, series = {20th IEEE European Test Symposium (ETS), 25-29 May, Cluj-Napoca, Romania 2015}, booktitle = {20th IEEE European Test Symposium (ETS), 25-29 May, Cluj-Napoca, Romania 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-7603-4}, pages = {2}, language = {en} }