@article{HoffmannWehnerSchmeisser, author = {Hoffmann, Patrick and Wehner, Stefan and Schmeißer, Dieter}, title = {Noise-Induced Spatiotemporal Patterns in a Bistable Reaction-Diffusion System: Photoelectron Emission Microscopy experiments and Modeling of the CO Oxidation Reaction on Ir(111)}, language = {en} } @inproceedings{HenkelTorcheSohaletal., author = {Henkel, Karsten and Torche, Mohamed and Sohal, Rakesh and Schwiertz, Carola and Hoffmann, Patrick and Schmeißer, Dieter}, title = {Pr-O-N Dielectrics for MIS Stacks on Silicon and Silicon Carbide Surfaces}, series = {Silicon carbide 2006 - materials, processing and devices, symposium held April 18 - 20, 2006, San Francisco, California, U.S.A.}, booktitle = {Silicon carbide 2006 - materials, processing and devices, symposium held April 18 - 20, 2006, San Francisco, California, U.S.A.}, editor = {Dudley, Michael}, publisher = {Materials Research Society}, address = {Warrendale, Pa.}, isbn = {978-1-55899-867-4}, pages = {353 -- 358}, language = {en} } @misc{HoffmannWehnerSchmeisseretal., author = {Hoffmann, Patrick and Wehner, Stefan and Schmeißer, Dieter and Brand, Helmut R. and K{\"u}ppers, J{\"u}rgen}, title = {Noise-induced spatiotemporal patterns in a bistable reaction-diffusion system: Photoelectron emission micrsoscopy experiments and modeling of the CO oxidation reaction on Ir(111)}, series = {Physical Review : E}, volume = {73}, journal = {Physical Review : E}, number = {5}, issn = {1550-2376}, pages = {056123}, language = {en} } @article{Hoffmann, author = {Hoffmann, Patrick}, title = {Oxynitride Grotwth on 4H-SiC(0001) by N2O}, language = {de} } @article{PaloumpaYfantisHoffmannetal., author = {Paloumpa, Ioanna and Yfantis, Alexandros D. and Hoffmann, Patrick and Burkov, Yevgen and Yfantis, Alexandros D. and Schmeißer, Dieter}, title = {Mechanisms to inhibit corrosion of Al alloys by polymeric conversion coatings}, abstract = {We introduce a recently developed novel polypyrrole-based coating, which can be formed on the aluminium surface from an aqueous pyrrole solution of fluorozirconic and fluorotitanic acid neutralised with zinc oxide. The composite layer consists of polypyrrole (Ppy) chemisorbed on titanium and zinc oxides and exhibits advanced corrosion resistance. For the investigation of the structure and the corrosion mechanism of the composite corrosion resistant layer we use a photo-electron emission microscope (PEEM). PEEM is especially suitable because it can deliver topographic contrast as well as elemental contrast and chemical information in connection with a variable X-ray source. Additionally, in order to investigate further the corrosion mechanism, but also the role of the alloy in the corrosion process, we examine the aluminium samples with SEM/EDX. The structure of the corrosion resistant layer was investigated before and after accelerated corrosion tests. Our results pointed out the important role of titanium oxide and zinc in the corrosion resistance of our Ppy coating on aluminium.}, language = {en} } @misc{HoffmannSchmeisserRotersetal., author = {Hoffmann, Patrick and Schmeißer, Dieter and Roters, G. and Nenyei, Z.}, title = {Non-destructive probing of interfacial oxidation and nitridation states at RTA Si-oxides}, series = {Thin Solid Films}, volume = {428}, journal = {Thin Solid Films}, number = {1-2}, issn = {0040-6090}, pages = {216 -- 222}, abstract = {The quality of the SiO2/Si interface is of crucial importance in the development and performance of sub 0.1 small mu, Greekm technologies. The knowledge of the chemical composition of the interface is an important piece of information in the preparation of ultra-thin oxides and high-k dielectrics, in order to maintain a high-quality interface and channel mobility. Here we report on investigations of 2 nm oxide layers formed by a RTP process under various gas mixtures containing N2O and NH3 at different concentrations. We studied the SiO2/Si(001) interface by a non-destructive depth profiling using Synchrotron radiation photoelectron spectroscopy. We determine the thickness