@inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors}, series = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, booktitle = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, isbn = {978-1-4244-9755-3}, pages = {143 -- 146}, abstract = {Tagungsbeitrag DDECS 2011, Cottbus}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hiararchical Built-In SElf Test with On-Chip Diagnosis for VLIW Processors}, abstract = {Tagungsbeitrag 23. ITG-Tagung "Test und Zuverl{\"a}ssigeit von Schaltungen und Systemen", Passau, 2011}, language = {en} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Dependability and Life Time Enhancement for Nano-Electronic Systems}, series = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, booktitle = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, publisher = {Univ. of Technology, Fac. of Computing, Chair of Control and System Engineering}, address = {Poznan}, isbn = {978-83-62065-02-8}, pages = {61 -- 67}, language = {en} } @inproceedings{KoalScheitSchoelzeletal., author = {Koal, Tobias and Scheit, Daniel and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {On the Feasibility of Built-in Self Repair for Logic Circuits}, series = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-1713-0}, pages = {316 -- 324}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Fine-Grained Software-Based Self Repair of VLIW Processors}, series = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-1713-0}, pages = {41 -- 49}, language = {en} } @inproceedings{MuellerSchoelzel, author = {M{\"u}ller, Sebastian and Sch{\"o}lzel, Mario}, title = {Combining Hardware and Software Based Self Repair Methods for Statically Scheduled Data Paths}, series = {2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), Kyoto, Japan, 6 - 8 October 2010}, booktitle = {2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), Kyoto, Japan, 6 - 8 October 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-424-48447-8}, pages = {90 -- 98}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Reduced Triple Modular Redundancy for Built-in Self Repair in VLIW Processors}, abstract = {Tagungsbeitrag IEEE SPA 2007, Poznan}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Ein hybrides Selbsttest- und Reparaturkonzept f{\"u}r VLIW-Prozessoren}, abstract = {Tagungsbeitrag 20. ITG-GI-GMM-Workshop "Zuverl{\"a}ssiglkeit und Entwurf", Wien, Februar 2008}, language = {de} }