@inproceedings{KrsticFanBabicetal., author = {Krstic, Milos and Fan, Xin and Babic, Milan and Grass, Eckhard and Bjerregaard, T. and Yakovlev, A.}, title = {Reducing Switching Noise Effects by Advanced Clock Management}, series = {11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 4-8 July, St. Petersburg, Russia 2017}, booktitle = {11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 4-8 July, St. Petersburg, Russia 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2689-4}, pages = {3 -- 8}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {Erstellung eines Modells der kritischen Ladung zur Bewertung der Robustheit gegen{\"u}ber SETs und SEUs: Fallstudie Muller C-Element}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {17 -- 24}, language = {de} } @inproceedings{TroyaChinchillaMaharatnaKrsticetal., author = {Troya Chinchilla, Alfonso Luis and Maharatna, Koushik and Krstic, Milos and Grass, Eckhard and Kraemer, Rolf}, title = {OFDM Synchronizer Implementation for an IEEE 802.11a Compliant Modem}, language = {de} } @inproceedings{AndjelkovicJagdholdKrsticetal., author = {Andjelkovic, Marko and Jagdhold, Ulrich and Krstic, Milos and Kraemer, Rolf}, title = {2D TCAD Simulation of Single Event Transients in 250 nm Bulk CMOS Technology}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {90 -- 96}, language = {en} } @inproceedings{MaharatnaTroyaChinchillaKrsticetal., author = {Maharatna, Koushik and Troya Chinchilla, Alfonso Luis and Krstic, Milos and Grass, Eckhard and Jagdhold, Ulrich}, title = {A CORDIC Like Processor for Computation of Arctangent and Absolute Magnitude of a Vector}, language = {en} } @misc{PerezBoschQuesadaMahadevaiahRizzietal., author = {Perez-Bosch Quesada, Emilio and Mahadevaiah, Mamathamba Kalishettyhalli and Rizzi, Tommaso and Wen, Jianan and Ulbricht, Markus and Krstic, Milos and Wenger, Christian and Perez, Eduardo}, title = {Experimental Assessment of Multilevel RRAM-based Vector-Matrix Multiplication Operations for In-Memory Computing}, series = {IEEE Transactions on Electron Devices}, volume = {70}, journal = {IEEE Transactions on Electron Devices}, number = {4}, issn = {0018-9383}, doi = {10.1109/TED.2023.3244509}, pages = {2009 -- 2014}, abstract = {Resistive random access memory (RRAM)-based hardware accelerators are playing an important role in the implementation of in-memory computing (IMC) systems for artificial intelligence applications. The latter heavily rely on vector-matrix multiplication (VMM) operations that can be efficiently boosted by RRAM devices. However, the stochastic nature of the RRAM technology is still challenging real hardware implementations. To study the accuracy degradation of consecutive VMM operations, in this work we programed two RRAM subarrays composed of 8x8 one-transistor-one-resistor (1T1R) cells following two different distributions of conductive levels. We analyze their robustness against 1000 identical consecutive VMM operations and monitor the inherent devices' nonidealities along the test. We finally quantize the accuracy loss of the operations in the digital domain and consider the trade-offs between linearly distributing the resistive states of the RRAM cells and their robustness against nonidealities for future implementation of IMC hardware systems.}, language = {en} } @inproceedings{SimevskiKraemerKrstic, author = {Simevski, Aleksandar and Kraemer, Rolf and Krstic, Milos}, title = {Low-Complexity Integrated Circuit Aging Monitor}, language = {en} } @inproceedings{SchrapeKrsticPhilippetal., author = {Schrape, Oliver and Krstic, Milos and Philipp, Gunnar and Winkler, Frank}, title = {A Digital Design Flow for Differential ECL High Speed Applications}, language = {en} } @inproceedings{KrsticFanGrassetal., author = {Krstic, Milos and Fan, X. and Grass, Eckhard and Strano, A. and Bertozzi, Davide and Heer, Ch. and Sanders, B. and Benini, L. and Kakooe, M. R.}, title = {Moonrake Chip - GALS Demonstrator in 40 nm CMOS Technology}, language = {en} } @inproceedings{FanKrsticWolfetal., author = {Fan, X. and Krstic, Milos and Wolf, Ch. and Grass, Eckhard}, title = {GALS Design for On-Chip Ground Bounce Suppression}, language = {en} } @inproceedings{GrassWinklerKrsticetal., author = {Grass, Eckhard and Winkler, F. and Krstic, Milos and Julius, A. and Stahl, C. and Piz, M.