@inproceedings{ZeidlerEhrigKrsticetal., author = {Zeidler, Steffen and Ehrig, Marcus and Krstic, Milos and Augustin, Michael and Wolf, Christoph and Kraemer, Rolf}, title = {Ultra Low Cost Asynchronous Handshake Checker}, language = {en} } @misc{KrsticFanGrassetal., author = {Krstic, Milos and Fan, X. and Grass, Eckhard and G{\"u}rkaynak, F.}, title = {GALS for Bursty Data Transfer Based on the Clock Coupling}, language = {en} } @inproceedings{KrsticPizEhrigetal., author = {Krstic, Milos and Piz, M. and Ehrig, Marcus and Grass, Eckhard}, title = {OFDM Datapath Baseband Processor for 1 Gbps Datarate}, language = {en} } @misc{FanKrsticGrass, author = {Fan, X. and Krstic, Milos and Grass, Eckhard}, title = {Aussetzbarer Taktgenerator}, language = {de} } @misc{KrsticGrass, author = {Krstic, Milos and Grass, Eckhard}, title = {GALS-Schaltung mit arbitriertem eingangs- und ausgangsseitigem Taktantrieb}, language = {de} } @inproceedings{KrsticGrassStahl, author = {Krstic, Milos and Grass, Eckhard and Stahl, C.}, title = {Request-Driven GALS Technique for Wireless Communication System}, language = {en} } @inproceedings{KrsticGrass, author = {Krstic, Milos and Grass, Eckhard}, title = {BIST Testing for GALS Systems}, language = {en} } @inproceedings{KrsticGrass, author = {Krstic, Milos and Grass, Eckhard}, title = {GALSification of IEEE 802.11a Baseband Processor}, language = {en} } @inproceedings{MaharatnaTroyaChinchillaBanerjeeetal., author = {Maharatna, Koushik and Troya Chinchilla, Alfonso Luis and Banerjee, S. and Grass, Eckhard and Krstic, Milos}, title = {A 16-Bit CORDIC Rotator for High-Speed Wireless LAN}, language = {en} } @inproceedings{KrsticGrass, author = {Krstic, Milos and Grass, Eckhard}, title = {GALS Baseband Processor for WLAN}, language = {en} } @inproceedings{StahlReisigKrstic, author = {Stahl, C. and Reisig, W. and Krstic, Milos}, title = {Hazard Detection in GALS Wrapper: A Case Study}, language = {en} } @article{MaharatnaBanerjeeGrassetal., author = {Maharatna, Koushik and Banerjee, S. and Grass, Eckhard and Krstic, Milos and Troya Chinchilla, Alfonso Luis}, title = {Modified Virtually Scaling Free Adaptive CORDIC Rotator Algorithm and Architecture}, language = {en} } @inproceedings{WolfZeidlerKrsticetal., author = {Wolf, Christoph and Zeidler, Steffen and Krstic, Milos and Kraemer, Rolf}, title = {Overview on ATE Test and Debugging Methods for Asynchronous Circuits}, language = {en} } @inproceedings{SimevskiSchleisiekPetrovicetal., author = {Simevski, Aleksandar and Schleisiek, Klaus and Petrovic, Vladimir and Beller, Norbert and Skoncej, Patryk and Schoof, Gunther and Krstic, Milos}, title = {Implementation of a Real Time Unit for Satellite Applications}, series = {19th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), 20-22 April 2016, Kosice, Slovakia}, booktitle = {19th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), 20-22 April 2016, Kosice, Slovakia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-2467-4}, pages = {180}, language = {en} } @inproceedings{BabicZeidlerKrstic, author = {Babic, Milan and Zeidler, Steffen and Krstic, Milos}, title = {GALS Partitioning Methodology for Substrate Noise Reduction in Mixed-Signal Integrated Circuits}, series = {22nd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2016), 8-11 May, Porto Alegre, Brazil, 2016}, booktitle = {22nd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2016), 8-11 May, Porto Alegre, Brazil, 2016}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-9007-1}, pages = {67 -- 74}, language = {en} } @inproceedings{BabicKrstic, author = {Babic, Milan and Krstic, Milos}, title = {A Coarse Model for Estimation of Switching Noise Coupling in Lightly Doped Substrates}, series = {18th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Belgrade, Serbia, 2015}, booktitle = {18th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Belgrade, Serbia, 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6780-3}, pages = {217 -- 222}, language = {en} } @inproceedings{BabicFanKrstic, author = {Babic, Milan and Fan, Xin and Krstic, Milos}, title = {Frequency-Domain Modeling of Ground Bounce and Substrate Noise for Synchronous and GALS Systems}, series = {25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), 1-4 Sept. Salvador, Brazil 2015}, booktitle = {25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), 1-4 Sept. Salvador, Brazil 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-9419-2}, pages = {126 -- 132}, language = {en} } @inproceedings{BabicKrstic, author = {Babic, Milan and Krstic, Milos}, title = {GALS Methodology for Substrate Noise Reduction in BiCMOS Technologies}, series = {Proceedings, Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN), Tallinn, Estonia, 2015}, booktitle = {Proceedings, Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN), Tallinn, Estonia, 2015}, pages = {2}, language = {en} } @misc{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Study of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit}, series = {Microelectronics Reliability}, volume = {82}, journal = {Microelectronics Reliability}, issn = {0026-2714}, doi = {10.1016/j.microrel.2017.12.022}, pages = {100 -- 112}, language = {en} } @misc{SegabinazziFerreiraGeorgeChenetal., author = {Segabinazzi Ferreira, Raphael and George, Nevin and Chen, Junchao and H{\"u}bner, Michael and Krstic, Milos and Nolte, J{\"o}rg and Vierhaus, Heinrich Theodor}, title = {Configurable Fault Tolerant Circuits and System Level Integration for Self-Awareness}, series = {Proceedings of the Work in Progress Session held in connection with SEAA 2019, the 45th EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2019, the 22nd EUROMICRO Conference on Digital System Design}, journal = {Proceedings of the Work in Progress Session held in connection with SEAA 2019, the 45th EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2019, the 22nd EUROMICRO Conference on Digital System Design}, publisher = {SEA-Publications}, address = {Kallithea, Chalkidiki (Greece)}, isbn = {978-3-902457-54-7}, doi = {10.26127/BTUOpen-5050}, pages = {2}, abstract = {Scaling minimum features of ICs down to the 10nm- area and below has allowed high integration rates in electronics. Scaling at supply voltages of 1V and below also implies a rising level of stress which drives aging effects that reduce switching speed and the expected life time. Additionally, vulnerability from particle radiation is increased. Hence, fault detection and on- line correction become a must for many applications. However, not only fault tolerance but self-awareness becomes also an advantage. Provided that by being aware of its own healthy state allow optimized configurations regarding system operation modes and configurable hardware mechanism. This paper shows a preliminary work in a configurable circuit and explores its configuration possibilities when integrated into a complete system.}, language = {en} } @misc{JenihhinHamdiouiSonzaReordaetal., author = {Jenihhin, Maksim and Hamdioui, Said and Sonza-Reorda, Matteo and Krstic, Milos and Langend{\"o}rfer, Peter and Sauer, Christian and Klotz, Anton and H{\"u}bner, Michael and Nolte, J{\"o}rg and Vierhaus, Heinrich Theodor and Selimis, Georgions and Alexandrescu, Dan and Taouil, Mottaqiallah and Schrijen, Geert-Jan and Sterpone, Luca and Squillero, Giovanni and Dyka, Zoya and Raik, Jaan}, title = {RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems}, series = {ArXiv.org}, journal = {ArXiv.org}, pages = {7}, language = {en} } @misc{AndjelkovicVeleskiChenetal., author = {Andjelkovic, Marko and Veleski, Mitko and Chen, Junchao and Simevski, Aleksandar and Krstic, Milos}, title = {A Particle Detector Based on Pulse Stretching Inverter Chain}, series = {26th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2019), Genova}, journal = {26th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2019), Genova}, isbn = {978-1-7281-0996-1}, doi = {10.1109/ICECS46596.2019.8964644}, pages = {4}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {A Programmable