@misc{TabattJelonekSchoelzeletal., author = {Tabatt, Peter and Jelonek, Jonas and Sch{\"o}lzel, Mario and Lehniger, Kai and Langend{\"o}rfer, Peter}, title = {Code Mutation as a Mean Against ROP Attacks for Embedded Systems}, series = {11th Mediterranean Conference on Embedded Computing (MECO 2022), Budva, Montenegro, 07-10 June 2022}, journal = {11th Mediterranean Conference on Embedded Computing (MECO 2022), Budva, Montenegro, 07-10 June 2022}, isbn = {978-1-6654-6828-2}, issn = {2637-9511}, doi = {10.1109/MECO55406.2022.9797185}, pages = {4}, language = {en} } @inproceedings{SkoncejMuehlbauerSchoelzel, author = {Skoncej, Patryk and M{\"u}hlbauer, Felix and Sch{\"o}lzel, Mario}, title = {Softwarebasierte Selbstreparatur von Flash-Speichern f{\"u}r fehlertolerante mikrocontroller-basierte Systeme}, series = {Informatik 2015, Tagung vom 28. September - 2. Oktober 2015 in Cottbus}, booktitle = {Informatik 2015, Tagung vom 28. September - 2. Oktober 2015 in Cottbus}, editor = {Cunningham, Douglas W. and Hofstedt, Petra and Meer, Klaus and Schmitt, Ingo}, publisher = {Gesellschaft f{\"u}r Informatik e.V.}, address = {Bonn}, isbn = {978-3-88579-640-4}, pages = {1461 -- 1473}, language = {de} } @inproceedings{SchoelzelKoalMuelleretal., author = {Sch{\"o}lzel, Mario and Koal, Tobias and M{\"u}ller, Sebastian and Scharoba, Stefan and R{\"o}der, Stefanie and Vierhaus, Heinrich Theodor}, title = {A Comprehensive Software-Based Self-Test and Self-Repair Method for Statically Scheduled Superscalar Processors}, series = {17th IEEE Latin-American Test Symposium - LATS 2016}, booktitle = {17th IEEE Latin-American Test Symposium - LATS 2016}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-1331-9}, pages = {33 -- 38}, language = {en} } @inproceedings{KoalEggersgluessSchoelzel, author = {Koal, Tobias and Eggersgl{\"u}ß, S. and Sch{\"o}lzel, Mario}, title = {Erzeugung diagnostischer Testmuster unter komplexen Contraints}, series = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 27. GI/GMM/ITG-Workshop, 1.-3. M{\"a}rz 2015,}, booktitle = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 27. GI/GMM/ITG-Workshop, 1.-3. M{\"a}rz 2015,}, publisher = {Robert Bosch GmbH}, address = {Reutlingen}, language = {de} } @techreport{HenkelPaloumpaOpreaetal., author = {Henkel, Karsten and Paloumpa, Ioanna and Oprea, A. and Appel, G{\"u}nter and Schmeißer, Dieter and Frandsen, W. and Sch{\"o}lzel, Mario}, title = {Entwicklung von Sensoren mit Elektroden aus leitf{\"a}higen Polymeren}, language = {de} } @inproceedings{MuellerKoalSchoelzeletal., author = {M{\"u}ller, Sebastian and Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Timing for Virtual TMR in Logic Circuits}, series = {IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014}, booktitle = {IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014}, isbn = {978-1-4799-5324-0}, language = {en} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Combining Fault Tolerance and Self Repair at Minimum Cost in Power and Hardware}, series = {IEEE International Symposium DDECS 2014, Warschau}, booktitle = {IEEE International Symposium DDECS 2014, Warschau}, publisher = {IEEE CS Press}, isbn = {978-1-4799-4560-3}, pages = {153 -- 159}, language = {en} } @inproceedings{UrbanLehnigerHeyneetal., author = {Urban, Roberto and Lehniger, Kai and Heyne, Maximilian and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Vergleich der Beschreibung und Simulation einer Befehlssatzarchitektur in LISA und CoMet}, series = {MBMV 2014, B{\"o}blingen, Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen}, booktitle = {MBMV 2014, B{\"o}blingen, Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen}, publisher = {Cuvillier Verlag}, address = {G{\"o}ttingen}, isbn = {978-3-95404-637-9}, pages = {101 -- 112}, language = {de} } @inproceedings{SchoelzelPawlowskiDabrowski, author = {Sch{\"o}lzel, Mario and Pawlowski, Pawel and Dabrowski, Adam}, title = {Self Repair by Program Reconfiguration in VLIW Processor Architectures}, series = {Design and test technology for dependable systems-on-chip}, booktitle = {Design and test technology for dependable systems-on-chip}, publisher = {Information Science Reference}, address = {Hershay, Pa. [u.a.]}, isbn = {978-1-6096-0212-3}, pages = {241 -- 266}, language = {en} } @book{VierhausSteiningerPawlaketal., author = {Vierhaus, Heinrich Theodor and Steininger, Andreas and Pawlak, A. and Kraemer, Rolf and Sch{\"o}lzel, Mario and Raik, Jaan}, title = {Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems}, publisher = {Piscataway : IEEE, 2011}, isbn = {978-1-4244-9753-9}, language = {en} }