@inproceedings{KotheGalkeVierhaus, author = {Kothe, Ren{\´e} and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {A Multi-Purpose Concept for SoC Self Test Including Diagnostics Features}, series = {11th IEEE International On-Line Testing Symposium, 2005, IOLTS 2005, 6 - 8 July 2005, [Saint Raphael, French Riviera, France, proceedings]}, booktitle = {11th IEEE International On-Line Testing Symposium, 2005, IOLTS 2005, 6 - 8 July 2005, [Saint Raphael, French Riviera, France, proceedings]}, publisher = {Los Alamitos, Calif. [u.a.]}, address = {IEEE Computer Society}, isbn = {0-7695-2406-0}, pages = {241 -- 246}, language = {en} } @inproceedings{GalkeKotheVierhaus, author = {Galke, Christian and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Logic Self Repair}, series = {Workshop proceedings, ARCS '06, 19th International Conference on Architecture of Computing Systems, March 16, 2006, Frankfurt am Main}, booktitle = {Workshop proceedings, ARCS '06, 19th International Conference on Architecture of Computing Systems, March 16, 2006, Frankfurt am Main}, publisher = {Ges. f{\"u}r Informatik}, address = {Bonn}, isbn = {978-3-88579-175-1}, pages = {36 -- 44}, language = {en} } @article{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {A Scan Controller Concept for Low-Power Scan Test}, language = {en} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Test Data and Power Reductions for Transition Delay Tests for Massive Parallel Scan Structures}, series = {2010 13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools (DSD 2010), Lille, France, 1 - 3 September 2010}, booktitle = {2010 13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools (DSD 2010), Lille, France, 1 - 3 September 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, pages = {283 -- 290}, language = {en} } @inproceedings{KotheVierhausCoymetal., author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor and Coym, Torsten and Vermeiren, W. and Straube, B.}, title = {Embedded Self Repair by Transistor and Gate Level Reconfiguration}, series = {Design and Diagnostics of Electronic Circuits and systems, (DDECS 2006), Prag, April 2006}, booktitle = {Design and Diagnostics of Electronic Circuits and systems, (DDECS 2006), Prag, April 2006}, publisher = {IEEE}, isbn = {1-4244-0185-2}, pages = {208 -- 213}, language = {en} } @inproceedings{GalkeKotheSchultkeetal., author = {Galke, Christian and Kothe, Ren{\´e} and Schultke, Sabine and Winkler, Christin and Honko, Jeanette and Vierhaus, Heinrich Theodor}, title = {Embedded Scan Test with Diagnostic Features for Self-Testing SoCs}, series = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, booktitle = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {978-0-7695-2620-1}, pages = {181 -- 182}, language = {en} } @inproceedings{HabermannKotheVierhaus, author = {Habermann, Sven and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Built-in Self Repair by Reconfiguration of FPGAs}, series = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, booktitle = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif [u.a.]}, isbn = {978-0-7695-2620-1}, pages = {187 -- 188}, language = {en} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Flip-Flops and Scan Path Elements for Nanoelectronics}, series = {Proceedings, Design and Diagnostics of Electronic Circuits and Systems DDECS '07, Krakow, 11 - 13 April 2007}, booktitle = {Proceedings, Design and Diagnostics of Electronic Circuits and Systems DDECS '07, Krakow, 11 - 13 April 2007}, publisher = {IEEE}, isbn = {1-4244-1162-9}, pages = {6}, language = {en} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Reparaturfunktionen f{\"u}r Bus-Strukturen auf SoCs}, series = {Zuverl{\"a}ssigkeit und Entwurf, 1. GMM/GI/ITG-Fachtagung vom 26. bis 28. M{\"a}rz 2007 in M{\"u}nchen}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 1. GMM/GI/ITG-Fachtagung vom 26. bis 28. M{\"a}rz 2007 in M{\"u}nchen}, editor = {Sattler, Sebastian}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3023-0}, pages = {77 -- 84}, language = {de} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Repair Functions and Redundancy Management for Bus Structures}, series = {Workshop proceedings, ARCS 2007, 20th International Conference on Architecture of Computing Systems, March 15, 2007, Zurich, Switzerland}, booktitle = {Workshop proceedings, ARCS 2007, 20th International Conference on Architecture of Computing Systems, March 15, 