@inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Fault Diagnosis in Logic Circuits Exploiting Regularity}, series = {Tagungsband, edaWorkshop 08, Hannover, 6. - 7. Mai 2008}, booktitle = {Tagungsband, edaWorkshop 08, Hannover, 6. - 7. Mai 2008}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3101-5}, pages = {57 -- 62}, language = {en} } @inproceedings{KoalKotheVierhaus, author = {Koal, Tobias and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {SoC Self Test Based on a Test Processor}, series = {Design an Test Technology for Dependable Systems on Chip}, booktitle = {Design an Test Technology for Dependable Systems on Chip}, publisher = {IGI Global}, address = {Hershey [u.a.]}, isbn = {978-1-6096-0212-3}, pages = {360 -- 375}, language = {en} }