@article{AppelYfantisGoepeletal., author = {Appel, G{\"u}nter and Yfantis, Alexandros D. and G{\"o}pel, W. and Schmeißer, Dieter}, title = {Highly conductive polypyrrole films on nonconductive substrates}, language = {en} } @inproceedings{GehrlichOhsiekKleinetal., author = {Gehrlich, Lukas and Ohsiek, Susanne and Klein, C. and Geiß, M. and Friedemann, Michael and K{\"u}cher, Peter and Schmeißer, Dieter}, title = {Ultrathin TaN/Ta barrier modifications to fullfill next technology node requirements}, series = {2011 IEEE International Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM 2011), Dresden, Germany, 8 - 12 May 2011}, booktitle = {2011 IEEE International Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM 2011), Dresden, Germany, 8 - 12 May 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-0503-8}, doi = {10.1109/IITC.2011.5940322}, pages = {82 -- 84}, language = {en} } @misc{FriedrichHenkelRichteretal., author = {Friedrich, Daniel and Henkel, Karsten and Richter, Matthias and Schmeißer, Dieter}, title = {Fullerenol as probed by Synchrotron X-Ray Photoemission and Absorption Spectroscopy}, language = {en} } @article{BatchelorFollathMikaloetal., author = {Batchelor, David R. and Follath, Rolf and Mikalo, Ricardo Pablo and Hoffmann, Patrick and Schmeißer, Dieter}, title = {Commissioning Results of the BTUC-PGM beamline}, language = {en} } @misc{KolanekTallaridaMichlingetal., author = {Kolanek, Krzysztof and Tallarida, Massimo and Michling, Marcel and Schmeißer, Dieter}, title = {In situ study of the atomic layer deposition of HfO2 on Si}, series = {Journal of Vacuum Science and Technology}, journal = {Journal of Vacuum Science and Technology}, number = {A 30}, issn = {0734-2101}, pages = {01A143-1 -- 01A143-15}, language = {en} } @inproceedings{MandalHenkelSchmeisser, author = {Mandal, Dipankar and Henkel, Karsten and Schmeißer, Dieter}, title = {Control of the Crystalline Polymorph, Molecular Dipole and Chain Orientations in P(VDF-HFP) for High Electrical Energy Storage Application}, series = {International Conference on Nanoscience, Technology and Societal Implications (NSTSI), 2011}, booktitle = {International Conference on Nanoscience, Technology and Societal Implications (NSTSI), 2011}, publisher = {IEEE}, isbn = {978-1-4577-2035-2}, doi = {10.1109/NSTSI.2011.6111801}, language = {en} } @misc{KlocekHenkelKolaneketal., author = {Klocek, Jolanta and Henkel, Karsten and Kolanek, Krzysztof and Broczkowska, K. and Schmeißer, Dieter and Miller, M. and Zschech, Ehrenfried}, title = {Studies of the chemical and electrical properties of fullerene and 3-aminopropyltrimethoxysilane based low-k materials}, series = {Thin Solid Films}, volume = {520}, journal = {Thin Solid Films}, number = {7}, issn = {0040-6090}, pages = {2498 -- 2504}, language = {en} } @misc{MandalHenkelSchmeisser, author = {Mandal, Dipankar and Henkel, Karsten and Schmeißer, Dieter}, title = {The electroactive Beta-phase formation in Poly(vinylidene fluoride) by gold nanoparticles doping}, series = {Materials Letters}, journal = {Materials Letters}, number = {73}, issn = {0167-577X}, pages = {123 -- 125}, language = {en} } @misc{KlocekHenkelKolaneketal., author = {Klocek, Jolanta and Henkel, Karsten and Kolanek, Krzysztof and Zschech, Ehrenfried and Schmeißer, Dieter}, title = {Annealing influence on siloxane based materials incorporated with fullerenes, phthalocyanines and silsesquioxanes}, series = {BioNanoScience}, volume = {2}, journal = {BioNanoScience}, number = {1}, issn = {2191-1630}, pages = {52 -- 58}, language = {en} } @misc{MuellerRichterPhilipetal., author = {M{\"u}ller, Klaus and Richter, Matthias and Philip, Shine and Kunst, Manuel and Schmeißer, Dieter}, title = {Excited states in P3HT and P3HT/PCBM blends}, series = {BioNanoScience}, volume = {2}, journal = {BioNanoScience}, number = {1}, issn = {2191-1630}, pages = {42 -- 51}, language = {en} } @misc{RichterFriedrichSchmeisser, author = {Richter, Matthias and Friedrich, Daniel and Schmeißer, Dieter}, title = {Valence and Conduction band states of PCBM as probed by photoelectron spectroscopy at resonant excitation}, series = {BioNanoScience}, volume = {2}, journal = {BioNanoScience}, number = {1}, issn = {2191-1630}, pages = {59 -- 65}, language = {en} } @misc{KlocekKolanekSchmeisser, author = {Klocek, Jolanta and Kolanek, Krzysztof and Schmeißer, Dieter}, title = {Spectroscopic and atomic force microscopy investigations of hybrid materials composed of fullerenes and 3-aminopropyltrimethoxysilane}, series = {Journal of Physics and Chemistry of Solids}, volume = {73}, journal = {Journal of Physics and Chemistry of