of the oxide layer, the relative content and chemical state of nitrogen within the oxide, the thickness of the interface layer, and the relative abundance of Si intermediate oxides within. In all systems we find the thickness of the intermediate layer to be approximately 0.17 nm. The intermediate layer contains Si atoms in the oxidation states +1, +2 and +3 with similar relative abundance. Nitrogen is found predominantly close to the intermediate layer forming Si---N as well as Si---N---O bonds. Within the oxide there are only spurious nitrogen content with predominately Si---N---O bonds. Our method is able to detect a nitrogen content within the intermediate layer as low as approximately 5\%.}, language = {en} } @article{SchmeisserPaloumpaHoffmannetal., author = {Schmeißer, Dieter and Paloumpa, Ioanna and Hoffmann, Patrick and Burkov, Yevgen and Yfantis, Alexandros D. and Yfantis, Alexandros D.}, title = {Preventing Corrosion of Aluminium Alloys by Polymeric Coatings}, abstract = {Aluminium is a material of everyday use in many applications,like automobile,aero-space or cookware,due to its specialproperties (low density,low weight,strength,easy to form and cast,abundance etc).Although aluminium is a reactive metal,italso has a significant corrosion resistance because of a thin,protective oxide layer which is generally stable in air and aqueous solutions.However,pores within the oxide film and other defects caused from alloying elements can lead to local corrosion and the formation of pits.}, language = {en} } @misc{LewerenzAggourMurrelletal., author = {Lewerenz, Hans-Joachim and Aggour, Mohammed and Murrell, Chris and Kanis, M. and Jungblut, H. and Jakubowicz, J. and Cox, P. A. and Campbell, S. A. and Hoffmann, Patrick and Schmeißer, Dieter}, title = {Initial stages of structure formation on silicon electrodes investigated by photoelectron spectroscopy using synchrotron radiation and in-situ atomic force microscopy}, series = {Journal of the Electrochemical Society}, volume = {150}, journal = {Journal of the Electrochemical Society}, number = {3}, issn = {1945-7111}, pages = {E185 -- E189}, abstract = {The surface condition of electrochemically H-terminated Si is compared with the situation at the first photocurrent maximum in dilute acidic ammonium fluoride solution where the divalent dissolution converts into the four-valence process. The first high spectral-resolution photoelectron spectroscopy data using synchrotron radiation of electrochemically hydrogenated Si are presented. A combined electrochemistry/ultrahigh vacuum surface analysis system, attached to the U 49/2 beamline at the synchrotron Bessy II, is used for photoelectron spectroscopy (PES) of the electrochemically conditioned samples. We analyze the Si 2p, O 1s, and F 1s core levels. A comparison of a density functional theory calculation of the reaction sequence, proposed in the dissolution model of Gerischer and co-workers, with the PES results supports this model. The anodized sample is characterized by a residual H coverage of 0.35 monolayers evidenced by a surface core level shift, Si-OH and Si-Fx species, F-, and a higher oxidized Si species. SiO2 is not found. Even on very well H-terminated surfaces, we find residual Si-OH complexes, fluoride and water. In situ atomic force microscopy shows a roughening with a root mean square roughness parameter of 2.6 nm. \%A92003 The Electrochemical Society. All rights reserved.}, language = {en} } @inproceedings{HuleaHoffmannBrinzaetal., author = {Hulea, Iulian and Hoffmann, Patrick and Brinza, Monica and Batchelor, David R. and Schmeißer, Dieter}, title = {The interface of friction-welded Al-Fe joints. ATB Metallurgy}, language = {en} } @article{HoffmannMikaloBatcheloretal., author = {Hoffmann, Patrick and Mikalo, Ricardo Pablo and Batchelor, David R. and Schmeißer, Dieter and Soinski, M. S. and Follath, Rolf}, title = {The chromatic aberration of PEEM - demonstration on graphite inclusions in cast iron, Kategrorie: Microscopy - Spectromicroscopy}, language = {en} } @article{MikaloHoffmannBatcheloretal., author = {Mikalo, Ricardo Pablo and Hoffmann, Patrick and Batchelor, David R. and Schmeißer, Dieter}, title = {Valence band spectroscopy of semiconducting regioregular Poly(3-Hexylthiophene)-2,5-diyl}, language = {en} } @article{GraupnerSeyllerLeyetal., author = {Graupner, R. and Seyller, Th. and Ley, L. and Mikalo, Ricardo Pablo and Hoffmann, Patrick and Batchelor, David R. and Schmeißer, Dieter}, title = {PEEM Investigation of CVD-Diamond grown on Si}, language = {en} } @article{HoffmannMikaloBatcheloretal., author = {Hoffmann, Patrick and Mikalo, Ricardo Pablo and Batchelor, David R. and Schmeißer, Dieter and Follath, Rolf}, title = {N2O-Oxidation of Si(100)}, language = {en} } @article{KraftThissenMayeretal., author = {Kraft, D. and Thißen, A. and Mayer, Thomas and Klein, A. and Jaegermann, Wolfram and Hoffmann, Patrick and Batchelor, David R. and Schmeißer, Dieter}, title = {Backcontact Formation on CdTe Thin Film Solar Cells}, language = {en} } @article{BatchelorFollathMikaloetal., author = {Batchelor, David R. and Follath, Rolf and Mikalo, Ricardo Pablo and Hoffmann, Patrick and Schmeißer, Dieter}, title = {Commissioning Results of the BTUC-PGM beamline}, language = {en} } @article{HoffmannMikaloBoehmeetal., author = {Hoffmann, Patrick and Mikalo, Ricardo Pablo and B{\"o}hme, O. and Schmeißer, Dieter}, title = {PEEM-investigations on cleaved MoTe2-surfaces}, language = {en} } @article{BieniekBeckJakubowskietal., author = {Bieniek, Tomasz and Beck, Romuald B. and Jakubowski, Andrzej and Hoffmann, Patrick and Schmeißer, Dieter and Konarski, Piotr and Cwil, M.}, title = {Formation of Pedestal Oxynitride Layer by Extremely Shallow Nitrogen Implantation in Planar R.F. Plasma Reactor}, language = {en} } @inproceedings{WehnerHoffmannSchmeisseretal., author = {Wehner, Stefan and Hoffmann, Patrick and Schmeißer, Dieter and Brand, Helmut R. and K{\"u}ppers, J{\"u}rgen}, title = {CO oxidation on Ir(111) surfaces: consequences of anisotropic diffusion and noise}, series = {Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 41}, booktitle = {Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 41}, publisher = {Deutsche Physikalische Gesellschaft}, address = {Bad Honnef}, issn = {0420-0195}, pages = {S. 475}, abstract = {The CO oxidation reaction on Iridium(111) surfaces shows bistability in a limited range of the CO fraction of the reactant gas flux Y and a wide range of temperatures T. The two branches are characterized by their reactivity for CO2 formation. The upper rate (high CO2 formation) rate is related to high oxygen coverage on the surface, the lower rate (little CO2 formation) to high CO coverage. Quadrupol mass spectroscopy and PEEM (photoelectron emission microscopy) was employed to study the influence of a noisy reactant gas flux composition on the spatio-temporal pattern development in the CO oxidation reaction on flat Ir(111) and stepped Ir(977) surfaces. PEEM shows nucleation and growth of few oxygen resp. CO islands at small noise amplitudes. Anisotropic diffusion of CO parallel and normal to the steps causes elliptic shapes of large islands. The long axes of the ellipses are aligned along the steps. At increased noise amplitudes the density of islands becomes larger. 2D modeling of the phenomena based on reaction-diffusion differential equations reproduces the experimental findings quite nicely.}, language = {en} } @article{Hoffmann, author = {Hoffmann, Patrick}, title = {Oxynitride on 4H-SiC (0001)}, abstract = {It will be reported on the growth of oxynitride ultra-thin layers (<2 nm) on (0 0 0 1)-oriented 4H-SiC surfaces. The oxynitride layers were grown by a thermal treatment of the samples in low pressure (up to 1000 Pa) N2O ambient. By varying the growth conditions (N2O pressure, sample temperature, growth time) different layers were made. The highest nitrogen incorporation was found to be at high temperatures and low N2O pressures.The grown layers were investigated by photoelectron spectroscopy (XPS) for chemical analysis. Concerning the chemical analysis, the general nitrogen content of the samples is compared at different preparation conditions. The films are found to consist mainly of SiO2 and small fraction of silicon nitride. Only a tenth of the nitrogen was incorporated as oxynitride. The results obtained for oxynitride thin films on 4H-SiC are compared to similarly prepared oxynitride layers on Si(1 1 1) investigated in the past. Furthermore, an additional source of nitrogen due to dopand diffusion in the SiC single crystal is reported.