@inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors}, series = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, booktitle = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, isbn = {978-1-4244-9755-3}, pages = {143 -- 146}, abstract = {Tagungsbeitrag DDECS 2011, Cottbus}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hiararchical Built-In SElf Test with On-Chip Diagnosis for VLIW Processors}, abstract = {Tagungsbeitrag 23. ITG-Tagung "Test und Zuverl{\"a}ssigeit von Schaltungen und Systemen", Passau, 2011}, language = {en} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {Logic Self Repair Architecture with Self Test Capabilities}, series = {Zuverl{\"a}ssigkeit und Entwurf, 6. GMM/GI/ITG-Fachtagung vom 25. bis 27. September 2012 in Bremen}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 6. GMM/GI/ITG-Fachtagung vom 25. bis 27. September 2012 in Bremen}, editor = {Drechsler, Rolf}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3445-0}, language = {en} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {Selbstreparatur f{\"u}r Logik-Baugruppen mit erweiterten F{\"a}higkeiten f{\"u}r die Kompensation von Fertigungsfehlern und Fr{\"u}hausf{\"a}llen}, series = {Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband}, booktitle = {Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband}, publisher = {Fraunhofer IIS, Institutsteil EAS [u.a.]}, address = {Dresden}, isbn = {978-3-8396-0404-5}, language = {de} } @inproceedings{UlbrichtKoalVierhaus, author = {Ulbricht, Markus and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Activity Migration in M-of-N-Systems by Means of Loading-Balancing}, series = {15th Euromicro Conference on Digital Systems Design (DSD), September 2012}, booktitle = {15th Euromicro Conference on Digital Systems Design (DSD), September 2012}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-4673-2498-4}, pages = {258 -- 263}, language = {en} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {On the Feasibility of Combining On-Line-Test and Self Repair for Logic Circuits}, series = {16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2013), Karlovny Vary, April 2013}, booktitle = {16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2013), Karlovny Vary, April 2013}, editor = {Sekanina, Lukas}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-6135-4}, language = {en} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {On-Line-Test, Fehlerkorrektur znd Selbstreparatur mit Time-Shared TMR}, series = {Tagungsband Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), April 2013}, booktitle = {Tagungsband Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), April 2013}, editor = {Dietrich, Manfred}, publisher = {Fraunhofer-Verl.}, address = {Stuttgart}, isbn = {978-3-8396-0545-5}, language = {de} } @inproceedings{KoalUlbrichtVierhaus, author = {Koal, Tobias and Ulbricht, Markus and Vierhaus, Heinrich Theodor}, title = {Virtual TMR Schemes Combining Fault Tolerance and Self Repair}, series = {16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 Sep 2013, Santander, Spain}, booktitle = {16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 Sep 2013, Santander, Spain}, publisher = {IEEE}, isbn = {978-0-7695-5074-9}, pages = {235 -- 242}, language = {en} } @inproceedings{KoalUlbrichtVierhaus, author = {Koal, Tobias and Ulbricht, Markus and Vierhaus, Heinrich Theodor}, title = {Combining On-Line Fault Detection and Logic Self Repair}, series = {IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012}, booktitle = {IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012}, editor = {Raik, Jaan}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-1185-4}, pages = {288 -- 293}, language = {en} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {Kombinierte On-Line-Fehlerkompensation und Selbstreparatur f{\"u}r Logik-Baugruppen}, series = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 25. GI/GMM/ITG-Workshop, 24. bis 26. Februar 2013, Dresden}, booktitle = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 25. GI/GMM/ITG-Workshop, 24. bis 26. Februar 2013, Dresden}, publisher = {Fraunhofer-Institut}, address = {Dresden}, language = {de} }