Error-Predictive In-Situ Delay Monitor for Adaptive Low Power and Error-Resilient Complex System-On-Chip}, series = {9th Biannual European - Latin American Summer School on Design, Test and Reliability (BELAS 2019), Frankfurt/Oder}, journal = {9th Biannual European - Latin American Summer School on Design, Test and Reliability (BELAS 2019), Frankfurt/Oder}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {Programmable In-Situ Delay Monitor for Energy-Efficient and Resilient Complex SoC}, series = {Proc. 24th IEEE European Test Symposium: PhD Forum (ETS 2019)}, journal = {Proc. 24th IEEE European Test Symposium: PhD Forum (ETS 2019)}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {The Effects of Voltage Scaling on Reliability and Power Consumption in Multiprocessor Systems}, series = {Proc. 30. GI/GMM/ITG-Workshop Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen (TuZ 2018), 38 (2018)}, journal = {Proc. 30. GI/GMM/ITG-Workshop Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen (TuZ 2018), 38 (2018)}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {An Overview of Cross-Layer Resilience Design Methods}, series = {RESCUE 2017, Limassol}, journal = {RESCUE 2017, Limassol}, pages = {4}, language = {en} } @misc{VeleskiHuebnerKrsticetal., author = {Veleski, Mitko and H{\"u}bner, Michael and Krstic, Milos and Kraemer, Rolf}, title = {Highly Configurable Framework for Adaptive Low Power and Error-Resilient System-On-Chip}, series = {23rd EUROMICRO Conference on Digital System Design (DSD 2020), Portoroz, Slovenia, 26 - 28 August 2020}, journal = {23rd EUROMICRO Conference on Digital System Design (DSD 2020), Portoroz, Slovenia, 26 - 28 August 2020}, publisher = {IEEE}, isbn = {978-1-7281-9535-3}, doi = {10.1109/DSD51259.2020.00015}, pages = {24 -- 28}, language = {en} } @misc{WenBaroniPerezetal., author = {Wen, Jianan and Baroni, Andrea and Perez, Eduardo and Ulbricht, Markus and Wenger, Christian and Krstic, Milos}, title = {Evaluating Read Disturb Effect on RRAM based AI Accelerator with Multilevel States and Input Voltages}, series = {2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)}, journal = {2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)}, isbn = {978-1-6654-5938-9}, issn = {2765-933X}, doi = {10.1109/DFT56152.2022.9962345}, pages = {1 -- 6}, abstract = {RRAM technology is a promising candidate for implementing efficient AI accelerators with extensive multiply-accumulate operations. By scaling RRAM devices to the synaptic crossbar array, the computations can be realized in situ, avoiding frequent weights transfer between the processing units and memory. Besides, as the computations are conducted in the analog domain with high flexibility, applying multilevel input voltages to the RRAM devices with multilevel conductance states enhances the computational efficiency further. However, several non-idealities existing in emerging RRAM technology may degrade the reliability of the system. In this paper, we measured and investigated the impact of read disturb on RRAM devices with different input voltages, which incurs conductance drifts and introduces errors. The measured data are deployed to simulate the RRAM based AI inference engines with multilevel states.}, language = {en} } @misc{DykaKabinBrzozowskietal., author = {Dyka, Zoya and Kabin, Ievgen and Brzozowski, Marcin and Panic, Goran and Calligaro, Cristiano and Krstic, Milos and Langend{\"o}rfer, Peter}, title = {On the SCA Resistance of Crypto IP Cores}, series = {23rd IEEE Latin-American Test Symposium (LATS 2022), Montevideo, Uruguay, 05-08 September 2022}, journal = {23rd IEEE Latin-American Test Symposium (LATS 2022), Montevideo, Uruguay, 05-08 September 2022}, isbn = {978-1-6654-5707-1}, issn = {2373-0862}, doi = {10.1109/LATS57337.2022.9937007}, pages = {2}, language = {en} } @inproceedings{BabicKrstic, author = {Babic, Milan and Krstic, Milos}, title = {A Substrate Noise Reduction Methodology Based on Power Domain Separation of GALS Subcomponents}, series = {27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS), September 25-27, 2017, Aristotle University Research Dissemination Center (KEDEA), Thessaloniki, Greece}, booktitle = {27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS), September 25-27, 2017, Aristotle University Research Dissemination Center (KEDEA), Thessaloniki, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-6462-5}, doi = {10.1109/PATMOS.2017.8106981}, pages = {6}, language = {en} } @inproceedings{KrsticFanBabicetal., author = {Krstic, Milos and Fan, Xin and Babic, Milan and Grass, Eckhard and Bjerregaard, T. and Yakovlev, A.