}, language = {en} } @misc{LupinaSchroederDabrowskietal., author = {Lupina, Grzegorz and Schroeder, Thomas and Dabrowski, Jarek Marek and Schmeißer, Dieter and Hoffmann, Patrick}, title = {Praseodymium silicate layers with atomically abrupt interface on Si(100)}, series = {Applied Physics Letters}, volume = {87}, journal = {Applied Physics Letters}, number = {5}, issn = {0003-6951}, pages = {S. 092901}, language = {en} } @article{HoffmannSchmeisserSoinski, author = {Hoffmann, Patrick and Schmeißer, Dieter and Soinski, M. S.}, title = {Promieniowanie synchrotronowe jako uniwersalne narzedzie badawcze - Proby jego wykorzystania w badaniach struktury zeliwa}, language = {de} } @article{MikaloAppelHoffmannetal., author = {Mikalo, Ricardo Pablo and Appel, G{\"u}nter and Hoffmann, Patrick and Schmeißer, Dieter}, title = {Band Bending in Doped Conducting Polypyrrole Interaction with Silver}, language = {en} } @article{SchmeisserMikaloHoffmannetal., author = {Schmeißer, Dieter and Mikalo, Ricardo Pablo and Hoffmann, Patrick and Seyller, Th. and Ley, L. and Lloyd Spetz, Anita}, title = {Oxide growth on SiC (0001) surfaces}, language = {en} } @article{MikaloHoffmannBatcheloretal., author = {Mikalo, Ricardo Pablo and Hoffmann, Patrick and Batchelor, David R. and Schmeißer, Dieter and Lloyd Spetz, Anita and Lundstr{\"o}m, Ingemar}, title = {Comparison of HF and ozone treated SiC surfaces}, language = {en} } @inproceedings{HoffmannMikaloBatcheloretal., author = {Hoffmann, Patrick and Mikalo, Ricardo Pablo and Batchelor, David R. and Beuckert, Guido and Schmeißer, Dieter and Kittler, Martin and Ourmazd, A. and Lewerenz, Hans-Joachim}, title = {Solare Energieumwandlung in d{\"u}nnen Schichten}, language = {de} } @article{MikaloAppelHoffmannetal., author = {Mikalo, Ricardo Pablo and Appel, G{\"u}nter and Hoffmann, Patrick and Schmeißer, Dieter and Mast, M.}, title = {Multi-Atom Resonant Photoemission applied to study the silver to nitrogen interaction in polypyrrole films}, language = {en} } @article{HoffmannSchmeisserKleinetal., author = {Hoffmann, Patrick and Schmeißer, Dieter and Klein, A. and Jaegermann, Wolfram and Pettenkofer, Christian and Follath, Rolf}, title = {Spectro-Microscopy with PEEM / µESCA}, language = {en} } @inproceedings{HoffmannBatchelorSchmeisser, author = {Hoffmann, Patrick and Batchelor, David R. and Schmeißer, Dieter}, title = {Spectro-Microscopic analyses in metallurgical systems: spheroidic graphite in cast iron and the interface of friction-welded Al-Fe joints}, language = {en} } @article{SchmeisserAppelBoehmeetal., author = {Schmeißer, Dieter and Appel, G{\"u}nter and B{\"o}hme, O. and Heller, Thomas and Mikalo, Ricardo Pablo and Hoffmann, Patrick and Batchelor, David R.}, title = {Nanoparticles and polarons: active centers in thin film sensor devices}, language = {de} } @article{MikaloHoffmannHelleretal., author = {Mikalo, Ricardo Pablo and Hoffmann, Patrick and Heller, Thomas and Batchelor, David R. and Appel, G{\"u}nter and Schmeißer, Dieter}, title = {Doping and defect inhomogeneities of polypyrrole tosylate films as revealed by ?-NEXAFS}, language = {en} } @article{HoffmannMikaloSchmeisseretal., author = {Hoffmann, Patrick and Mikalo, Ricardo Pablo and Schmeißer, Dieter and Kittler, Martin}, title = {A spectro-microscopic approach to study the morphology and elemental distribution of mc-Si surfaces}, language = {en} } @article{MikaloHoffmannBoehmeetal., author = {Mikalo, Ricardo Pablo and Hoffmann, Patrick and B{\"o}hme, O. and Schmeißer, Dieter}, title = {Doping inhomogenities in Polypyrrole films: a Photoemission Electron Microscope (PEEM) and Spectro-Microscopic Study}, language = {en} } @article{MikaloHoffmannHelleretal., author = {Mikalo, Ricardo Pablo and Hoffmann, Patrick and Heller, Thomas and Schmeißer, Dieter}, title = {Lateral Doping Inhomogeneities as Revealed by ?