@misc{FriedrichHenkelRichteretal., author = {Friedrich, Daniel and Henkel, Karsten and Richter, Matthias and Schmeißer, Dieter}, title = {Fullerenol as probed by Synchrotron X-Ray Photoemission and Absorption Spectroscopy}, language = {en} } @inproceedings{LenkDoernerRumiantsevetal., author = {Lenk, Friedrich and D{\"o}rner, Ralf and Rumiantsev, Andrej and Rudolph, Matthias}, title = {Calibration Residual Error Propagation Analysis Using Conformal Mapping}, series = {77th ARFTG Microwave Measurement Conference (ARFTG 2011), Baltimore, Maryland, USA, 10 June 2011}, booktitle = {77th ARFTG Microwave Measurement Conference (ARFTG 2011), Baltimore, Maryland, USA, 10 June 2011}, publisher = {Piscataway, NJ}, address = {IEEE}, isbn = {978-1-61284-959-1}, pages = {Paper 2-4}, language = {en} } @misc{RichterFriedrichSchmeisser, author = {Richter, Matthias and Friedrich, Daniel and Schmeißer, Dieter}, title = {Valence and Conduction band states of PCBM as probed by photoelectron spectroscopy at resonant excitation}, series = {BioNanoScience}, volume = {2}, journal = {BioNanoScience}, number = {1}, issn = {2191-1630}, pages = {59 -- 65}, language = {en} } @inproceedings{OsterriederRichterFriedrich, author = {Osterrieder, Peter and Richter, Stefan and Friedrich, Matthias}, title = {Lateral buckling of continuous steel beams with hinges}, language = {en} } @misc{MuellerRichterFriedrichetal., author = {M{\"u}ller, Klaus and Richter, Matthias and Friedrich, Daniel and Paloumpa, Ioanna and Kramm, Ulrike Ingrid and Schmeißer, Dieter}, title = {Spectroscopic characterization of Cobalt-Phthalocyanine electrocatalysts for fuel cell applications}, series = {Solid State Ionics}, journal = {Solid State Ionics}, number = {216}, issn = {1872-7689}, doi = {10.1016/j.ssi.2011.12.013}, pages = {78 -- 82}, abstract = {For polymer-electrolyte-membrane fuel cells (PEM-FC), platinumcatalysts on carbon based substrates are state of the art, due to high electrochemical activity and chemical stability in acid electrolytes. High costs of platinum force investigations of alternative catalysts. With respect to the oxygen reduction reaction, possible candidates are transition metal (TM) complexes like TM-porphyrines or TM-phthalocyanines. Pyrolysis on carbon based substrates improves the catalytic activity. Highest activities were found for Fe or Co as transition metal centers. We present results of the pyrolysis of Co-phthalocyanine (CoPc) on carbon black. Besides an investigation of morphology by scanning electron microscopy (SEM) and chemical composition by energy dispersive X-ray spectroscopy (EDX) and X-ray photoelectron spectroscopy (XPS) during pyrolysis, we present a near edge X-ray absorption fine structure (NEXAFS) study of the chemical composition for the related annealing steps. This investigation is accompanied by an electrochemical characterization of the catalytic activity and selectivity. The XPS and NEXAFS data indicate a decomposition of the CoN4(chelate-) complex during pyrolysis. The N1s data for 800 °C show graphite-like, formally pyrrolic and pyridinic like features, without any significant contri-bution of Co. The Co2p data for both, XPS and NEXAFS are dominated by CoO/Co2O3. It can be concluded that during the pyrolysis cobalt particles are formed by the disintegration of CoN4-centers, after pyrolysis these par-ticles become oxidized upon contact with air.}, language = {en} } @misc{RichterPaloumpaFriedrichetal., author = {Richter, Matthias and Paloumpa, Ioanna and Friedrich, Daniel and Schmeißer, Dieter}, title = {Multiple Auger Decay At Resonant Photo-Excitation In Carbon Thin Films}, series = {ECS Transactions}, volume = {50}, journal = {ECS Transactions}, number = {20}, doi = {10.1149/05020.0009ecst}, pages = {9 -- 21}, abstract = {We use resonant photoemission at the C1s edge to study the electronic structure of HOPG, graphene flakes and monolayer graphene. We find remarkable differences in the profile of the Auger decay channels, which we attribute to an additional multiple-Auger with a three-hole final state. A prerequisite for the appearance of this decay mechanism is the existence of localized excitonic states, which cause the appearance of the multiple Auger decay. We use those effects to identify the existence and the quantity of such defect states within the π*-band regime in carbon thin films, because the intensity of the three-hole Auger decay is varying with the defect density of the carbon films. We find that the appearance of the multiple Auger decay is different for multilayer and monolayer graphene. In particular the interaction of impurities leads to broadening of the C1s core levels. The three-hole Auger decay spectroscopy is a new method to detect such contaminations with a high sensitivity.