@inproceedings{AndjelkovicBabicLietal., author = {Andjelkovic, Marko and Babic, Milan and Li, Yuanqing and Schrape, Oliver and Krstic, Milos and Kraemer, Rolf}, title = {Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates}, series = {25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018}, booktitle = {25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-9562-3}, doi = {10.1109/ICECS.2018.8617996}, pages = {361 -- 364}, language = {en} } @inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Current Models for the Circuit-level Simulations of Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, pages = {S. 184}, language = {en} } @inproceedings{AndjelkovicStamenkovićKrsticetal., author = {Andjelkovic, Marko and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {Impact of Resistive Open and Bridge Defects on the SET Robustness of CMOS Combinational Logic}, series = {IEEE East-West Design \& Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018}, booktitle = {IEEE East-West Design \& Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-5709-6}, doi = {10.1109/EWDTS.2018.8524748}, pages = {6}, language = {en} } @inproceedings{AndjelkovicNenadovicPetrovicetal., author = {Andjelkovic, Marko and Nenadovic, Miljana and Petrovic, Vladimir and Krstic, Milos and Kraemer, Rolf}, title = {Evaluation of the Pulse Stretcher for Detection of Very Short Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, pages = {S. 214}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190106}, pages = {217 -- 220}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Assessment of the Amplitude-duration Criterion for SET Robusness Evaluation}, series = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, booktitle = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0352-9}, language = {en} }