@misc{ReifSchneiderWolfframmetal., author = {Reif, J{\"u}rgen and Schneider, Thomas and Wolfframm, Dirk and Schmid, Reiner P.}, title = {Femtosecond nonlinear optical characterisation of silicon wafers: the role of symmetry}, series = {Materials Science in Semiconductor Processing}, volume = {4}, journal = {Materials Science in Semiconductor Processing}, number = {1-3}, issn = {1369-8001}, doi = {10.1016/S1369-8001(00)00166-9}, pages = {241 -- 243}, language = {en} } @inproceedings{SchmidSchneiderReif, author = {Schmid, Reiner P. and Schneider, Thomas and Reif, J{\"u}rgen}, title = {Ultrafast transient grating in Barium Fluoride efficient instantaneous optical switching, and frequency conversion on a femtosecond time scale}, series = {Bragg gratings, photosensitivity and poling in glass waveguides, postconference digest, Stresa, Italy, July 4 - 6, 2001}, booktitle = {Bragg gratings, photosensitivity and poling in glass waveguides, postconference digest, Stresa, Italy, July 4 - 6, 2001}, publisher = {OSA}, address = {Washington, DC}, isbn = {1-557-52681-8}, language = {en} } @misc{SchneiderReif, author = {Schneider, Thomas and Reif, J{\"u}rgen}, title = {Influence of an ultrafast refractive index grating on nonlinear optical phenomena}, series = {Physical Review A}, volume = {65}, journal = {Physical Review A}, number = {2}, issn = {1094-1622}, pages = {023801}, language = {en} } @inproceedings{SchmidSchneiderReif, author = {Schmid, Reiner P. and Schneider, Thomas and Reif, J{\"u}rgen}, title = {Ultrafast Transient Grating in Barium Fluoride Efficient Instantaneous Optical Switching, Frequency Conversion and Simple Logic Operations on a Femtosecond Time Scale}, series = {Ultrafast electronics and optoelectronics, January 10 - 12, 2001, Lake Tahoe, Nevada, proceedings volume}, booktitle = {Ultrafast electronics and optoelectronics, January 10 - 12, 2001, Lake Tahoe, Nevada, proceedings volume}, editor = {Chen, K. and Rodwell, Mark and Knox, Wayne}, publisher = {OSA}, address = {Washington, DC}, isbn = {1-55752-606-0}, pages = {111 -- 112}, language = {en} } @misc{ReifSchmidSchneider, author = {Reif, J{\"u}rgen and Schmid, Reiner P. and Schneider, Thomas}, title = {Femtosecond Third Harmonic Generation: Self Phase Matching through a Transient Kerr Grating and the Way to Ultrafast Computing}, series = {Applied Physics B}, volume = {74}, journal = {Applied Physics B}, number = {7}, issn = {0946-2171}, doi = {10.1007/s003400200847}, pages = {745 -- 748}, language = {en} } @misc{SchneiderWolfframmMitzneretal., author = {Schneider, Thomas and Wolfframm, Dirk and Mitzner, Rolf and Reif, J{\"u}rgen}, title = {Ultrafast optical switching by instantaneous laser-induced grating formation and self-diffraction in barium flouride}, series = {Applied Physics B}, volume = {68}, journal = {Applied Physics B}, number = {4}, issn = {0946-2171}, pages = {749 -- 751}, language = {en} } @misc{SchneiderWolfframmReif, author = {Schneider, Thomas and Wolfframm, Dirk and Reif, J{\"u}rgen}, title = {Ultrafast optical switching by instantaneous laser-induced grating formation and self-diffraction in barium flouride}, series = {Physica status solidi (a)}, volume = {175}, journal = {Physica status solidi (a)}, number = {1}, issn = {0031-8965}, pages = {177 -- 182}, language = {en} } @misc{SchmidSchneiderReif, author = {Schmid, Reiner P. and Schneider, Thomas and Reif, J{\"u}rgen}, title = {Femtosecond All-optical Wavelength and Time Demultiplexer for OTDM/WDM Systems}, series = {Applied Physics B}, volume = {74}, journal = {Applied Physics B}, number = {Suppl. 1}, issn = {0946-2171}, doi = {10.1007/s00340-002-0876-x}, pages = {205 -- 208}, language = {en} } @misc{ReifSchneiderWolfframmetal., author = {Reif, J{\"u}rgen and Schneider, Thomas and Wolfframm, Dirk and Schmid, Reiner P.}, title = {Femtosecond nonlinear optical characterization of silicon wafers: the role of symmetry}, series = {Materials Science in Semiconductor Processing}, volume = {4}, journal = {Materials Science in Semiconductor Processing}, number = {1-3}, issn = {1369-8001}, pages = {241 -- 243}, language = {en} } @misc{ReifSchmidSchneideretal., author = {Reif, J{\"u}rgen and Schmid, Reiner P. and Schneider, Thomas and Wolfframm, Dirk}, title = {Nonlinear Characterization of the Surface of Silicon Wafers: In-situ Detection of External Stress}, series = {Solid State Electronics 44}, volume = {44}, journal = {Solid State Electronics 44}, number = {5}, issn = {0038-1101}, pages = {809 -- 813}, language = {en} }