@inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190106}, pages = {217 -- 220}, language = {en} } @inproceedings{AndjelkovicJagdholdKrsticetal., author = {Andjelkovic, Marko and Jagdhold, Ulrich and Krstic, Milos and Kraemer, Rolf}, title = {2D TCAD Simulation of Single Event Transients in 250 nm Bulk CMOS Technology}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {90 -- 96}, language = {en} } @inproceedings{BabicKrstic, author = {Babic, Milan and Krstic, Milos}, title = {A Substrate Noise Reduction Methodology Based on Power Domain Separation of GALS Subcomponents}, series = {27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS), September 25-27, 2017, Aristotle University Research Dissemination Center (KEDEA), Thessaloniki, Greece}, booktitle = {27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS), September 25-27, 2017, Aristotle University Research Dissemination Center (KEDEA), Thessaloniki, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-6462-5}, doi = {10.1109/PATMOS.2017.8106981}, pages = {6}, language = {en} } @inproceedings{BabicKrstic, author = {Babic, Milan and Krstic, Milos}, title = {GALS Methodology for Substrate Noise Reduction in BiCMOS Technologies}, series = {Proceedings, Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN), Tallinn, Estonia, 2015}, booktitle = {Proceedings, Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN), Tallinn, Estonia, 2015}, pages = {2}, language = {en} } @inproceedings{BabicKrstic, author = {Babic, Milan and Krstic, Milos}, title = {A Coarse Model for Estimation of Switching Noise Coupling in Lightly Doped Substrates}, series = {18th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Belgrade, Serbia, 2015}, booktitle = {18th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Belgrade, Serbia, 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6780-3}, pages = {217 -- 222}, language = {en} } @inproceedings{BabicFanKrstic, author = {Babic, Milan and Fan, Xin and Krstic, Milos}, title = {Frequency-Domain Modeling of Ground Bounce and Substrate Noise for Synchronous and GALS Systems}, series = {25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), 1-4 Sept. Salvador, Brazil 2015}, booktitle = {25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), 1-4 Sept. Salvador, Brazil 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-9419-2}, pages = {126 -- 132}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study}, series = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, booktitle = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2437-1}, doi = {10.1109/ATS.2017.27}, pages = {78 -- 83}, language = {en} } @inproceedings{AndjelkovicStamenkovićKrsticetal., author = {Andjelkovic, Marko and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {Impact of Resistive Open and Bridge Defects on the SET Robustness of CMOS Combinational Logic}, series = {IEEE East-West Design \& Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018}, booktitle = {IEEE East-West Design \& Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-5709-6}, doi = {10.1109/EWDTS.2018.8524748}, pages = {6}, language = {en} } @misc{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Study of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit}, series = {Microelectronics Reliability}, volume = {82}, journal = {Microelectronics Reliability}, issn = {0026-2714}, doi = {10.1016/j.microrel.2017.12.022}, pages = {100 -- 112}, language = {en} } @inproceedings{AndjelkovicBabicLietal., author = {Andjelkovic, Marko and Babic, Milan and Li, Yuanqing and Schrape, Oliver and Krstic, Milos and Kraemer, Rolf}, title = {Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates}, series = {25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018}, booktitle = {25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-9562-3}, doi = {10.1109/ICECS.2018.8617996}, pages = {361 -- 364}, language = {en} } @misc{SegabinazziFerreiraGeorgeChenetal., author = {Segabinazzi Ferreira, Raphael and George, Nevin and Chen, Junchao and H{\"u}bner, Michael and Krstic, Milos and Nolte, J{\"o}rg and Vierhaus, Heinrich Theodor}, title = {Configurable Fault Tolerant Circuits and System Level Integration for Self-Awareness}, series = {Proceedings of the Work in Progress Session held in connection with SEAA 2019, the 45th EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2019, the 22nd EUROMICRO Conference on Digital System Design}, journal = {Proceedings of the Work in Progress Session held in connection with SEAA 2019, the 45th EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2019, the 22nd EUROMICRO Conference on Digital System Design}, publisher = {SEA-Publications}, address = {Kallithea, Chalkidiki (Greece)}, isbn = {978-3-902457-54-7}, doi = {10.26127/BTUOpen-5050}, pages = {2}, abstract = {Scaling minimum features of ICs down to the 10nm- area and below has allowed high integration rates in electronics. Scaling at supply voltages of 1V and below also implies a rising level of stress which drives aging effects that reduce switching speed and the expected life time. Additionally, vulnerability from particle radiation is increased. Hence, fault detection and on- line correction become a must for many applications. However, not only fault tolerance but self-awareness becomes also an advantage. Provided that by being aware of its own healthy state allow optimized configurations regarding system operation modes and configurable hardware mechanism. This paper shows a preliminary work in a configurable circuit and explores its configuration possibilities when integrated into a complete system.}, language = {en} } @misc{AndjelkovicLiStamenkovićetal., author = {Andjelkovic, Marko and Li, Yuanqing and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells}, series = {25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019}, journal = {25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019}, publisher = {IEEE}, isbn = {978-1-7281-2490-2}, issn = {1942-9401}, doi = {10.1109/IOLTS.2019.8854379}, pages = {4}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {SWIELD: An In Situ Approach for Adaptive Low Power and Error-Resilient Operation}, series = {17th IEEE East-West Design \& Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019}, journal = {17th IEEE East-West Design \& Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019}, publisher = {IEEE}, isbn = {978-1-7281-1003-5}, issn = {2472-761X}, doi = {10.1109/EWDTS.2019.8884428}, pages = {6}, language = {en} } @misc{JenihhinHamdiouiSonzaReordaetal., author = {Jenihhin, Maksim and Hamdioui, Said and Sonza-Reorda, Matteo and Krstic, Milos and Langend{\"o}rfer, Peter and Sauer, Christian and Klotz, Anton and H{\"u}bner, Michael and Nolte, J{\"o}rg and Vierhaus, Heinrich Theodor and Selimis, Georgions and Alexandrescu, Dan and Taouil, Mottaqiallah and Schrijen, Geert-Jan and Sterpone, Luca and Squillero, Giovanni and Dyka, Zoya and Raik, Jaan}, title = {RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems}, series = {ArXiv.org}, journal = {ArXiv.org}, pages = {7}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {A Programmable Error-Predictive In-Situ Delay Monitor for Adaptive Low Power and Error-Resilient Complex System-On-Chip}, series = {9th Biannual European - Latin American Summer School on Design, Test and Reliability (BELAS 2019), Frankfurt/Oder}, journal = {9th Biannual European - Latin American Summer School on Design, Test and Reliability (BELAS 2019), Frankfurt/Oder}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {Programmable In-Situ Delay Monitor for Energy-Efficient and Resilient Complex SoC}, series = {Proc. 24th IEEE European Test Symposium: PhD Forum (ETS 2019)}, journal = {Proc. 24th IEEE European Test Symposium: PhD Forum (ETS 2019)}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {The Effects of Voltage Scaling on Reliability and Power Consumption in Multiprocessor Systems}, series = {Proc. 30. GI/GMM/ITG-Workshop Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen (TuZ 2018), 38 (2018)}, journal = {Proc. 30. GI/GMM/ITG-Workshop Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen (TuZ 2018), 38 (2018)}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {An Overview of Cross-Layer Resilience Design Methods}, series = {RESCUE 2017, Limassol}, journal = {RESCUE 2017, Limassol}, pages = {4}, language = {en} } @misc{AndjelkovicVeleskiChenetal., author = {Andjelkovic, Marko and Veleski, Mitko and Chen, Junchao and Simevski, Aleksandar and Krstic, Milos}, title = {A Particle Detector Based on Pulse Stretching Inverter Chain}, series = {26th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2019), Genova}, journal = {26th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2019), Genova}, isbn = {978-1-7281-0996-1}, doi = {10.1109/ICECS46596.2019.8964644}, pages = {4}, language = {en} } @misc{AndjelkovicChenSimevskietal., author = {Andjelkovic, Marko and Chen, Junchao and Simevski, Aleksandar and Stamenkovic, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {A Review of Particle Detectors for Space-Borne Self-Adaptive Fault Tolerant Systems}, series = {18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020}, journal = {18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020}, publisher = {IEEE}, isbn = {978-1-7281-9899-6}, issn = {2472-761X}, doi = {10.1109/EWDTS50664.2020.9225138}, language = {en} }