-NEXAFS and ?-PES}, language = {en} } @misc{HoffmannSchmeisser, author = {Hoffmann, Patrick and Schmeißer, Dieter}, title = {Improvement of Nitrogen Incorporation into Oxynitrides on 4H-SiC(0001)}, series = {Nuclear Instruments and Methods in Physics Research, Section B : Beam with Materials and Atoms}, volume = {246}, journal = {Nuclear Instruments and Methods in Physics Research, Section B : Beam with Materials and Atoms}, number = {1}, pages = {85 -- 89}, language = {en} } @article{WehnerSchmeisserHoffmann, author = {Wehner, Stefan and Schmeißer, Dieter and Hoffmann, Patrick}, title = {Spatiotemporal patterns of external noise-induced transitions in a bistable reaction-diffusion system : Photoelectron Emission Microscopy experiments and modeling}, language = {en} } @article{Hoffmann, author = {Hoffmann, Patrick}, title = {Chemical state depth profiling of ultra-thin oxynitride layers by photoelectron spectroscopy}, language = {en} } @misc{LewerenzMurrellJakubowiczetal., author = {Lewerenz, Hans-Joachim and Murrell, Chris and Jakubowicz, J. and Aggour, Mohammed and Kanis, M. and Campbell, S. A. and Cox, P. A. and Hoffmann, Patrick and Jungblut, H. and Schmeißer, Dieter}, title = {High Resolution Surface analysis of Si Roughenning in Dilute Ammonium Fluoride Solution}, series = {Journal of Electroanalytical Chemistry}, volume = {540}, journal = {Journal of Electroanalytical Chemistry}, issn = {1873-2569}, pages = {3 -- 6}, abstract = {The initial stages of porous Si formation on Si(111) in dilute ammonium fluoride solution are analysed by photoelectron spectroscopy using synchrotron radiation (SRPES). The PES results in the por-Si formation regime partly support a recent dissolution model. The contribution from the Si 2p surface core level shift shows that 0.35 ML of the surface is still H-terminated after interruption of the conditioning process at the first photocurrent maximum. Two signals shifted in binding energy by 0.8 and 1 eV, respectively, are attributed to reaction intermediates expected from the proposed reaction mechanism and from theoretical calculations using density functional theory (DFT). A distinct roughening is found in in-situ AFM measurements, with a calculated RMS roughness parameter of 2.6 nm.}, language = {en} } @misc{LewerenzAggourMurrelletal., author = {Lewerenz, Hans-Joachim and Aggour, Mohammed and Murrell, Chris and Kanis, M. and Hoffmann, Patrick and Jungblut, H. and Schmeißer, Dieter}, title = {Interface engineering of photoelectrochemically prepared Si surfaces}, abstract = {The oxide of Si(111) formed by electropolishing in dilute ammonium fluoride solution is analysed by photoelectron spectroscopy using synchrotron radiation. The oxidiclayer is about 3.1 nm thick and contains Si-F-x species as well as oxyfluorides. The oxyfluorides are found preferentially at the electropolishing layer surface. SiOHspecies are concentrated at the oxidic film/substrate interface. The full width half maximum of the Si 2p line indicates that the Si/electropolishing oxide interface issmoother than the Si/natural oxide interface.}, language = {en} } @phdthesis{Hoffmann, author = {Hoffmann, Patrick}, title = {Untersuchungen zu Inhomogenit{\"a}ten an der Halbleitergrenzfl{\"a}che Silizium-Siliziumoxynitrid}, publisher = {Shaker-Verlag}, address = {Aachen}, isbn = {3-8322-1982-X}, pages = {179}, language = {de} } @article{SieberSeyllerGraupneretal., author = {Sieber, N. and Seyller, Th. and Graupner, R. and Ley, L. and Mikalo, Ricardo Pablo and Hoffmann, Patrick and Batchelor, David R. and Schmeißer, Dieter}, title = {Wet-chemical preparation of silicate adlayer reconstructed SiC(0001) surfaces as studied by PIES and LEED}, abstract = {We have studied the surface chemistry of 6H-SiC(0001) and 6H-SiC (000 (1) over bar) after wet-chemical treatment using photoelectron spectroscopy (PES) andlow-energy electron diffraction (LEED). The origin of chemically shifted components in the Si2p and C1s spectra is discussed in the light of previous studies onwet-chemically prepared surfaces and on silicate adlayer reconstructed surfaces. On 6H-SiC(0001) an ordered silicate adlayer was prepared by etching the surface withsulfuric acid based agents.