Solids}, number = {5}, issn = {0022-3697}, pages = {699 -- 706}, language = {en} } @misc{KlocekHenkelKolaneketal., author = {Klocek, Jolanta and Henkel, Karsten and Kolanek, Krzysztof and Zschech, Ehrenfried and Schmeißer, Dieter}, title = {Spectroscopic and capacitance-voltage characterization of thin aminopropylmethoxysilane films doped with copper phthalocyanine, tris(dimethylvinylsilyloxy)-POSS and fullerene cages}, series = {Applied surface science}, volume = {258}, journal = {Applied surface science}, number = {10}, issn = {0169-4332}, pages = {4213 -- 4221}, language = {en} } @misc{MichlingSchmeisser, author = {Michling, Marcel and Schmeißer, Dieter}, title = {Resonant Photoemission at the O1s threshold to characterize β-Ga2O 3 single crystals}, series = {IOP Conference Series: Materials Science and Engineering}, journal = {IOP Conference Series: Materials Science and Engineering}, number = {34}, issn = {1757-8981}, doi = {10.1088/1757-899X/34/1/012002}, pages = {012002}, abstract = {We report on spectroscopic investigations on β-Ga2O3single crystals. We focus on the detailed analysis of the O1s resonance profile by resonant photoelectron spectroscopy. We analyze the electronic structure and assign the O2p to build the valence band and both, O2p and Ga4s4p states to contribute to the conduction band. We determine the partial density of states for the valence and conduction bands and find a strong hybridization of O2p and Ga4s states. This is deduced from constant final state spectra on the O-KLL-Auger over the O K-edge and Ga L2,3-edge and a comparison to the corresponding X-ray absorption spectroscopy data. We also identify several types of defects. A broad band of oxygen derived defects is identified that extends through-out the gap. Small polarons are attributed to cause an anti-resonance in the valence states around the O1s threshold. In addition, a separate Auger decay at resonance indicates the existence of localized charge transfer states which involves localized Ga4sp states.}, language = {en} } @misc{MuellerRichterFriedrichetal., author = {M{\"u}ller, Klaus and Richter, Matthias and Friedrich, Daniel and Paloumpa, Ioanna and Kramm, Ulrike Ingrid and Schmeißer, Dieter}, title = {Spectroscopic characterization of Cobalt-Phthalocyanine electrocatalysts for fuel cell applications}, series = {Solid State Ionics}, journal = {Solid State Ionics}, number = {216}, issn = {1872-7689}, doi = {10.1016/j.ssi.2011.12.013}, pages = {78 -- 82}, abstract = {For polymer-electrolyte-membrane fuel cells (PEM-FC), platinumcatalysts on carbon based substrates are state of the art, due to high electrochemical activity and chemical stability in acid electrolytes. High costs of platinum force investigations of alternative catalysts. With respect to the oxygen reduction reaction, possible candidates are transition metal (TM) complexes like TM-porphyrines or TM-phthalocyanines. Pyrolysis on carbon based substrates improves the catalytic activity. Highest activities were found for Fe or Co as transition metal centers. We present results of the pyrolysis of Co-phthalocyanine (CoPc) on carbon black. Besides an investigation of morphology by scanning electron microscopy (SEM) and chemical composition by energy dispersive X-ray spectroscopy (EDX) and X-ray photoelectron spectroscopy (XPS) during pyrolysis, we present a near edge X-ray absorption fine structure (NEXAFS) study of the chemical composition for the related annealing steps. This investigation is accompanied by an electrochemical characterization of the catalytic activity and selectivity. The XPS and NEXAFS data indicate a decomposition of the CoN4(chelate-) complex during pyrolysis. The N1s data for 800 °C show graphite-like, formally pyrrolic and pyridinic like features, without any significant contri-bution of Co. The Co2p data for both, XPS and NEXAFS are dominated by CoO/Co2O3. It can be concluded that during the pyrolysis cobalt particles are formed by the disintegration of CoN4-centers, after pyrolysis these par-ticles become oxidized upon contact with air.