@inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Current Models for the Circuit-level Simulations of Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, pages = {S. 184}, language = {en} } @inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Modeling and Simulation of the Single Event Transients at the Circuit Level}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190065}, pages = {35 -- 44}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Assessment of the Amplitude-duration Criterion for SET Robusness Evaluation}, series = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, booktitle = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0352-9}, language = {en} } @inproceedings{SimevskiSchleisiekPetrovicetal., author = {Simevski, Aleksandar and Schleisiek, Klaus and Petrovic, Vladimir and Beller, Norbert and Skoncej, Patryk and Schoof, Gunther and Krstic, Milos}, title = {Implementation of a Real Time Unit for Satellite Applications}, series = {19th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), 20-22 April 2016, Kosice, Slovakia}, booktitle = {19th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), 20-22 April 2016, Kosice, Slovakia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-2467-4}, pages = {180}, language = {en} } @inproceedings{KrsticFanBabicetal., author = {Krstic, Milos and Fan, Xin and Babic, Milan and Grass, Eckhard and Bjerregaard, T. and Yakovlev, A.}, title = {Reducing Switching Noise Effects by Advanced Clock Management}, series = {11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 4-8 July, St. Petersburg, Russia 2017}, booktitle = {11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 4-8 July, St. Petersburg, Russia 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2689-4}, pages = {3 -- 8}, language = {en} } @inproceedings{BabicZeidlerKrstic, author = {Babic, Milan and Zeidler, Steffen and Krstic, Milos}, title = {GALS Partitioning Methodology for Substrate Noise Reduction in Mixed-Signal Integrated Circuits}, series = {22nd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2016), 8-11 May, Porto Alegre, Brazil, 2016}, booktitle = {22nd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2016), 8-11 May, Porto Alegre, Brazil, 2016}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-9007-1}, pages = {67 -- 74}, language = {en} } @inproceedings{AndjelkovicPetrovicNenadovicetal., author = {Andjelkovic, Marko and Petrovic, Vladimir and Nenadovic, Miljana and Breitenreiter, Anselm and Krstic, Milos and Kraemer, Rolf}, title = {Design of an On-Chip System for the SET Pulse Width Measurement}, series = {Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017}, booktitle = {Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2146-2}, pages = {111 -- 118}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {Erstellung eines Modells der kritischen Ladung zur Bewertung der Robustheit gegen{\"u}ber SETs und SEUs: Fallstudie Muller C-Element}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {17 -- 24}, language = {de} } @inproceedings{AndjelkovicNenadovicPetrovicetal., author = {Andjelkovic, Marko and Nenadovic, Miljana and Petrovic, Vladimir and Krstic, Milos and Kraemer, Rolf}, title = {Evaluation of the Pulse Stretcher for Detection of Very Short Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, pages = {S. 214}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190106}, pages = {217 -- 220}, language = {en} } @inproceedings{AndjelkovicJagdholdKrsticetal., author = {Andjelkovic, Marko and Jagdhold, Ulrich and Krstic, Milos and Kraemer, Rolf}, title = {2D TCAD Simulation of Single Event Transients in 250 nm Bulk CMOS Technology}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {90 -- 96}, language = {en} } @inproceedings{BabicKrstic, author = {Babic, Milan and Krstic, Milos}, title = {A Substrate Noise Reduction Methodology Based on Power Domain Separation of GALS Subcomponents}, series = {27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS), September 25-27, 2017, Aristotle University Research Dissemination Center (KEDEA), Thessaloniki, Greece}, booktitle = {27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS), September 25-27, 2017, Aristotle University Research Dissemination Center (KEDEA), Thessaloniki, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-6462-5}, doi = {10.1109/PATMOS.2017.8106981}, pages = {6}, language = {en} } @inproceedings{BabicKrstic, author = {Babic, Milan and Krstic, Milos}, title = {GALS Methodology for Substrate Noise Reduction in BiCMOS Technologies}, series = {Proceedings, Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN), Tallinn, Estonia, 2015}, booktitle = {Proceedings, Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN), Tallinn, Estonia, 2015}, pages = {2}, language = {en} } @inproceedings{BabicKrstic, author = {Babic, Milan and Krstic, Milos}, title = {A Coarse Model for Estimation of Switching Noise Coupling in Lightly Doped Substrates}, series = {18th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Belgrade, Serbia, 2015}, booktitle = {18th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Belgrade, Serbia, 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6780-3}, pages = {217 -- 222}, language = {en} } @inproceedings{BabicFanKrstic, author = {Babic, Milan and Fan, Xin and Krstic, Milos}, title = {Frequency-Domain Modeling of Ground Bounce and Substrate Noise for Synchronous and GALS Systems}, series = {25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), 1-4 Sept. Salvador, Brazil 2015}, booktitle = {25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), 1-4 Sept. Salvador, Brazil 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-9419-2}, pages = {126 -- 132}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study}, series = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, booktitle = {IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2437-1}, doi = {10.1109/ATS.2017.27}, pages = {78 -- 83}, language = {en} } @inproceedings{AndjelkovicStamenkovićKrsticetal., author = {Andjelkovic, Marko and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {Impact of Resistive Open and Bridge Defects on the SET Robustness of CMOS Combinational Logic}, series = {IEEE East-West Design \& Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018}, booktitle = {IEEE East-West Design \& Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-5709-6}, doi = {10.1109/EWDTS.2018.8524748}, pages = {6}, language = {en} } @misc{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Study of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit}, series = {Microelectronics Reliability}, volume = {82}, journal = {Microelectronics Reliability}, issn = {0026-2714}, doi = {10.1016/j.microrel.2017.12.022}, pages = {100 -- 112}, language = {en} } @inproceedings{AndjelkovicBabicLietal., author = {Andjelkovic, Marko and Babic, Milan and Li, Yuanqing and Schrape, Oliver and Krstic, Milos and Kraemer, Rolf}, title = {Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates}, series = {25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018}, booktitle = {25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-9562-3}, doi = {10.1109/ICECS.2018.8617996}, pages = {361 -- 364}, language = {en} } @misc{SegabinazziFerreiraGeorgeChenetal., author = {Segabinazzi Ferreira, Raphael and George, Nevin and Chen, Junchao and H{\"u}bner, Michael and Krstic, Milos and Nolte, J{\"o}rg and Vierhaus, Heinrich Theodor}, title = {Configurable Fault Tolerant Circuits and System Level Integration for Self-Awareness}, series = {Proceedings of the Work in Progress Session held in connection with SEAA 2019, the 45th EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2019, the 22nd EUROMICRO Conference on Digital System Design}, journal = {Proceedings of the Work in Progress Session held in connection with SEAA 2019, the 45th EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2019, the 22nd EUROMICRO Conference on Digital System Design}, publisher = {SEA-Publications}, address = {Kallithea, Chalkidiki (Greece)}, isbn = {978-3-902457-54-7}, doi = {10.26127/BTUOpen-5050}, pages = {2}, abstract = {Scaling minimum features of ICs down to the 10nm- area and below has allowed high integration rates in electronics. Scaling at supply voltages of 1V and below also implies a rising level of stress which drives aging effects that reduce switching speed and the expected life time. Additionally, vulnerability from particle radiation is increased. Hence, fault detection and on- line correction become a must for many applications. However, not only fault tolerance but self-awareness becomes also an advantage. Provided that by being aware of its own healthy state allow optimized configurations regarding system operation modes and configurable hardware mechanism. This paper shows a preliminary work in a configurable circuit and explores its configuration possibilities when integrated into a complete system.}, language = {en} } @misc{AndjelkovicLiStamenkovićetal., author = {Andjelkovic, Marko and Li, Yuanqing and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells}, series = {25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019}, journal = {25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019}, publisher = {IEEE}, isbn = {978-1-7281-2490-2}, issn = {1942-9401}, doi = {10.1109/IOLTS.2019.8854379}, pages = {4}, language = {en} } @misc{VeleskiKraemerKrstic, author = {Veleski, Mitko and Kraemer, Rolf and Krstic, Milos}, title = {SWIELD: An In Situ Approach for Adaptive Low Power and Error-Resilient Operation}, series = {17th IEEE East-West Design \& Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019}, journal = {17th IEEE East-West Design \& Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019}, publisher = {IEEE}, isbn = {978-1-7281-1003-5}, issn = {2472-761X}, doi = {10.1109/EWDTS.2019.8884428}, pages = {6}, language = {en} }