}, language = {en} } @misc{AggourStoerkelMurrelletal., author = {Aggour, Mohammed and Stoerkel, Ulrich and Murrell, Chris and Campbell, S. A. and Jungblut, H. and Hoffmann, Patrick and Mikalo, Ricardo Pablo and Schmeißer, Dieter and Lewerenz, Hans-Joachim}, title = {Electrochemical interface modification of CuInS2 thin films}, abstract = {We studied two novel electrochemical treatments of CuInS2 solar-cell absorber films, introduced to remove the deleterious segregated CuS phase. Their influence onsurface topography, chemistry and electronic properties was investigated using in situ atomic force microscopy (AFM) and photoclectron spectroscopy, performed inpart at the U49/2 undulator beam line at BESSY II. The results are examined in order to develop an improved understanding of the chemical-electrochemical surfacetransformation processes.}, language = {en} } @article{HoffmannMikaloSchmeisser, author = {Hoffmann, Patrick and Mikalo, Ricardo Pablo and Schmeißer, Dieter}, title = {PEEM - a spectromicroscopic tool for mc-Si surface evaluation}, abstract = {The photo emission electron microscope (PEEM) with its direct imaging of the sample surface is a convenient tool for fast evaluation of large sample areas. It is possibleto handle samples with a size of 30 mm x 30 mm.With PEEM it is possible to visualise grain boundaries and crystal displacements without removing the native oxide. No special sample treatment is needed exceptchemical polishing of the sample surface and a HF-dip to obtain a thin (1 ... 2 nm) oxide layer.The quality of that oxide was proofed by high resolution photo electron spectroscopy (PES) at a synchrotron. The results were compared to native oxide onsingle-crystalline Si and no suboxides (e.g. SiO) were found. Our spectromicroscopic PEEM measurements show no difference in the oxide qualities of different grainsand on grain boundaries or crystal displacements. Furthermore no difference in the binding energy of Si2p core levels were found.In addition to grain boundaries other spot-like features were found on the sample surface. These could be identified in some cases as precipitation of Ca underneath thenative oxide.}, language = {en} } @incollection{SchmeisserHoffmannMuessig, author = {Schmeißer, Dieter and Hoffmann, Patrick and M{\"u}ssig, Hans-Joachim}, title = {The Pr2O3/Si(001) interface: a mixed Si-Proxide}, series = {BESSY annual report 2001}, booktitle = {BESSY annual report 2001}, publisher = {Bessy}, address = {Berlin}, pages = {171 -- 173}, language = {en} } @article{MuellerHoffmannMilkoetal., author = {M{\"u}ller, Klaus and Hoffmann, Patrick and Milko, S. and Burkov, Yevgen and Schmeißer, Dieter}, title = {PEEM and µ-NEXAFS of Cu-In-S-Surfaces}, abstract = {The composition of CuInS2-films tends to differ from the ideal ratio of 1:1:2. A molecularlyvariation of dm=[Cu]/[In]-1 not equal 0 occurs due to the formation of binary phases as segregation's at the surface, as crystallites in the bulk of the film or at the surface of grains [1]. Furthermore, the range of homogeneity of the phase CuInS2 is relatively large caused by a low enthalpy of formation of defects like Cu-vacancies [2]. Segregation's at surfaces can be removed by KCN etching or by an electrochemical process [3, 4] We investigated the effect of an in-situ-heat-treatment of samples, prepared in the Cu-rich regime with additional amounts of copper, deposited on the surface of the Cu-In-S-films.We used Cu-In-S-films on molybdenum, prepared from precursors of Cu/In and a following reactive annealing-process in a sulphur-atmosphere. The experiments were performed as follows: The surface of the films was cleaned in situ to remove CuS-Phases by Argon-bombardment. The thin layers of additional Copper were prepared by evaporation of copper metal in Knudsen-cells. The thickness of this copper-films is in the range of monolayers, revealed by a calibration with copper on iron-substrates. After this deposition the samples were heated up to several temperatures (up to 550 ºC) for ten minutes, respectively. Here the molybdenum back-contact was used as electrical heater.