}, language = {en} } @misc{KolanekTallaridaSchmeisser, author = {Kolanek, Krzysztof and Tallarida, Massimo and Schmeißer, Dieter}, title = {Height distribution of atomic force microscopy images as a tool for atomic layer deposition characterization}, series = {Journal of Vacuum Science and Technology : A}, volume = {31}, journal = {Journal of Vacuum Science and Technology : A}, number = {1}, doi = {10.1116/1.4754557}, pages = {01A104-1 -- 01A104-9}, abstract = {The authors propose the analysis of surface height histograms as a tool for the atomic layer deposition (ALD) growth characterization in the initial stage of the process. ALD of HfO2 on a Si(100)/SiO2 substrate was investigated in situ by ultra high vacuum atomic force microscope working in noncontact mode. The ALD cycles, made by using tetrakis-di-methyl-amido-Hf and H2O as precursors, were performed at 230 C. After each ALD cycle, the relation between the film growth and the root mean square surface roughness was studied. Parameters equivalent to HfO2 layer thickness, coverage, and surface roughness of the substrate and deposited material can be calculated in the proposed routine.}, language = {en} } @misc{KlocekKolanekHenkeletal., author = {Klocek, Jolanta and Kolanek, Krzysztof and Henkel, Karsten and Zschech, Ehrenfried and Schmeißer, Dieter}, title = {Influence of the fullerene derivatives and cage polyhedral oligomeric silsesquioxanes on 3-aminopropyltrimethoxysilane based hybrid nanocomposites chemical, morphological and electrical properties}, series = {Journal of Physics and Chemistry of Solids}, volume = {74}, journal = {Journal of Physics and Chemistry of Solids}, number = {1}, issn = {0022-3697}, doi = {10.1016/j.jpcs.2012.08.013}, pages = {135 -- 145}, abstract = {In this study we produced 3-aminopropyltrimethoxysilane based hybrid nanocomposites using fullerene derivative [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) as nanodopants. Additionally, we modified obtained material with incompletely condensed cage polyhedral oligomeric silsesqiuox-anes (POSS) in order to improve its properties. Thin films were deposited by means of the spin-coating method. The films were characterized by atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and capacitance-voltage (CV) measurements. We observed that a properly chosen PCBM concentration may be a crucial factor to obtain high quality APTMS based films by the spin-coating technique. XPS revealed the presence of the C-NH-C species within POSS containing films indicating chemical interaction between the amino group of APTMS and the POSS molecules. AFM results suggest that at high POSS monomer concentration in the range of 1\% the creation of fractal-shaped aggregates takes place. The CV characterization of the samples exhibits a decrease of the APTMS based films dielectric constant due to the POSS and PCBM contribution. The combination of the applied methods delivers complementary information concerning the properties of the analyzed films.}, language = {en} } @misc{KukliDimriTammetal., author = {Kukli, Kaupo and Dimri, Mukesh Chandra and Tamm, Aile and Kemell, Marianna and K{\"a}{\"a}mbre, Tanel and Vehkam{\"a}ki, Marko and Puttaswamy, Manjunath and Stern, Raivo and Kuusik, Ivar and Kikas, Arvo and Tallarida, Massimo and Schmeißer, Dieter and Ritala, Mikko and Leskel{\"a}, Markku}, title = {Structural and Magnetic Studies on Iron Oxide and Iron-Magnesium Oxide Thin Films Deposited Using Ferrocene and (Dimethylaminomethyl)ferrocene Precursors}, series = {ECS Journal of Solid State Science and Technology}, volume = {2}, journal = {ECS Journal of Solid State Science and Technology}, number = {3}, issn = {2162-8769}, doi = {10.1149/2.004303jss}, pages = {N45 -- N54}, abstract = {Iron oxide and magnesium-doped iron oxide films were grown by atomic layer deposition in the temperature range of 350-500 ◦C from ferrocene, (dimethylaminomethyl)ferrocene, magnesiumβ-diketonate, and ozone. Phase composition of the films depended on the deposition temperature, as magnetite and/or maghemite tended to form instead of hematite upon lowering the temperature. Iron oxide layers were also mixed with magnesium oxide by alternate deposition of MgO and Fe2O3 which also favored the formation of magnetite or maghemite structure prior to hematite. Scanning electron microscopy implied the smoothening of the films after doping with magnesium oxide. Magnetometry was used to study the effects of temperature and doping levels on the magnetic properties of the films.