@inproceedings{PflanzWaltherVierhaus, author = {Pflanz, Matthias and Walther, Karsten and Vierhaus, Heinrich Theodor}, title = {On-Line Built-In Self-Check Techniken f{\"u}r zuverl{\"a}ssige eingebettete Prozessoren mit hoher Konplexit{\"a}t}, editor = {Alt, J{\"u}rgen}, language = {de} } @inproceedings{PflanzWaltherVierhaus, author = {Pflanz, Matthias and Walther, Karsten and Vierhaus, Heinrich Theodor}, title = {On-line Error Detection Techniques for Depandable Embedded Processors with High Complexity}, series = {Proceedings, Seventh International On-Line Testing Workshop, 9 - 11 July 2001, Giardini Naxos, Taormina, Italy}, booktitle = {Proceedings, Seventh International On-Line Testing Workshop, 9 - 11 July 2001, Giardini Naxos, Taormina, Italy}, isbn = {0-7695-1290-9}, pages = {51 -- 53}, language = {en} } @misc{PflanzVierhaus, author = {Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {Online Check and Recovery Techniques for Depandable Embedded Processors}, series = {IEEE micro}, volume = {21}, journal = {IEEE micro}, number = {5}, issn = {0272-1732}, pages = {24 -- 40}, language = {en} } @inproceedings{PflanzWaltherGalkeetal., author = {Pflanz, Matthias and Walther, Karsten and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check}, series = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, booktitle = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {0-7695-1641-6}, pages = {69 -- 73}, language = {en} } @inproceedings{GalkePflanzVierhaus, author = {Galke, Christian and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {On-Line Detection and Compensation of Transient Errors in Processor Pipeline Structurs}, series = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, booktitle = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {0-7695-1641-6}, pages = {S. 178}, language = {en} } @inproceedings{GalkeMohauptPflanzetal., author = {Galke, Christian and Mohaupt, Thomas and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {Hardware/Software Based Test Techniques for Systems on a Chip with Embedded Processors}, issn = {1437-7969}, language = {en} } @inproceedings{GalkePflanzHennigetal., author = {Galke, Christian and Pflanz, Matthias and Hennig, Hardy and Vierhaus, Heinrich Theodor}, title = {Hardware/Software basierter Selbsttest f{\"u}r System on a Chip (SOCs) mit eingebetteten Prozessoren}, editor = {Wagner, Ralph}, language = {de} } @phdthesis{Pflanz, author = {Pflanz, Matthias}, title = {Online error detection and fast recover techniques for dependable embedded processors}, publisher = {Springer}, address = {Berlin [u.a.]}, isbn = {3-540-43318-X}, pages = {XII, 126}, language = {en} } @inproceedings{RoussellePflanzBehlingetal., author = {Rousselle, Christian and Pflanz, Matthias and Behling, A. and Mohaupt, Thomas and Vierhaus, Heinrich Theodor}, title = {A Register Transfer Fault Simulator for Permanent and Transient Faults in Embedded Processors}, series = {Proceedings, Design, Automation and Test in Europe, Conference and Exhibition 2001, Munich, Germany, March 13 - 16, 2001}, booktitle = {Proceedings, Design, Automation and Test in Europe, Conference and Exhibition 2001, Munich, Germany, March 13 - 16, 2001}, isbn = {0-7695-0993-2}, pages = {S. 811}, language = {en} } @inproceedings{GalkePflanzVierhaus, author = {Galke, Christian and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {A Test Processor Concept for Systems-on-a-Chip}, language = {en} } @inproceedings{GalkePflanzVierhaus, author = {Galke, Christian and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {Detection and Compensation of Transient Errors in Processor Structures}, language = {en} } @misc{VierhausPflanzMohaupt, author = {Vierhaus, Heinrich Theodor and Pflanz, Matthias and Mohaupt, Thomas}, title = {Design and Architecture of Dependable Computer-Based Systems}, language = {en} } @inproceedings{PflanzGalkeVierhaus, author = {Pflanz, Matthias and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {A New Method for On-Line State Machine Observation for Embedded Microprocessors}, language = {en} } @inproceedings{KrautzPflanzVierhausetal., author = {Krautz, U. and Pflanz, Matthias and Vierhaus, Heinrich Theodor and Jacobi, C. and Tast, H. W.}, title = {Evaluating Coverage of Error Detection Logic for Soft Errors using Formal Methods}, series = {Design, automation and test in Europe, Munich, Germany, March 6 - 10, 2006, proceedings, vol. 1}, booktitle = {Design, automation and test in Europe, Munich, Germany, March 6 - 10, 2006, proceedings, vol. 1}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {3-9810801-1-4}, pages = {176 -- 181}, language = {en} } @inproceedings{PflanzVierhaus, author = {Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {Control Signal Protection - A New Challenge for High Performance Processors}, series = {Proceedings, 9th IEEE International On-Line Testing Symposium, IOLTS 2003, 7 - 9 July 2003, Kos International Convention Center, Kos Island, Greece}, booktitle = {Proceedings, 9th IEEE International On-Line Testing Symposium, IOLTS 2003, 7 - 9 July 2003, Kos International Convention Center, Kos Island, Greece}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {0-7695-1968-7}, pages = {173 -- 177}, language = {en} }