}, title = {Enhanced GALS Techniques for Datapath Applications}, language = {en} } @inproceedings{MaharatnaTroyaChinchillaKrsticetal., author = {Maharatna, Koushik and Troya Chinchilla, Alfonso Luis and Krstic, Milos and Grass, Eckhard}, title = {On the Implementation of a Low-Power IEEE 802.11a Compliant Viterbi Decoder}, language = {en} } @inproceedings{GrassHerzelPizetal., author = {Grass, Eckhard and Herzel, F. and Piz, M. and Schmalz, K. and Sun, Yaoming and Glisic, S. and Krstic, Milos and Tittelbach-Helmrich, Klaus and Ehrig, Marcus and Winkler, W. and Scheytt, J. Christoph and Kraemer, Rolf}, title = {60 GHz SiGe-BiCMOS Radio for OFDM Transmission}, language = {en} } @inproceedings{PizKrsticEhrigetal., author = {Piz, M. and Krstic, Milos and Ehrig, Marcus and Grass, Eckhard}, title = {An OFDM Baseband Receiver for Short-Range Communication at 60 GHz}, language = {en} } @misc{AndjelkovicChenSimevskietal., author = {Andjelkovic, Marko and Chen, Junchao and Simevski, Aleksandar and Stamenkovic, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {A Review of Particle Detectors for Space-Borne Self-Adaptive Fault Tolerant Systems}, series = {18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020}, journal = {18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020}, publisher = {IEEE}, isbn = {978-1-7281-9899-6}, issn = {2472-761X}, doi = {10.1109/EWDTS50664.2020.9225138}, language = {en} } @misc{GrassKrsticWinkler, author = {Grass, Eckhard and Krstic, Milos and Winkler, F.}, title = {GALS-Schaltung und Verfahren zum Betrieb einer GALS-Schaltung}, language = {de} } @misc{AndjelkovicLiStamenkovićetal., author = {Andjelkovic, Marko and Li, Yuanqing and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells}, series = {25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019}, journal = {25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019}, publisher = {IEEE}, isbn = {978-1-7281-2490-2}, issn = {1942-9401}, doi = {10.1109/IOLTS.2019.8854379}, pages = {4}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {SWIELD: An In Situ Approach for Adaptive Low Power and Error-Resilient Operation}, series = {17th IEEE East-West Design \& Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019}, journal = {17th IEEE East-West Design \& Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019}, publisher = {IEEE}, isbn = {978-1-7281-1003-5}, issn = {2472-761X}, doi = {10.1109/EWDTS.2019.8884428}, pages = {6}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study}, series = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, booktitle = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2437-1}, doi = {10.1109/ATS.2017.27}, pages = {78 -- 83}, language = {en} } @misc{VeleskiHuebnerKrsticetal., author = {Veleski, Mitko and H{\"u}bner, Michael and Krstic, Milos and Kraemer, Rolf}, title = {Design and implementation strategy of adaptive processor-based systems for error resilient and power-efficient operation}, series = {24th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS, April 7-9 2021}, journal = {24th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS, April 7-9 2021}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-6654-3595-6}, doi = {10.1109/DDECS52668.2021.9417023}, pages = {57 -- 62}, language = {en} } @misc{VeleskiHuebnerKrsticetal., author = {Veleski, Mitko and H{\"u}bner, Michael and Krstic, Milos and Kraemer, Rolf}, title = {Towards Error Resilient and Power-Efficient Adaptive Multiprocessor System using Highly Configurable and Flexible Cross-Layer Framework}, series = {IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), IOLTS 2021, June 28-30, 2021}, journal = {IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), IOLTS 2021, June 28-30, 2021}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-6654-3370-9}, doi = {10.1109/IOLTS52814.2021.9486695}, pages = {1 -- 7}, language = {en} } @misc{KrsticStojčevDjordjevicetal., author = {Krstic, Milos and Stojčev, M. K. and Djordjevic, Goran L. and Andrejic, I. D.}, title = {A Mid Value-Select Voter}, series = {Microelectronics Reliability}, volume = {45}, journal = {Microelectronics Reliability}, number = {3/4}, issn = {0026-2714}, doi = {10.1016/j.microrel.2004.07.006}, pages = {733 -- 738}, language = {en} } @misc{NikolicDjordjevicKrsticetal., author = {Nikolic, Tatjana and Djordjevic, Goran L. and Krstic, Milos and Stojcev, M.}, title = {Data Transfers over Peripheral Bus Using CDMA Technique}, language = {en} } @article{KrsticMaharatnaTroyaChinchillaetal., author = {Krstic, Milos and Maharatna, Koushik and Troya Chinchilla, Alfonso Luis and Grass, Eckhard and Jagdhold, Ulrich}, title = {Baseband Processor for IEEE 802.11a Standard with embedded BIST}, language = {en} } @article{KrsticGrassStahletal., author = {Krstic, Milos and Grass, Eckhard and Stahl, C. and Piz, M.}, title = {System Integration by Request-driven GALS Design}, language = {en} } @article{TroyaChinchillaMaharatnaKrsticetal., author = {Troya Chinchilla, Alfonso Luis and Maharatna, Koushik and Krstic, Milos and Grass, Eckhard and Jagdhold, Ulrich and Kraemer, Rolf}, title = {Efficient Inner Receiver Design for OFDM-Based WLAN Systems: Algorithm and Architecture}, language = {en} } @article{TroyaChinchillaMaharatnaKrsticetal., author = {Troya Chinchilla, Alfonso Luis and Maharatna, Koushik and Krstic, Milos and Grass, Eckhard and Jagdhold, Ulrich and Kraemer, Rolf}, title = {Low-Power VLSI Implementation of the Inner Receiver for OFDM-Based WLAN Systems}, language = {en} } @article{KrsticGrassGuerkaynaketal., author = {Krstic, Milos and Grass, Eckhard and G{\"u}rkaynak, F. and Vivet, P.