@misc{BeleniotisAndreiZervosetal., author = {Beleniotis, Petros and Andrei, Cristina and Zervos, Christos and Rohde, Ulrich L. and Rudolph, Matthias}, title = {GaN trap model extraction based on MHz load-line measurements}, series = {2025 IEEE/MTT-S International Microwave Symposium - IMS 2025}, journal = {2025 IEEE/MTT-S International Microwave Symposium - IMS 2025}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {979-8-3315-1409-9}, doi = {10.1109/IMS40360.2025.11104000}, pages = {1059 -- 1062}, abstract = {The extraction of model parameters for GaN HEMTs is a challenging task that typically requires a comprehensive series of pulsed measurements to ensure that the resulting model is both accurate and convergence-stable. This study introduces, for the first time, an extraction procedure that utilizes I-V curves generated by MHz load-line measurements, effectively replacing the complex and time-intensive pulsed measurements. A drain-lag model extraction was based on load-line I-V curves and validated along with a pulsed-IV-based model through RF large-signal simulations, demonstrating excellent performance.}, language = {en} } @misc{BeleniotisZervosKrauseetal., author = {Beleniotis, Petros and Zervos, Christos and Krause, Sascha and Yazdani, Hossein and Rudolph, Matthias}, title = {Traps in GaN HEMTs : from characterization to model development and device optimization}, series = {2025 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)}, journal = {2025 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {979-8-3315-9172-4}, doi = {10.1109/BCICTS63111.2025.11211504}, pages = {1 -- 8}, abstract = {This paper reviews a comprehensive strategy designed to address the impact of traps across the entire field of GaN HEMT operation. It begins with the characterization of trap levels and the measurement of trap time constants. The study then progresses to TCAD simulations to examine the location of the observed trap levels and their effect on device performance. Finally, it introduces the development of a compact trap model grounded in Shockley-Read-Hall statistics. The proposed model is capable of accurately predicting trapping effects across all combinations of voltage, temperature, and time. The paper concludes by highlighting the synergy TCAD-compact-model, underscoring its utility in device optimization schemes.}, language = {en} }