@inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Globale Registerallokation f{\"u}r irregul{\"a}re Registerarchitekturen durch Graphf{\"a}rbung}, series = {Informatiktage 2001, fachwissenschaftlicher Informatik-Kongreß, 9. und 10. November 2001 im Neuen Kloster Bad Schussenried}, booktitle = {Informatiktage 2001, fachwissenschaftlicher Informatik-Kongreß, 9. und 10. November 2001 im Neuen Kloster Bad Schussenried}, publisher = {Konradin-Verl. Kohlhammer}, address = {Leinfelden-Echterdingen}, language = {de} } @inproceedings{SchoelzelBachmannVierhaus, author = {Sch{\"o}lzel, Mario and Bachmann, Peter and Vierhaus, Heinrich Theodor}, title = {Application Specific Processor Design for Digital Signal Processing}, series = {Signal processing '2004, workshop proceedings, Poznan, 24th September 2004}, booktitle = {Signal processing '2004, workshop proceedings, Poznan, 24th September 2004}, editor = {Dabrowski, Adam}, publisher = {Poznan Univ. of Technology}, address = {Poznan}, isbn = {83-913251-5-6}, pages = {7 -- 15}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {HW / SW Co-Detection of Transient and Permanent Faults with Fast Recovery in Statically Scheduled Data Paths}, series = {2010 Design, Automation \& Test in Europe Conference \& Exhibition, DATE 2010, Dresden, Germany, 8 - 12 March 2010}, booktitle = {2010 Design, Automation \& Test in Europe Conference \& Exhibition, DATE 2010, Dresden, Germany, 8 - 12 March 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4244-7054-9}, pages = {723 -- 728}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Software-Based Self-Repair of Statically Scheduled Superscalar Data Paths}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {M{\"o}glichkeiten und Grenzen der Software-basierten Selbstreparatur in statisch geplanten superskalaren Prozessorarchitekturen}, language = {de} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Time-Constrained Clustering for DSE of Clustered VLIW-ASP}, series = {2007 Design, Automation \& Test in Europe Conference \& Exhibition, Nice, France, 16 - 20 April 2007}, booktitle = {2007 Design, Automation \& Test in Europe Conference \& Exhibition, Nice, France, 16 - 20 April 2007}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {978-3-9810801-2-4}, pages = {467 -- 472}, language = {en} } @inproceedings{PawlowskiSchoelzel, author = {Pawlowski, P. and Sch{\"o}lzel, Mario}, title = {A Case-Study for Built-In-Self-Repair in Application Specific Processors By Decreasing the Arithmetic Accuracy}, language = {de} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Synthesis of Application Specific Processors - A Look at High-Level-approaches for Developing Application Specific Processors}, language = {en} } @inproceedings{SchoelzelBachmann, author = {Sch{\"o}lzel, Mario and Bachmann, Peter}, title = {Durchg{\"a}ngiger automatisierter Entwurf von der Prozessor-Architektur bis zur Anwendungs-Software}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), Ehrenkolloquium f{\"u}r Prof. Dr.-Ing. G{\"u}nter Elst, 10. - 11. Mai 2006}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), Ehrenkolloquium f{\"u}r Prof. Dr.-Ing. G{\"u}nter Elst, 10. - 11. Mai 2006}, publisher = {Fraunhofer-Institut}, address = {Dresden}, pages = {19 -- 24}, language = {de} } @inproceedings{HeinigSchoelzel, author = {Heinig, Andy and Sch{\"o}lzel, Mario}, title = {Zeitbeschr{\"a}nkte Clusterung zur Design-Space-Exploration geclusterter VLIW-Prozessoren}, series = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 9. ITG/GI/GMM Workshop, 20. - 22. Februar 2006 in Dresden}, booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 9. ITG/GI/GMM Workshop, 20. - 22. Februar 2006 in Dresden}, publisher = {Fraunhofer-Institut f{\"u}r Integrierte Schaltungen, Außenstelle Entwurfsautomatisierung}, address = {Dresden}, isbn = {3-9810287-1-6}, pages = {319 -- 328}, language = {de} } @inproceedings{ScholzSchoelzel, author = {Scholz, Sebastian and Sch{\"o}lzel, Mario}, title = {Design-Space-Exploration Using Simulated Annealing}, language = {en} } @inproceedings{SchoelzelBachmann, author = {Sch{\"o}lzel, Mario and Bachmann, Peter}, title = {DESCOMP: A New Design Space Exploration Approach}, series = {Systems aspects in organic and pervasive computing - ARCS 2005, 18th International Conference on Architecture of Computing Systems, Innsbruck, Austria, March 14 - 17, 2005, proceedings}, booktitle = {Systems aspects in organic and pervasive computing - ARCS 2005, 18th International Conference on Architecture of Computing Systems, Innsbruck, Austria, March 14 - 17, 2005, proceedings}, publisher = {Springer}, address = {Berlin [u.a.]}, isbn = {3-540-25273-8}, pages = {178 -- 192}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors}, series = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, booktitle = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, isbn = {978-1-4244-9755-3}, pages = {143 -- 146}, abstract = {Tagungsbeitrag DDECS 2011, Cottbus}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hiararchical Built-In SElf Test with On-Chip Diagnosis for VLIW Processors}, abstract = {Tagungsbeitrag 23. ITG-Tagung "Test und Zuverl{\"a}ssigeit von Schaltungen und Systemen", Passau, 2011}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Reduced Triple Modular Redundancy for Built-in Self Repair in VLIW Processors}, abstract = {Tagungsbeitrag IEEE SPA 2007, Poznan}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Scaling the Discrete Cosine Transformation for Fault-Torelant Real-Time Execution}, series = {Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings}, booktitle = {Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings}, publisher = {Univ. of Technology, Fac. of Computing Science and Management}, address = {Poznan}, isbn = {978-83-62065-00-4}, pages = {19 -- 24}, language = {en} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Dependability and Life Time Enhancement for Nano-Electronic Systems}, series = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, booktitle = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, publisher = {Univ. of Technology, Fac. of Computing, Chair of Control and System Engineering}, address = {Poznan}, isbn = {978-83-62065-02-8}, pages = {61 -- 67}, language = {en} } @inproceedings{KoalScheitSchoelzeletal., author = {Koal, Tobias and Scheit, Daniel and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {On the Feasibility of Built-in Self Repair for Logic Circuits}, series = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-1713-0}, pages = {316 -- 324}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Fine-Grained Software-Based Self Repair of VLIW Processors}, series = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-1713-0}, pages = {41 -- 49}, language = {en} } @inproceedings{MuellerSchoelzel, author = {M{\"u}ller, Sebastian and Sch{\"o}lzel, Mario}, title = {Combining Hardware and Software Based Self Repair Methods for Statically Scheduled Data Paths}, series = {2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), Kyoto, Japan, 6 - 8 October 2010}, booktitle = {2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), Kyoto, Japan, 6 - 8 October 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-424-48447-8}, pages = {90 -- 98}, language = {en} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Ein hybrides Selbsttest- und Reparaturkonzept f{\"u}r VLIW-Prozessoren}, abstract = {Tagungsbeitrag 20. ITG-GI-GMM-Workshop "Zuverl{\"a}ssiglkeit und Entwurf", Wien, Februar 2008}, language = {de} } @inproceedings{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {A Delay Estimation of Rescheduling Schemes for Statically Scheduled Processors}, series = {Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands}, booktitle = {Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands}, publisher = {VDE-Verlag}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3133-6}, pages = {117 -- 124}, language = {en} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Systematic Generation of Diagnostic Software-Based Self-Test Routines for Processor Components}, series = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, booktitle = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, publisher = {IEEE}, isbn = {978-1-4799-3415-7}, pages = {6}, language = {en} } @inproceedings{SchoelzelKoalScharobaetal., author = {Sch{\"o}lzel, Mario and Koal, Tobias and Scharoba, Stefan and Vierhaus, Heinrich Theodor}, title = {A Multi-Layer Software Based Fault-Tolerance Approach for Heterogenous Multi-Core Systems}, series = {16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015}, booktitle = {16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-6710-3}, pages = {1 -- 6}, language = {en} } @inproceedings{WeidlingTodtenbergBasmeretal., author = {Weidling, Stefan and Todtenberg, Nicole and Basmer, Thomas and Sch{\"o}lzel, Mario and Maaser, Michael and Taubert, Matthias}, title = {Outdoor Range Measurements in Sub-GHz License-free Radio Bands under Realistic Conditions}, series = {MobiWac '17, Proceedings of the 15th ACM International Symposium on Mobility Management and Wireless Access, Miami, Florida, November 21 - 25, 2017, USA}, booktitle = {MobiWac '17, Proceedings of the 15th ACM International Symposium on Mobility Management and Wireless Access, Miami, Florida, November 21 - 25, 2017, USA}, publisher = {ACM, Digital Library}, address = {New York, NY}, isbn = {978-1-4503-5163-8}, doi = {10.1145/3132062.3132080}, pages = {71 -- 74}, language = {en} } @misc{UrbanVierhausSchoelzeletal., author = {Urban, Roberto and Vierhaus, Heinrich Theodor and Sch{\"o}lzel, Mario and Altmann, Enrico and Seelig, Horst}, title = {Non-Cyclic Design Space Exploration for ASIPS - Compiler-Centered Microprocessor Design (CoMet)}, series = {Journal of Circuits, Systems and Computers}, volume = {25}, journal = {Journal of Circuits, Systems and Computers}, number = {3}, issn = {0218-1266}, doi = {10.1142/S0218126616400120}, pages = {16}, language = {en} } @inproceedings{SkoncejMuehlbauerKubiceketal., author = {Skoncej, Patryk and M{\"u}hlbauer, Felix and Kubicek, Felix and Schr{\"o}der, Lukas and Sch{\"o}lzel, Mario}, title = {Feasibility of Software-based Repair for Program Memories}, series = {22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Sant Feliu de Guixols, Spain, 2016}, booktitle = {22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Sant Feliu de Guixols, Spain, 2016}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-1507-8}, pages = {199 -- 202}, language = {en} } @inproceedings{SchoelzelSkoncejVater, author = {Sch{\"o}lzel, Mario and Skoncej, Patryk and Vater, Frank}, title = {On the Feasibility of Handling Manufacturing Faults in Embedded Memories by Software Means}, series = {IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM)}, booktitle = {IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM)}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6972-2}, pages = {6}, language = {en} } @inproceedings{SchoelzelSkoncejVater, author = {Sch{\"o}lzel, Mario and Skoncej, Patryk and Vater, Frank}, title = {Software-based Repair for Memories in Tiny Embedded Systems}, series = {20th IEEE European Test Symposium (ETS), 25-29 May, Cluj-Napoca, Romania 2015}, booktitle = {20th IEEE European Test Symposium (ETS), 25-29 May, Cluj-Napoca, Romania 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-7603-4}, pages = {2}, language = {en} } @misc{LehnigerSchoelzelJeloneketal., author = {Lehniger, Kai and Sch{\"o}lzel, Mario and Jelonek, Jonas and Tabatt, Peter and Aftowicz, Marcin and Langend{\"o}rfer, Peter}, title = {Combination of ROP Defense Mechanisms for Better Safety and Security in Embedded Systems}, series = {25th Euromicro Conference