}, title = {Reducing Switching Noise Effects by Advanced Clock Management}, series = {11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 4-8 July, St. Petersburg, Russia 2017}, booktitle = {11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 4-8 July, St. Petersburg, Russia 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2689-4}, pages = {3 -- 8}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {Erstellung eines Modells der kritischen Ladung zur Bewertung der Robustheit gegen{\"u}ber SETs und SEUs: Fallstudie Muller C-Element}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {17 -- 24}, language = {de} } @inproceedings{TroyaChinchillaMaharatnaKrsticetal., author = {Troya Chinchilla, Alfonso Luis and Maharatna, Koushik and Krstic, Milos and Grass, Eckhard and Kraemer, Rolf}, title = {OFDM Synchronizer Implementation for an IEEE 802.11a Compliant Modem}, language = {de} } @inproceedings{AndjelkovicJagdholdKrsticetal., author = {Andjelkovic, Marko and Jagdhold, Ulrich and Krstic, Milos and Kraemer, Rolf}, title = {2D TCAD Simulation of Single Event Transients in 250 nm Bulk CMOS Technology}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {90 -- 96}, language = {en} } @inproceedings{MaharatnaTroyaChinchillaKrsticetal., author = {Maharatna, Koushik and Troya Chinchilla, Alfonso Luis and Krstic, Milos and Grass, Eckhard and Jagdhold, Ulrich}, title = {A CORDIC Like Processor for Computation of Arctangent and Absolute Magnitude of a Vector}, language = {en} } @misc{PerezBoschQuesadaMahadevaiahRizzietal., author = {Perez-Bosch Quesada, Emilio and Mahadevaiah, Mamathamba Kalishettyhalli and Rizzi, Tommaso and Wen, Jianan and Ulbricht, Markus and Krstic, Milos and Wenger, Christian and Perez, Eduardo}, title = {Experimental Assessment of Multilevel RRAM-based Vector-Matrix Multiplication Operations for In-Memory Computing}, series = {IEEE Transactions on Electron Devices}, volume = {70}, journal = {IEEE Transactions on Electron Devices}, number = {4}, issn = {0018-9383}, doi = {10.1109/TED.2023.3244509}, pages = {2009 -- 2014}, abstract = {Resistive random access memory (RRAM)-based hardware accelerators are playing an important role in the implementation of in-memory computing (IMC) systems for artificial intelligence applications. The latter heavily rely on vector-matrix multiplication (VMM) operations that can be efficiently boosted by RRAM devices. However, the stochastic nature of the RRAM technology is still challenging real hardware implementations. To study the accuracy degradation of consecutive VMM operations, in this work we programed two RRAM subarrays composed of 8x8 one-transistor-one-resistor (1T1R) cells following two different distributions of conductive levels. We analyze their robustness against 1000 identical consecutive VMM operations and monitor the inherent devices' nonidealities along the test. We finally quantize the accuracy loss of the operations in the digital domain and consider the trade-offs between linearly distributing the resistive states of the RRAM cells and their robustness against nonidealities for future implementation of IMC hardware systems.