@inproceedings{KittlerArguirovSchmidetal., author = {Kittler, Martin and Arguirov, Tzanimir V. and Schmid, Reiner P. and Seifert, Winfried}, title = {Photoluminescence and EBIC for Process Control and Failure Analysis in Si-Based Photovoltaics}, series = {ISTFA 2010, conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010}, booktitle = {ISTFA 2010, conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010}, publisher = {ASM International Materials Park}, address = {Texas, USA}, isbn = {978-1-61503-041-5}, pages = {137 -- 142}, language = {en} }