}, language = {en} } @incollection{HenkelHoffmannSchmeisser, author = {Henkel, Karsten and Hoffmann, Patrick and Schmeißer, Dieter}, title = {Backpropagation-Netzwerke f{\"u}r ein Zweisensorsystem zur Erfassung von Kohlendioxidkonzentrationen und relativer Luftfeuchte}, series = {Sensoren im Fokus neuer Anwendungen : Verbraucherschutz und Lebensmittelkontrolle, Biosysteme und Nanobiotechnologie, Umweltmesstechnik, neue Sensormaterialien, Mess- und Eichwesen}, booktitle = {Sensoren im Fokus neuer Anwendungen : Verbraucherschutz und Lebensmittelkontrolle, Biosysteme und Nanobiotechnologie, Umweltmesstechnik, neue Sensormaterialien, Mess- und Eichwesen}, publisher = {w.e.b. Universit{\"a}tsverlag}, address = {Dresden}, isbn = {3-935712-71-5}, pages = {104 -- 107}, abstract = {Zwei Schwingquarzsensoren mit gleicher sensitiver Beschichtung wurden zur Messung von CO2-Konzentrationen bei variierenden Luftfeuchten genutzt. Die Daten wurden neuronalen Netzen mit unterschiedlicher Architektur trainiert. Zwei Netze wurden auf ihre Generalisierungsf{\"a}higkeit getestet und miteinander verglichen. F{\"u}r ein einstufiges Netz konnten Ergebnisse mit Fehlern kleiner 12\% f{\"u}r die CO2-Konzentration und kleiner 5\% f{\"u}r die Luftfeuchte erzielt werden. Ein zweistufiges Netz erkannte Kategorien der Luftfeuchte 100\%-ig, f{\"u}r die CO2-Konzentration wurden Fehler kleiner 9\% erreicht, wobei eine deutlich bessere Generalisierungsf{\"a}higkeit dieses Netzes im Vergleich zum einstufigen Netz zu verzeichnen ist.}, language = {de} } @article{BatchelorHoffmannSchmeisser, author = {Batchelor, David R. and Hoffmann, Patrick and Schmeißer, Dieter}, title = {Photoemission study of Aluminium Steel cold welded joints}, abstract = {Aluminium and Stainless Steel bi-metal material is extremely versatile and is used in a wide range of products; from cooking utensils to high technology applications such as automobile manufacture and Synchrotron radiation instrumentation. As a consequence of this wide range of applications the study of the formation of Aluminium Steel junctions and the bonding mechanism is of considerable industrialimportance [1-3].In a previous publication [4] evidence for a chemical bond, alloying at the interface was found. As the monochromator focus and welded region are similar in size about 200 µm (the actual interface from SEM is an order of magnitude smaller) a simple photoemission experiment of translating the sample perpendicular (vertically, weld horizontal) to the weld and measuring spectra was performed.}, language = {en} } @article{JaeckelThissenHungeretal., author = {J{\"a}ckel, B. and Thißen, A. and Hunger, Ralf and Klein, A. and Jaegermann, Wolfram and Hoffmann, Patrick and Schmeißer, Dieter}, title = {Focus IS-PEEM investigations at U49/II: experimental determination of a magnification function, the contrast mechanism and the spectral resolution}, language = {en} } @article{HoffmannMikaloSchmeisser, author = {Hoffmann, Patrick and Mikalo, Ricardo Pablo and Schmeißer, Dieter}, title = {A spectro-microscopic approach for spatially resolved characterisation of semiconductor structures in PEEM}, language = {en} } @article{MikaloAppelHoffmannetal., author = {Mikalo, Ricardo Pablo and Appel, G{\"u}nter and Hoffmann, Patrick and Schmeißer, Dieter}, title = {Determination of the Vacuum Level in NEXAFS-spectra by Selected-Yield-NEXAFS}, language = {en} } @article{HoffmannMikaloSchmeisser, author = {Hoffmann, Patrick and Mikalo, Ricardo Pablo and Schmeißer, Dieter}, title = {Photoemissionselektronenmikroskopie - ein Instrument f{\"u}r die Materialforschung}, language = {de} }