on Digital Systems Design (DSD 2022), Maspalomas, Spain, 31 August 2022 - 02 September 2022}, journal = {25th Euromicro Conference on Digital Systems Design (DSD 2022), Maspalomas, Spain, 31 August 2022 - 02 September 2022}, isbn = {978-1-6654-7404-7}, issn = {2771-2508}, doi = {10.1109/DSD57027.2022.00070}, pages = {8}, language = {en} } @misc{TabattJelonekSchoelzeletal., author = {Tabatt, Peter and Jelonek, Jonas and Sch{\"o}lzel, Mario and Lehniger, Kai and Langend{\"o}rfer, Peter}, title = {Code Mutation as a Mean Against ROP Attacks for Embedded Systems}, series = {11th Mediterranean Conference on Embedded Computing (MECO 2022), Budva, Montenegro, 07-10 June 2022}, journal = {11th Mediterranean Conference on Embedded Computing (MECO 2022), Budva, Montenegro, 07-10 June 2022}, isbn = {978-1-6654-6828-2}, issn = {2637-9511}, doi = {10.1109/MECO55406.2022.9797185}, pages = {4}, language = {en} } @inproceedings{SkoncejMuehlbauerSchoelzel, author = {Skoncej, Patryk and M{\"u}hlbauer, Felix and Sch{\"o}lzel, Mario}, title = {Softwarebasierte Selbstreparatur von Flash-Speichern f{\"u}r fehlertolerante mikrocontroller-basierte Systeme}, series = {Informatik 2015, Tagung vom 28. September - 2. Oktober 2015 in Cottbus}, booktitle = {Informatik 2015, Tagung vom 28. September - 2. Oktober 2015 in Cottbus}, editor = {Cunningham, Douglas W. and Hofstedt, Petra and Meer, Klaus and Schmitt, Ingo}, publisher = {Gesellschaft f{\"u}r Informatik e.V.}, address = {Bonn}, isbn = {978-3-88579-640-4}, pages = {1461 -- 1473}, language = {de} } @inproceedings{SchoelzelKoalMuelleretal., author = {Sch{\"o}lzel, Mario and Koal, Tobias and M{\"u}ller, Sebastian and Scharoba, Stefan and R{\"o}der, Stefanie and Vierhaus, Heinrich Theodor}, title = {A Comprehensive Software-Based Self-Test and Self-Repair Method for Statically Scheduled Superscalar Processors}, series = {17th IEEE Latin-American Test Symposium - LATS 2016}, booktitle = {17th IEEE Latin-American Test Symposium - LATS 2016}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-1331-9}, pages = {33 -- 38}, language = {en} } @inproceedings{KoalEggersgluessSchoelzel, author = {Koal, Tobias and Eggersgl{\"u}ß, S. and Sch{\"o}lzel, Mario}, title = {Erzeugung diagnostischer Testmuster unter komplexen Contraints}, series = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 27. GI/GMM/ITG-Workshop, 1.-3. M{\"a}rz 2015,}, booktitle = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 27. GI/GMM/ITG-Workshop, 1.-3. M{\"a}rz 2015,}, publisher = {Robert Bosch GmbH}, address = {Reutlingen}, language = {de} } @techreport{HenkelPaloumpaOpreaetal., author = {Henkel, Karsten and Paloumpa, Ioanna and Oprea, A. and Appel, G{\"u}nter and Schmeißer, Dieter and Frandsen, W. and Sch{\"o}lzel, Mario}, title = {Entwicklung von Sensoren mit Elektroden aus leitf{\"a}higen Polymeren}, language = {de} } @inproceedings{MuellerKoalSchoelzeletal., author = {M{\"u}ller, Sebastian and Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Timing for Virtual TMR in Logic Circuits}, series = {IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014}, booktitle = {IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014}, isbn = {978-1-4799-5324-0}, language = {en} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Combining Fault Tolerance and Self Repair at Minimum Cost in Power and Hardware}, series = {IEEE International Symposium DDECS 2014, Warschau}, booktitle = {IEEE International Symposium DDECS 2014, Warschau}, publisher = {IEEE CS Press}, isbn = {978-1-4799-4560-3}, pages = {153 -- 159}, language = {en} } @inproceedings{UrbanLehnigerHeyneetal., author = {Urban, Roberto and Lehniger, Kai and Heyne, Maximilian and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Vergleich der Beschreibung und Simulation einer Befehlssatzarchitektur in LISA und CoMet}, series = {MBMV 2014, B{\"o}blingen, Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen}, booktitle = {MBMV 2014, B{\"o}blingen, Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen}, publisher = {Cuvillier Verlag}, address = {G{\"o}ttingen}, isbn = {978-3-95404-637-9}, pages = {101 -- 112}, language = {de} } @inproceedings{SchoelzelPawlowskiDabrowski, author = {Sch{\"o}lzel, Mario and Pawlowski, Pawel and Dabrowski, Adam}, title = {Self Repair by Program Reconfiguration in VLIW Processor Architectures}, series = {Design and test technology for dependable systems-on-chip}, booktitle = {Design and test technology for dependable systems-on-chip}, publisher = {Information Science Reference}, address = {Hershay, Pa. [u.a.]}, isbn = {978-1-6096-0212-3}, pages = {241 -- 266}, language = {en} } @book{VierhausSteiningerPawlaketal., author = {Vierhaus, Heinrich Theodor and Steininger, Andreas and Pawlak, A. and Kraemer, Rolf and Sch{\"o}lzel, Mario and Raik, Jaan}, title = {Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems}, publisher = {Piscataway : IEEE, 2011}, isbn = {978-1-4244-9753-9}, language = {en} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Reconfigurable High Performance Architectures}, series = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, booktitle = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, publisher = {IEEE}, isbn = {978-1-4799-3415-7}, pages = {8}, language = {en} } @inproceedings{UrbanSchoelzelVierhaus, author = {Urban, Roberto and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Entwicklungsumgebung f{\"u}r den compilerzentrierten Mikroprozessorentwurf (CoMet)}, series = {DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband}, booktitle = {DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband}, publisher = {Fraunhofer Verlag}, address = {Stuttgart}, isbn = {978-3-8396-0738-1}, language = {de} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Diagnostics self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults}, series = {International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014}, booktitle = {International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6155-9}, pages = {27 -- 32}, language = {en} } @inproceedings{UrbanSchoelzelVierhausetal., author = {Urban, Roberto and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor and Altmann, Enrico and Seelig, Horst}, title = {Compiler-Centred Microprocessors Design (CoMet) - From C-Code to a VHDL Model of an ASIP}, series = {18th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS 2015, 22-24 April 2015, Belgrade, Serbia, proceedings}, booktitle = {18th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS 2015, 22-24 April 2015, Belgrade, Serbia, proceedings}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6779-7}, pages = {17 -- 22}, language = {en} } @inproceedings{ScharobaSchoelzelVierhaus, author = {Scharoba, Stefan and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {On reliability Estimation for Combined Transient and Permanent Fault Handling}, series = {14th Biennial Baltic Electronic Conference (BEC), Tallinn, Estonia, 6-8 October 2014}, booktitle = {14th Biennial Baltic Electronic Conference (BEC), Tallinn, Estonia, 6-8 October 2014}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-9539-7}, pages = {73 -- 76}, language = {en} } @inproceedings{MuellerSchoelzelVierhaus, author = {M{\"u}ller, Sebastian and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Towards a Graceful Degradable Multicore-System by hierarchical Handling of Hard Errors}, series = {DaRMuS 2013, Special Session on Dynamic and Reliable Multicore Systems, Hosted by 21st Euromicro PDP Conference}, booktitle = {DaRMuS 2013, Special Session on Dynamic and Reliable Multicore Systems, Hosted by 21st Euromicro PDP Conference}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-146-735-321-2}, pages = {302 -- 309}, language = {en} } @inproceedings{UrbanSchoelzelVierhaus, author = {Urban, Roberto and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Compilerzentrierter Mikroprozessor}, series = {Tagungsband Dredner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS 2013)}, booktitle = {Tagungsband Dredner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS 2013)}, editor = {Dietrich, Manfred}, publisher = {Fraunhofer-Verl.