@inproceedings{VyvenkoKruegerKittler, author = {Vyvenko, Oleg F. and Kr{\"u}ger, O. and Kittler, Martin}, title = {Temperature-dependent Cross-sectional EBIC Study of Hydrogen Passivation of Defects in mc-Si}, language = {en} } @article{SeifertKruegerKittleretal., author = {Seifert, Winfried and Kr{\"u}ger, O. and Kittler, Martin and Higgs, V.}, title = {{\"U}ber M{\"o}glichkeiten der Charakterisierung von mc-Si durch SiPHER}, language = {de} } @article{KittlerKruegerSeifert, author = {Kittler, Martin and Kr{\"u}ger, O. and Seifert, Winfried}, title = {Elektrische Eigenschaften von Kristalldefekten in multikristallinen Si-Materialien und Solarzellen Charakterisierung des Einflusses unterschiedlicher Behandlungen durch mikroskopische Techniken}, language = {de} } @misc{KittlerSeifertKrueger, author = {Kittler, Martin and Seifert, Winfried and Kr{\"u}ger, O.}, title = {Electrical Behaviour of Crystal Defects in Silicon Solar Cells}, language = {en} } @article{VyvenkoKruegerKittler, author = {Vyvenko, Oleg F. and Kr{\"u}ger, O. and Kittler, Martin}, title = {Depth Profiling of the Recombination Activity of Defects Measured by Temperature-dependent Cross-sectional EBIC}, language = {en} }