@misc{RudolphHeymannBoss, author = {Rudolph, Matthias and Heymann, Peter and Boss, Hermann}, title = {Impact of Receiver Bandwidth and Nonlinearity on Noise Measurement Methods}, doi = {http://dx.doi.org/10.1109/MMM.2010.937715}, language = {en} } @inproceedings{RudolphHeymann, author = {Rudolph, Matthias and Heymann, Peter}, title = {The Influence of Microwave Two-Port Noise on Residual Phase Noise in GaAs-HBTs}, language = {en} } @inproceedings{RudolphLenkDoerneretal., author = {Rudolph, Matthias and Lenk, Friedrich and D{\"o}rner, Ralf and Heymann, Peter}, title = {Influence of 2 GHz Harmonic Load-Pull on HBT and MESFET Output Power and Efficiency}, series = {1999 IEEE MTT-S International Microwave Symposium digest, June 13 - 19, 1999, Anaheim Convention Center, Anaheim, California}, booktitle = {1999 IEEE MTT-S International Microwave Symposium digest, June 13 - 19, 1999, Anaheim Convention Center, Anaheim, California}, publisher = {Piscataway, NJ}, address = {IEEE}, isbn = {0-7803-5135-5}, pages = {741 -- 744}, language = {en} } @inproceedings{RudolphDoernerHeymannetal., author = {Rudolph, Matthias and D{\"o}rner, Ralf and Heymann, Peter and Lenk, Friedrich}, title = {Modeling of Low-Frequency Noise in GaInP/GaAs Hetero-Bipolar-Transistors}, series = {2001 IEEE MTT-S International Microwave Symposium digest, May 20 - 25, 2001, Phoenix Civic Plaza, Phoenix, AZ, 1967 - 1970, Vol.3}, booktitle = {2001 IEEE MTT-S International Microwave Symposium digest, May 20 - 25, 2001, Phoenix Civic Plaza, Phoenix, AZ, 1967 - 1970, Vol.3}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {0-7803-6538-0}, pages = {1967 -- 1970}, language = {en} } @inproceedings{RudolphLenkDoerneretal., author = {Rudolph, Matthias and Lenk, Friedrich and D{\"o}rner, Ralf and Heymann, Peter}, title = {Towards a Unified Method to Implement Transit-Time Effects in Pi-Topology HBT CompactModels}, series = {IEEE MTT-S International Microwave Symposium digest, June 2 - 7, 2002, Washington State Convention \& Trade Center, Seattle, Washington, Vol. 2}, booktitle = {IEEE MTT-S International Microwave Symposium digest, June 2 - 7, 2002, Washington State Convention \& Trade Center, Seattle, Washington, Vol. 2}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {0-7803-7239-5}, pages = {997 -- 1000}, language = {en} } @inproceedings{RudolphDoernerKlapprothetal., author = {Rudolph, Matthias and D{\"o}rner, Ralf and Klapproth, L. and Heymann, Peter}, title = {New Algorithm for Extraction of FET Noise Model Parameters}, language = {en} } @inproceedings{RudolphDoernerHeymann, author = {Rudolph, Matthias and D{\"o}rner, Ralf and Heymann, Peter}, title = {New GaInP/GaAs-HBT Large-Signal Model for Power Applications}, language = {en} } @inproceedings{SchottLenkHeymann, author = {Schott, Matthias and Lenk, Friedrich and Heymann, Peter}, title = {On the load-pull effect in MMIC oscillator measurements}, series = {33rd European Microwave Conference, 7 - 9th October 2003, ICM, Munich, Germany, Vol. 1}, booktitle = {33rd European Microwave Conference, 7 - 9th October 2003, ICM, Munich, Germany, Vol. 1}, publisher = {London}, address = {Korizon House Publ.}, isbn = {1-58053-834-7}, doi = {10.1109/EUMC.2003.1262295}, pages = {367 -- 370}, abstract = {Low phase-noise MMIC oscillators are key components for microwave and nun-wave systems. As a consequence, phase-noise measurements of these circuits have become a subject of growing interest and importance. This paper demonstrates that MMIC oscillator circuits with their relatively low Q factors are prone to specific measurement errors. Caused by a load-pull effect, the measurement system can become part of the oscillator, which yields phase-noise data significantly below reality. Special care has to be taken in order to avoid such phenomena.}, language = {en} } @inproceedings{RudolphDoernerHeymann, author = {Rudolph, Matthias and D{\"o}rner, Ralf and Heymann, Peter}, title = {A Universal Measurement System for Microwave Power Transistors}, language = {en} } @inproceedings{RudolphDoernerHeymannetal., author = {Rudolph, Matthias and D{\"o}rner, Ralf and Heymann, Peter and Richter, E.}, title = {Scaling of GaInP/GaAs HBT Equivalent-Circuit Elements}, language = {en} } @inproceedings{RudolphDoernerHeymann, author = {Rudolph, Matthias and D{\"o}rner, Ralf and Heymann, Peter}, title = {Multiharmonic Generator for On-Wafer Phase Calibration of Non-Linear Network Analyzer}, language = {en} } @book{HeymannRudolph, author = {Heymann, Peter and Rudolph, Matthias}, title = {A Guido to Noise in Microwave Circuits: Devices, Circuits and Measurement}, publisher = {IEEE Press [u.a.]}, address = {Piscataway, NJ}, isbn = {978-1-119-85936-9}, pages = {xv, 496}, language = {en} } @misc{RudolphAchoucheKrausetal., author = {Rudolph, Matthias and Achouche, M. and Kraus, S. and Spitzbart, Th. and Kurpas, Paul and Rentner, D. and Brunner, F. and Richter, E. and Bergunde, T. and Heymann, Peter and Wolter, P. and Wittrich, H. and Weyers, M. and W{\"u}rfl, Joachim and Tr{\"a}nkle, G{\"u}nther}, title = {InGaP/GaAs Power HBTs for L-Band Applications}, language = {en} } @article{RudolphBeilenhoffDoerneretal., author = {Rudolph, Matthias and Beilenhoff, K. and D{\"o}rner, Ralf and Heymann, Peter}, title = {Scalable GaInP/GaAs HBT Large-Signal Model}, language = {en} } @article{RudolphHeymann, author = {Rudolph, Matthias and Heymann, Peter}, title = {On Compact HBT RF Noise Modeling}, language = {en} } @article{RudolphDoernerHeymann, author = {Rudolph, Matthias and D{\"o}rner, Ralf and Heymann, Peter}, title = {GaAs HBT Operating as Integrated V- to W-Band Gunn Oscillator}, language = {en} } @article{RudolphDoernerHeymann, author = {Rudolph, Matthias and D{\"o}rner, Ralf and Heymann, Peter}, title = {On the Gunn Effect in GaAs HBTs}, language = {en} } @article{RudolphKorndoerferHeymannetal., author = {Rudolph, Matthias and Kornd{\"o}rfer, Falk and Heymann, Peter and Heinrich, Wolfgang}, title = {Compact Large-Signal Shot-Noise Model for HBTs}, language = {en} } @article{RudolphDoernerKlapprothetal., author = {Rudolph, Matthias and D{\"o}rner, Ralf and Klapproth, L. and Heymann, Peter and Prinzler, H. and B{\"o}ck, Georg}, title = {Experimental Evaluation of Microwave Field-EffectTransistor Noise Models}, language = {en} } @article{RudolphDoernerHeymannetal., author = {Rudolph, Matthias and D{\"o}rner, Ralf and Heymann, Peter and Beilenhoff, K.}, title = {Scalable GaInP/GaAs HBT Large-Signal Model}, language = {en} }