@misc{DasKediaZuoetal., author = {Das, Chittaranjan and Kedia, Mayank and Zuo, Weiwei and Mortan, Claudiu and Kot, MaƂgorzata and Flege, Jan Ingo and Saliba, Michael}, title = {Band Bending at Hole Transporting Layer-Perovskite Interfaces in n-i-p and in p-i-n Architecture}, series = {Solar RRL}, volume = {6}, journal = {Solar RRL}, number = {9}, issn = {2367-198X}, doi = {10.1002/solr.202200348}, abstract = {Interfaces between hybrid perovskite absorber and its adjacent charge-transporting layers are of high importance for solar cells performance. Understanding their chemical and electronic properties is a key step in designing efficient and stable perovskite solar cells. In this work, the tapered cross-section photoemission spectroscopy (TCS-PES) method is used to study the methylammonium lead iodide (CH3NH3PbI3) (MAPI)-based solar cells in two configurations, that is, in an inverted p-i-n and in a classical n-i-p architecture. It is revealed in the results that the MAPI film deposited once on the n-type TiO2 and once on the p-type NiOx substrates is neither an intrinsic semiconductor nor adapts to the dopant nature of the substrate underneath, but it is heavily n-type doped on both substrates. In addition to that, the TCS-PES results identify that the band bending between the MAPI film and the hole transporting layer (HTL) layer depends on the perovskite solar cells architecture. In particular, a band bending on the HTL side in the n-i-p and at the MAPI in the p-i-n architecture is found. The flat band of NiOx at the NiOx/MAPI interface can be explained by the Fermi level pinning of the NiOx at the interface.}, language = {en} }