}, address = {Stuttgart}, isbn = {978-3-8396-0545-5}, language = {de} } @inproceedings{UrbanSchoelzelVierhaus, author = {Urban, Roberto and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Ein konfigurierbarer Zwischencodesimulator zum compilerzentrierten Mikroprozessorentwurf}, series = {Tagungsband Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV 2013)}, booktitle = {Tagungsband Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV 2013)}, publisher = {Univ., ITMZ}, address = {Rostock}, language = {de} } @inproceedings{MuellerSchoelzelVierhaus, author = {M{\"u}ller, Sebastian and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Hierarchical Self-repair in Heterogenous Multi-core Systems by Means of a Software-based Reconfiguration}, series = {VEFRE 8th Workshop on Dependability and Fault-Tolerance, Proceedings of ARCS 2012 Workshops}, booktitle = {VEFRE 8th Workshop on Dependability and Fault-Tolerance, Proceedings of ARCS 2012 Workshops}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-4673-1913-3}, pages = {7}, language = {en} } @inproceedings{SchoelzelKoalRoederetal., author = {Sch{\"o}lzel, Mario and Koal, Tobias and R{\"o}der, Stephanie and Vierhaus, Heinrich Theodor}, title = {Towards an Automatic Generation of Diagnostic In-Field SBST for Processor Components}, series = {Proceedings, 14th IEEE Latin American Test Workshop (LATW 2013)}, booktitle = {Proceedings, 14th IEEE Latin American Test Workshop (LATW 2013)}, publisher = {IEEE}, address = {Piscataway}, pages = {6}, language = {en} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {An Adaptive Self-Test Routine for In-Field Diagnosis of Permanent Faults in Simple RISC Cores}, series = {Proceedings, 15th IEEE Interantional Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, April 2012}, booktitle = {Proceedings, 15th IEEE Interantional Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, April 2012}, editor = {Raik, Jaan}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-4673-1185-4}, pages = {312 -- 317}, language = {en} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Adaptiver softwarebasierter Selbsttest einfacher RISC-Prozessoren zur Lokalisierung von permanenten Fehlern im Feld}, series = {Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband}, booktitle = {Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband}, publisher = {Fraunhofer IIS, Institutsteil EAS [u.a.]}, address = {Dresden}, isbn = {978-3-8396-0404-5}, pages = {150 -- 155}, language = {de} } @misc{LehnigerAftowiczSchoelzeletal., author = {Lehniger, Kai and Aftowicz, Marcin and Sch{\"o}lzel, Mario and Langend{\"o}rfer, Peter}, title = {Coarse-Grained Control Flow Integrity Check for Processors with Sliding Register Windows}, series = {12th Mediterranean Conference on Embedded Computing (MECO)}, journal = {12th Mediterranean Conference on Embedded Computing (MECO)}, isbn = {979-8-3503-2291-0}, issn = {2637-9511}, doi = {10.1109/MECO58584.2023.10154928}, pages = {7}, language = {en} } @misc{LehnigerSchoelzelTabattetal., author = {Lehniger, Kai and Sch{\"o}lzel, Mario and Tabatt, Peter and Aftowicz, Marcin and Langend{\"o}rfer, Peter}, title = {Simplified Control Flow Integrity Method for Permutated Programs}, series = {Proc. 32. Crypto-Day Matters 2021, (2021)}, journal = {Proc. 32. Crypto-Day Matters 2021, (2021)}, doi = {10.18420/cdm-2021-32-21}, pages = {2}, language = {en} } @phdthesis{Schoelzel, author = {Sch{\"o}lzel, Mario}, title = {Automatisierter Entwurf anwendungsspezifischer VLIW-Prozessoren}, url = {http://nbn-resolving.de/urn:nbn:de:kobv:co1-opus-397}, language = {de} }