}, language = {en} } @inproceedings{RichterFriedrichSchmeisser, author = {Richter, Matthias and Friedrich, Daniel and Schmeißer, Dieter}, title = {Multiple Auger decay at resonant photo-excitation in carbon thin films}, series = {Meeting Abstracts-Electrochemical Society, Pacific Rim Meeting on Electrochemical and Solid-State Science, Honolulu, 2012}, booktitle = {Meeting Abstracts-Electrochemical Society, Pacific Rim Meeting on Electrochemical and Solid-State Science, Honolulu, 2012}, publisher = {The Electrochemical Society}, pages = {3509}, language = {en} } @misc{RichterFriedrichSchmeisser, author = {Richter, Matthias and Friedrich, Daniel and Schmeißer, Dieter}, title = {Interlayer-exciton mediated three-hole-Auger-decay in the pi-band of highly oriented pyrolytic graphite}, series = {Physica E}, volume = {Vol. 56}, journal = {Physica E}, issn = {1386-9477}, doi = {10.1016/j.physe.2013.01.015}, pages = {441 -- 446}, abstract = {Resonant photoemission spectroscopy(resPES) is used to probe the occupied pi- and unoccupied pi*-bands of carbon thin films with particular focus on the Auger decay. Highly Oriented Pyrolytic Graphite (HOPG) is studied at the C1s edge. We find strong resonant features at 285.5 eV and 292 eV in the resPES diagram. The normal two-hole Auger decay proceeds under constant kinetic energy (451)only in the sigma*-region. In the pi*-region, however, it proceeds under 67.5° in terms of a Ebind(w) diagram. We attribute this to a multiple Auger decay with a net three hole final state. For this novel decay process we propose a model.We discuss the long lifetime of the first resonant excitation and conclude that it arises from the strong excitonic character of the first resonant state. We use HOPG as a reference system and suggest that this novel process is a tool to identify interlayer-substrate interaction of the carbon layers involved.}, language = {en} } @inproceedings{LenkSchottHilsenbecketal., author = {Lenk, Friedrich and Schott, Matthias and Hilsenbeck, Jochen and Heinrich, Wolfgang}, title = {Low phase-noise GaAs-HBT monolithic W-band oscillator}, series = {34th European Microwave Conference, Tuesday 12th, Wednesday 13th and Thursday 14th October}, booktitle = {34th European Microwave Conference, Tuesday 12th, Wednesday 13th and Thursday 14th October}, publisher = {London}, address = {Horizon House Publ.}, isbn = {1-58053-992-0}, pages = {897 -- 900}, language = {en} } @inproceedings{SchottLenkHeymann, author = {Schott, Matthias and Lenk, Friedrich and Heymann, Peter}, title = {On the load-pull effect in MMIC oscillator measurements}, series = {33rd European Microwave Conference, 7 - 9th October 2003, ICM, Munich, Germany, Vol. 1}, booktitle = {33rd European Microwave Conference, 7 - 9th October 2003, ICM, Munich, Germany, Vol. 1}, publisher = {London}, address = {Korizon House Publ.}, isbn = {1-58053-834-7}, doi = {10.1109/EUMC.2003.1262295}, pages = {367 -- 370}, abstract = {Low phase-noise MMIC oscillators are key components for microwave and nun-wave systems. As a consequence, phase-noise measurements of these circuits have become a subject of growing interest and importance. This paper demonstrates that MMIC oscillator circuits with their relatively low Q factors are prone to specific measurement errors. Caused by a load-pull effect, the measurement system can become part of the oscillator, which yields phase-noise data significantly below reality. Special care has to be taken in order to avoid such phenomena.}, language = {en} } @inproceedings{LenkSchottHeinrich, author = {Lenk, Friedrich and Schott, Matthias and Heinrich, Wolfgang}, title = {Modeling and Measurement of Phase Noise in GaAs HBT Ka-Band Oscillators}, series = {31st European Microwave Conference, 2001, 24 - 26 Sept. 2001}, booktitle = {31st European Microwave Conference, 2001, 24 - 26 Sept. 2001}, publisher = {Microwave Engineering Europe}, address = {London}, doi = {10.1109/EUMA.2001.339168}, pages = {1 -- 4}, abstract = {Accurate oscillator phase-noise simulation is a key problem in MMIC design, which is not solved satisfactory so far and needs further investigation. In this paper, a Ka-band MMIC oscillator with GaInP/GaAs HBT and on-chip resonator is treated as an example. Measured phase noise reaches -90 dBc/Hz and below at 100 kHz offset. To evaluate phase-noise prediction, the circuit is simulated using different commercial simulation tools and HBT models. Considerable differences in simulation results are observed.}, language = {en} } @inproceedings{SchottKuhnertLenketal., author = {Schott, Matthias and Kuhnert, Holger and Lenk, Friedrich and Hilsenbeck, Jochen and W{\"u}rfl, Joachim and Heinrich, Wolfgang}, title = {38 GHz push-push GaAs-HBT MMIC oscillator}, series = {2002 IEEE MTT-S International Microwave Symposium digest, June 2 - 7, 2002, Washington State Convention \& Trade Center, Seattle, Washington, vol. 2}, booktitle = {2002 IEEE MTT-S International Microwave Symposium digest, June 2 - 7, 2002, Washington State Convention \& Trade Center, Seattle, Washington, vol. 2}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {0-7803-7239-5}, doi = {10.1109/MWSYM.2002.1011761}, pages = {839 -- 842}, abstract = {Two differential coplanar MMIC HBT oscillators are presented, a fixed frequency and a VCO version. They provide single-ended output at the second harmonic at 38 GHz as well as differential output at 19 GHz. The oscillators show excellent phase noise performance, the fixed-frequency type reaches -95 dBc/Hz at the fundamental frequency and -89 dBc/Hz at the second harmonic, at 100 kHz offset.}, language = {en} }