}, language = {en} } @inproceedings{SimevskiKraemerKrstic, author = {Simevski, Aleksandar and Kraemer, Rolf and Krstic, Milos}, title = {Low-Complexity Integrated Circuit Aging Monitor}, language = {en} } @inproceedings{SchrapeKrsticPhilippetal., author = {Schrape, Oliver and Krstic, Milos and Philipp, Gunnar and Winkler, Frank}, title = {A Digital Design Flow for Differential ECL High Speed Applications}, language = {en} } @inproceedings{KrsticFanGrassetal., author = {Krstic, Milos and Fan, X. and Grass, Eckhard and Strano, A. and Bertozzi, Davide and Heer, Ch. and Sanders, B. and Benini, L. and Kakooe, M. R.}, title = {Moonrake Chip - GALS Demonstrator in 40 nm CMOS Technology}, language = {en} } @inproceedings{FanKrsticWolfetal., author = {Fan, X. and Krstic, Milos and Wolf, Ch. and Grass, Eckhard}, title = {GALS Design for On-Chip Ground Bounce Suppression}, language = {en} } @inproceedings{GrassWinklerKrsticetal., author = {Grass, Eckhard and Winkler, F. and Krstic, Milos and Julius, A. and Stahl, C. and Piz, M.}, title = {Enhanced GALS Techniques for Datapath Applications}, language = {en} } @inproceedings{MaharatnaTroyaChinchillaKrsticetal., author = {Maharatna, Koushik and Troya Chinchilla, Alfonso Luis and Krstic, Milos and Grass, Eckhard}, title = {On the Implementation of a Low-Power IEEE 802.11a Compliant Viterbi Decoder}, language = {en} } @inproceedings{GrassHerzelPizetal., author = {Grass, Eckhard and Herzel, F. and Piz, M. and Schmalz, K. and Sun, Yaoming and Glisic, S. and Krstic, Milos and Tittelbach-Helmrich, Klaus and Ehrig, Marcus and Winkler, W. and Scheytt, J. Christoph and Kraemer, Rolf}, title = {60 GHz SiGe-BiCMOS Radio for OFDM Transmission}, language = {en} } @inproceedings{PizKrsticEhrigetal., author = {Piz, M. and Krstic, Milos and Ehrig, Marcus and Grass, Eckhard}, title = {An OFDM Baseband Receiver for Short-Range Communication at 60 GHz}, language = {en} } @misc{AndjelkovicChenSimevskietal., author = {Andjelkovic, Marko and Chen, Junchao and Simevski, Aleksandar and Stamenkovic, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {A Review of Particle Detectors for Space-Borne Self-Adaptive Fault Tolerant Systems}, series = {18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020}, journal = {18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020}, publisher = {IEEE}, isbn = {978-1-7281-9899-6}, issn = {2472-761X}, doi = {10.1109/EWDTS50664.2020.9225138}, language = {en} } @misc{GrassKrsticWinkler, author = {Grass, Eckhard and Krstic, Milos and Winkler, F.}, title = {GALS-Schaltung und Verfahren zum Betrieb einer GALS-Schaltung}, language = {de} } @misc{AndjelkovicLiStamenkovićetal., author = {Andjelkovic, Marko and Li, Yuanqing and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells}, series = {25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019}, journal = {25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019}, publisher = {IEEE}, isbn = {978-1-7281-2490-2}, issn = {1942-9401}, doi = {10.1109/IOLTS.2019.8854379}, pages = {4}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {SWIELD: An In Situ Approach for Adaptive Low Power and Error-Resilient Operation}, series = {17th IEEE East-West Design \& Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019}, journal = {17th IEEE East-West Design \& Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019}, publisher = {IEEE}, isbn = {978-1-7281-1003-5}, issn = {2472-761X}, doi = {10.1109/EWDTS.2019.8884428}, pages = {6}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study}, series = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, booktitle = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2437-1}, doi = {10.1109/ATS.2017.27}, pages = {78 -- 83}, language = {en} } @misc{VeleskiHuebnerKrsticetal., author = {Veleski, Mitko and H{\"u}bner, Michael and Krstic, Milos and Kraemer, Rolf}, title = {Design and implementation strategy of adaptive processor-based systems for error resilient and power-efficient operation}, series = {24th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS, April 7-9 2021}, journal = {24th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS, April 7-9 2021}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-6654-3595-6}, doi = {10.1109/DDECS52668.2021.9417023}, pages = {57 -- 62}, language = {en} }