}, title = {Globally Asynchronous, Locally Synchronous Circuits: Overview \& Outlook}, language = {en} } @article{KrsticGrassHeer, author = {Krstic, Milos and Grass, Eckhard and Heer, Ch.}, title = {A GALS Approach to Improve System Integration}, language = {en} } @book{FanKrsticGrass, author = {Fan, X. and Krstic, Milos and Grass, Eckhard}, title = {Improvements in Pausible Clocking Scheme for High-Throughput and High-Reliability GALS Systems Design}, publisher = {Springer}, language = {en} } @misc{StamenkovićKraemerKrsticetal., author = {Stamenković, Zoran and Kraemer, Rolf and Krstic, Milos and Tittelbach-Helmrich, Klaus and Ignacio, S. and Javier, V. and Jesus, P. and Jesus, I.}, title = {MIMO Transmission in IEEE 802.11 WLAN Systems}, language = {en} } @misc{KrsticFanGrass, author = {Krstic, Milos and Fan, X. and Grass, Eckhard}, title = {GALS Circuit Block and GALS Circuit Device Suitable for Bursty Data Transfer}, language = {en} } @misc{FanGrassKrstic, author = {Fan, X. and Grass, Eckhard and Krstic, Milos}, title = {Aussetzbarer Taktgenerator}, language = {en} } @misc{KrsticFanGrass, author = {Krstic, Milos and Fan, X. and Grass, Eckhard}, title = {GALS Circuit Block and GALS Circuit Device Suitable for Bursty Data Transfer}, language = {en} } @phdthesis{Krstic, author = {Krstic, Milos}, title = {Request-driven GALS technique for datapath architectures}, url = {http://nbn-resolving.de/urn:nbn:de:kobv:co1-000000888}, language = {en} } @misc{GrassKrstic, author = {Grass, Eckhard and Krstic, Milos}, title = {Asynchrone H{\"u}llschaltung f{\"u}r eine global asynchrone, lokale synchrone (GALS) Schaltung}, language = {en} } @techreport{TittelbachHelmrichKrsticFiebigetal., author = {Tittelbach-Helmrich, Klaus and Krstic, Milos and Fiebig, Norbert and Methfessel, Michael}, title = {Test Report for WLAN Access Point Chipset, Deliverable D5.2}, language = {en} } @inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Modeling and Simulation of the Single Event Transients at the Circuit Level}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190065}, pages = {35 -- 44}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {An Analysis of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit}, series = {20thInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), 19-21 April 2017 Dresden}, booktitle = {20thInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), 19-21 April 2017 Dresden}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0472-4}, pages = {6}, language = {en} } @inproceedings{AndjelkovicPetrovicNenadovicetal., author = {Andjelkovic, Marko and Petrovic, Vladimir and Nenadovic, Miljana and Breitenreiter, Anselm and Krstic, Milos and Kraemer, Rolf}, title = {Design of an On-Chip System for the SET Pulse Width Measurement}, series = {Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017}, booktitle = {Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2146-2}, pages = {111 -- 118}, language = {en} } @inproceedings{AndjelkovicBabicLietal., author = {Andjelkovic, Marko and Babic, Milan and Li, Yuanqing and Schrape, Oliver and Krstic, Milos and Kraemer, Rolf}, title = {Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates}, series = {25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018}, booktitle = {25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-9562-3}, doi = {10.1109/ICECS.2018.8617996}, pages = {361 -- 364}, language = {en} } @inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Current Models for the Circuit-level Simulations of Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, pages = {S. 184}, language = {en} } @inproceedings{AndjelkovicStamenkovićKrsticetal., author = {Andjelkovic, Marko and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {Impact of Resistive Open and Bridge Defects on the SET Robustness of CMOS Combinational Logic}, series = {IEEE East-West Design \& Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018}, booktitle = {IEEE East-West Design \& Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-5709-6}, doi = {10.1109/EWDTS.2018.8524748}, pages = {6}, language = {en} } @inproceedings{AndjelkovicNenadovicPetrovicetal., author = {Andjelkovic, Marko and Nenadovic, Miljana and Petrovic, Vladimir and Krstic, Milos and Kraemer, Rolf}, title = {Evaluation of the Pulse Stretcher for Detection of Very Short Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, pages = {S. 214}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190106}, pages = {217 -- 220}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Assessment of the Amplitude-duration Criterion for SET Robusness Evaluation}, series = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, booktitle = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0352-9}, language = {en} }