@techreport{TittelbachHelmrichKrsticFiebigetal., author = {Tittelbach-Helmrich, Klaus and Krstic, Milos and Fiebig, Norbert and Methfessel, Michael}, title = {Test Report for WLAN Access Point Chipset, Deliverable D5.2}, language = {en} } @misc{GrassKrsticWinkler, author = {Grass, Eckhard and Krstic, Milos and Winkler, F.}, title = {GALS-Schaltung und Verfahren zum Betrieb einer GALS-Schaltung}, language = {de} } @inproceedings{GrassWinklerKrsticetal., author = {Grass, Eckhard and Winkler, F. and Krstic, Milos and Julius, A. and Stahl, C. and Piz, M.}, title = {Enhanced GALS Techniques for Datapath Applications}, language = {en} } @inproceedings{KrsticGrass, author = {Krstic, Milos and Grass, Eckhard}, title = {BIST Testing for GALS Systems}, language = {en} } @misc{NikolicDjordjevicKrsticetal., author = {Nikolic, Tatjana and Djordjevic, Goran L. and Krstic, Milos and Stojcev, M.}, title = {Data Transfers over Peripheral Bus Using CDMA Technique}, language = {en} } @inproceedings{FanKrsticWolfetal., author = {Fan, X. and Krstic, Milos and Wolf, Ch. and Grass, Eckhard}, title = {GALS Design for On-Chip Ground Bounce Suppression}, language = {en} } @inproceedings{KrsticFanGrassetal., author = {Krstic, Milos and Fan, X. and Grass, Eckhard and Strano, A. and Bertozzi, Davide and Heer, Ch. and Sanders, B. and Benini, L. and Kakooe, M. R.}, title = {Moonrake Chip - GALS Demonstrator in 40 nm CMOS Technology}, language = {en} } @inproceedings{SimevskiKraemerKrstic, author = {Simevski, Aleksandar and Kraemer, Rolf and Krstic, Milos}, title = {Low-Complexity Integrated Circuit Aging Monitor}, language = {en} } @inproceedings{WolfZeidlerKrsticetal., author = {Wolf, Christoph and Zeidler, Steffen and Krstic, Milos and Kraemer, Rolf}, title = {Overview on ATE Test and Debugging Methods for Asynchronous Circuits}, language = {en} } @inproceedings{SchrapeKrsticPhilippetal., author = {Schrape, Oliver and Krstic, Milos and Philipp, Gunnar and Winkler, Frank}, title = {A Digital Design Flow for Differential ECL High Speed Applications}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {An Analysis of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit}, series = {20thInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), 19-21 April 2017 Dresden}, booktitle = {20thInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), 19-21 April 2017 Dresden}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0472-4}, pages = {6}, language = {en} } @inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Current Models for the Circuit-level Simulations of Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro}, pages = {S. 184}, language = {en} } @inproceedings{AndjelkovicIlicStamenkovićetal., author = {Andjelkovic, Marko and Ilic, Aleksandar and Stamenković, Zoran and Krstic, Milos and Kraemer, Rolf}, title = {An Overview of the Modeling and Simulation of the Single Event Transients at the Circuit Level}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190065}, pages = {35 -- 44}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Assessment of the Amplitude-duration Criterion for SET Robusness Evaluation}, series = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, booktitle = {23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0352-9}, language = {en} } @inproceedings{SimevskiSchleisiekPetrovicetal., author = {Simevski, Aleksandar and Schleisiek, Klaus and Petrovic, Vladimir and Beller, Norbert and Skoncej, Patryk and Schoof, Gunther and Krstic, Milos}, title = {Implementation of a Real Time Unit for Satellite Applications}, series = {19th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), 20-22 April 2016, Kosice, Slovakia}, booktitle = {19th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), 20-22 April 2016, Kosice, Slovakia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-2467-4}, pages = {180}, language = {en} } @inproceedings{KrsticFanBabicetal., author = {Krstic, Milos and Fan, Xin and Babic, Milan and Grass, Eckhard and Bjerregaard, T. and Yakovlev, A.}, title = {Reducing Switching Noise Effects by Advanced Clock Management}, series = {11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 4-8 July, St. Petersburg, Russia 2017}, booktitle = {11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 4-8 July, St. Petersburg, Russia 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2689-4}, pages = {3 -- 8}, language = {en} } @inproceedings{BabicZeidlerKrstic, author = {Babic, Milan and Zeidler, Steffen and Krstic, Milos}, title = {GALS Partitioning Methodology for Substrate Noise Reduction in Mixed-Signal Integrated Circuits}, series = {22nd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2016), 8-11 May, Porto Alegre, Brazil, 2016}, booktitle = {22nd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2016), 8-11 May, Porto Alegre, Brazil, 2016}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-9007-1}, pages = {67 -- 74}, language = {en} } @inproceedings{AndjelkovicPetrovicNenadovicetal., author = {Andjelkovic, Marko and Petrovic, Vladimir and Nenadovic, Miljana and Breitenreiter, Anselm and Krstic, Milos and Kraemer, Rolf}, title = {Design of an On-Chip System for the SET Pulse Width Measurement}, series = {Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017}, booktitle = {Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2146-2}, pages = {111 -- 118}, language = {en} } @inproceedings{AndjelkovicKrsticKraemeretal., author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf and Veeravalli, Varadan Savulimedu and Steininger, Andreas}, title = {Erstellung eines Modells der kritischen Ladung zur Bewertung der Robustheit gegen{\"u}ber SETs und SEUs: Fallstudie Muller C-Element}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {Berlin}, address = {VDE Verlag}, isbn = {978-3-8007-4444-2}, pages = {17 -- 24}, language = {de} } @inproceedings{AndjelkovicNenadovicPetrovicetal., author = {Andjelkovic, Marko and Nenadovic, Miljana and Petrovic, Vladimir and Krstic, Milos and Kraemer, Rolf}, title = {Evaluation of the Pulse Stretcher for Detection of Very Short Single Event Transients}, series = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, booktitle = {Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017}, pages = {S. 214}, language = {en} } @inproceedings{AndjelkovicKrsticKraemer, author = {Andjelkovic, Marko and Krstic, Milos and Kraemer, Rolf}, title = {Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology}, series = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, booktitle = {30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-2563-7}, doi = {10.1109/MIEL.2017.8190106}, pages = {217 -- 220}, language = {en} }