}, language = {en} } @misc{PopoviciDelabieAdelmannetal., author = {Popovici, Mihaela and Delabie, Annelies and Adelmann, Christoph and Meersschaut, Johan and Franquet, Alexis and Tallarida, Massimo and Berg, Jaap van den and Richard, Olivier and Swerts, Johan and Tomida, Kazuyuki and Kim, Min-Soo and Tielens, Hilde and Bender, Hugo and Conard, Thierry and Jurczak, Malgorzata and Elshocht, Sven van and Schmeißer, Dieter}, title = {Understanding the Interface Reactions of Rutile TiO2 Grown by Atomic Layer Deposition on Oxidized Ruthenium}, series = {ECS Journal of Solid State Science and Technology}, volume = {2}, journal = {ECS Journal of Solid State Science and Technology}, number = {1}, issn = {2162-8769}, doi = {10.1149/2.035301jss}, pages = {N23 -- N27}, abstract = {The atomic layer deposition of titanium oxide TiO2 on ruthenium and oxidized ruthenium with titanium methoxide as metal precursor and H2O and O3 as oxidant was investigated by Rutherford backscattering (RBS) and time of flight secondary ion mass spectrometry (TOFSIMS). An ultra-thin layer of TiO2 deposited a priori with H2O plays the role of protection of Ru(Ox) substrates against etching by O3. Information about thin films (∼3 nm) interfacial reactions, thickness and structure was brought by Medium Energy Ion Scattering Spectroscopy (MEIS) and X-ray absorption spectroscopy (XAS) measurements. The growth enhancements observed in the first stages of the deposition depends on the pre-treatment (pre-oxidation, H2O based interlayer thickness) of the Ru substrate. Thick films (∼14 nm) were analyzed by transmission electron microscopy (TEM) and X-ray diffraction (XRD). The as deposited TiO2 films are crystalline with rutile structure, as resulted from structural analyzes. However, the presence of small amounts of anatase was detected by soft X-ray absorption spectroscopy (XAS) and is strongly influenced by the surface pre-treatment of the Ru substrate. The electrical properties (equivalent oxide thickness and leakage current density) correlate with a different rutile/anatase ratio present in the films.}, language = {en} } @misc{FischerRohrbeckWehneretal., author = {Fischer, Christian B. and Rohrbeck, Magdalena and Wehner, Stefan and Richter, Matthias and Schmeißer, Dieter}, title = {Interlayer formation of diamond-like carbon coatings on industrial polyethylene: Thickness dependent surface characterization by SEM, AFM and NEXAFS}, series = {Applied Surface Science}, journal = {Applied Surface Science}, number = {271}, issn = {0169-4332}, doi = {10.1016/j.apsusc.2013.01.210}, pages = {381 -- 389}, abstract = {The coating of materials with diamond-like carbon (DLC) is a very common way to change and improve their basic characteristics. Although DLC is used on several substrates, the chemical and physical properties throughout the coating process on plastics are yet sparsely investigated. Two types of protective coatings one sp3-enriched (robust, r-type) and one with more sp2-centers (flexible, f-type) have been realized on polyethylene by PECVD deposition. SEM and AFM analysis of coated samples of DLC types revealed diverse surface topographies on different scales and images appeared even differently smoothed by the carbonaceous deposits. Grains of both DLC types are platelet-shaped and nearly double in size for the robust type indicating fundamental differences in the epitaxial DLC growth. NEXAFS spectroscopy showed significant details of carbon centers in chemically different neighborhood displaying a characteristic fingerprint behavior. Comparison of deposition models revealed a mechanism of interlayer formation which is discussed in detail. Interlayer formation is clearly the appropriate explanation of the process for the current carbon deposition between these two unequal materials. An improved understanding of hard DLC and soft polyethylene assembly is given in the presented work.}, language = {en} } @misc{RichterPaloumpaFriedrichetal., author = {Richter, Matthias and Paloumpa, Ioanna and Friedrich, Daniel and Schmeißer, Dieter}, title = {Multiple Auger Decay At Resonant Photo-Excitation In Carbon Thin Films}, series = {ECS Transactions}, volume = {50}, journal = {ECS Transactions}, number = {20}, doi = {10.1149/05020.0009ecst}, pages = {9 -- 21}, abstract = {We use resonant photoemission at the C1s edge to study the electronic structure of HOPG, graphene flakes and monolayer graphene. We find remarkable differences in the profile of the Auger decay channels, which we attribute to an additional multiple-Auger with a three-hole final state. A prerequisite for the appearance of this decay mechanism is the existence of localized excitonic states, which cause the appearance of the multiple Auger decay. We use those effects to identify the existence and the quantity of such defect states within the π*-band regime in carbon thin films, because the intensity of the three-hole Auger decay is varying with the defect density of the carbon films. We find that the appearance of the multiple Auger decay is different for multilayer and monolayer graphene. In particular the interaction of impurities leads to broadening of the C1s core levels. The three-hole Auger decay spectroscopy is a new method to detect such contaminations with a high sensitivity.}, language = {en} }