@inproceedings{KittlerArguirovSeifertetal., author = {Kittler, Martin and Arguirov, Tzanimir V. and Seifert, Winfried and Yu, Xuegong and Reiche, Manfred}, title = {Dislocation engineering for a Si-based light emitter at 1.5 μm}, series = {Technical digest, IEDM, IEEE International Electron Devices Meeting 2005, Washington, DC, December 5 - 7, 2005}, booktitle = {Technical digest, IEDM, IEEE International Electron Devices Meeting 2005, Washington, DC, December 5 - 7, 2005}, publisher = {IEEE Operations Center}, address = {Piscataway, NJ}, isbn = {0-7803-9268-X}, pages = {1005 -- 1008}, language = {en} } @inproceedings{KittlerReicheMtchedlidzeetal., author = {Kittler, Martin and Reiche, Manfred and Mtchedlidze, T. and Arguirov, Tzanimir V. and Jia, Guobin and Seifert, Winfried and Suckow, Stephan and Thomas, Wilhelm}, title = {Stark effect at dislocations in silicon for modulation of a 1,5 um light emitter}, series = {Silicon photonics III, 21 - 24 January 2008, San Jose, California, USA}, booktitle = {Silicon photonics III, 21 - 24 January 2008, San Jose, California, USA}, publisher = {SPIE}, address = {Bellingham, Wash.}, isbn = {978-0-8194-7073-7}, language = {en} } @inproceedings{ReicheKittlerKrauseetal., author = {Reiche, Manfred and Kittler, Martin and Krause, M. and {\"U}bensee, Hartmut}, title = {Carrier Transport on Dislocations}, series = {International Conference on Defects in Semiconductors 2013, proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013, Bologna, Italy, 21-26 July 2013}, booktitle = {International Conference on Defects in Semiconductors 2013, proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013, Bologna, Italy, 21-26 July 2013}, editor = {Cavallini, Anna and Estreicher, Stefan K.}, publisher = {AIP Publishing}, address = {Melville, New York}, isbn = {978-0-7354-1215-6}, doi = {10.1063/1.4865599}, language = {en} } @inproceedings{KittlerReicheKrause, author = {Kittler, Martin and Reiche, Manfred and Krause, Hans-Michael}, title = {Charge Carrier Transport Along Grain Boundaries in Silicon}, series = {Gettering and defect engineering in semiconductor technology XV, selected papers from the 15th Gettering and Defect Engineering in Semiconductor Technology Conference, September 22 - 27, 2013, Oxford, UK}, booktitle = {Gettering and defect engineering in semiconductor technology XV, selected papers from the 15th Gettering and Defect Engineering in Semiconductor Technology Conference, September 22 - 27, 2013, Oxford, UK}, publisher = {Trans Tech Publ.}, address = {Durnten-Zurich [u.a.]}, doi = {10.4028/www.scientific.net/SSP.205-206.293}, pages = {293 -- 298}, language = {en} } @inproceedings{LipsSchulzeStarretal., author = {Lips, Klaus and Schulze, Tim F. and Starr, David E. and B{\"a}r, Marcus and Wilks, Regan G. and Fenske, F. and Ruske, Florian and Reiche, Martin and Krol, Roel van de and Reichardt, Gerd and Sch{\"a}fers, Franz and Hendel, Stefan and Follath, Rolf and Bahrdt, Johannes and Peredkov, Sergey and DeBeer, Serena and H{\"a}vecker, Michael and Knop-Gericke, Axel and Rau, Bj{\"o}rn and Kaufmann, Christian and Schlatmann, Rutger and Schl{\"o}gl, Robert and Rech, Bernd and Raoux, Simone}, title = {EMIL: The Energy Materials In-situ Laboratory Berlin - A novel characterization facility for photovoltaic and energy materials}, series = {31st European Photovoltaic Solar Energy Conference and Exhibition, proceedings of the international conference held in Hamburg, Germany, 14 -18 September 2015}, booktitle = {31st European Photovoltaic Solar Energy Conference and Exhibition, proceedings of the international conference held in Hamburg, Germany, 14 -18 September 2015}, publisher = {WIP}, address = {M{\"u}nchen}, isbn = {3-936338-39-6}, doi = {10.4229/EUPVSEC20152015-1AO.2.1}, pages = {25 -- 28}, language = {en} }