2007, Zurich, Switzerland}, publisher = {VDE-Verlag}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3015-5}, language = {en} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {An Embedded Test Strategy for Global and Regiional Interconnects on SoCs}, series = {Signal processing '2006, workshop proceedings, Poznan, 29th September 2006}, booktitle = {Signal processing '2006, workshop proceedings, Poznan, 29th September 2006}, editor = {Dabrowski, Adam}, address = {Poznan}, isbn = {83-913251-7-2}, pages = {65 -- 70}, language = {en} } @inproceedings{KotheGalkeVierhaus, author = {Kothe, Ren{\´e} and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {Redundanz-Management und Fehlerisolierung f{\"u}r die Selbstreparatur in digitalen und analogen Schaltungen}, series = {ANALOG '06, Vortr{\"a}ge der 9. ITG/GMM-Fachtagung vom 27. bis 29. September 2006 in Dresden}, booktitle = {ANALOG '06, Vortr{\"a}ge der 9. ITG/GMM-Fachtagung vom 27. bis 29. September 2006 in Dresden}, publisher = {VDE-Verlag}, address = {Berlin [u.a]}, isbn = {978-3-8007-2988-3}, pages = {57 -- 62}, language = {de} } @inproceedings{KotheHabermannVierhausetal., author = {Kothe, Ren{\´e} and Habermann, Sven and Vierhaus, Heinrich Theodor and Coym, Torsten and Vermeiren, W. and Straube, B.}, title = {Selbstreparatur von Logik-Baugruppen in hochintegrieten Schaltungen- M{\"o}glichkeiten und Grenzen}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006}, publisher = {Fraunhofer-Institut}, address = {Dresden}, language = {de} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Embedded Fault Diagnosis Exploiting Regularity}, abstract = {Tagungsbeitrag IEEE SPA07, Poznan}, language = {en} } @inproceedings{FrostRudolphGalkeetal., author = {Frost, Raik and Rudolph, D. and Galke, Christian and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {A Configurable Modular Test Processor and Scan Controller Architecture}, series = {Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007}, booktitle = {Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {0-7695-2918-6}, pages = {277 -- 284}, language = {en} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Embedded Diagnostic Logic Test Exploiting Regularity}, series = {Proceedings, 11th EUROMICRO Conference on Digital System Design: Architectures, Methods and Tools, 2008, DSD '08, 3 - 5 Sept. 2008, Parma, Italy}, booktitle = {Proceedings, 11th EUROMICRO Conference on Digital System Design: Architectures, Methods and Tools, 2008, DSD '08, 3 - 5 Sept. 2008, Parma, Italy}, editor = {Fanucci, Luca}, publisher = {IEEE}, address = {Piscataway, NJ}, pages = {873 -- 879}, language = {en} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Fehlerh{\"a}rtung und Fehlertoleranz f{\"u}r Flip-Flops und Scan-Path-Elemente}, series = {Tagungsband, Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2007), 8. - 9. Mai 2007}, booktitle = {Tagungsband, Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2007), 8. - 9. Mai 2007}, publisher = {TUDpress}, address = {Dresden}, isbn = {978-3-940046-28-4}, pages = {67 -- 72}, language = {de} } @techreport{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Diagnostics Logic Testing Based on Advanced Scan Technology and an Embedded Test Processor}, publisher = {BTU}, address = {Cottbus}, issn = {1437-7969}, language = {en} } @inproceedings{KotheScheitVierhaus, author = {Kothe, Ren{\´e} and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Angepasste Fehlerdiagnose f{\"u}r die Selbstreparatur in logischen Schaltungen}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf, (DASS'2008), Workshop Entwurf integrierter Schaltungen (WEIS'08) 15. - 16. Mai 2008}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf, (DASS'2008), Workshop Entwurf integrierter Schaltungen (WEIS'08) 15. - 16. Mai 2008}, editor = {Elst, G.}, publisher = {Fraunhofer Institut f{\"u}r integrierte Schaltungen}, address = {Dresden}, isbn = {3-9810287-2-4}, language = {de} } @inproceedings{KotheGalkeSchultkeetal., author = {Kothe, Ren{\´e} and Galke, Christian and Schultke, Sabine and Fr{\"o}schke, Henry and Gaede, Steffen and Vierhaus, Heinrich Theodor}, title = {Hardware/Software Based Hierarchical Self Test for SoCs}, series = {Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic}, booktitle = {Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {1-4244-0185-2}, pages = {157 -- 158}, language = {en} } @misc{KotheHabermannVierhaus, author = {Kothe, Ren{\´e} and Habermann, Sven and Vierhaus, Heinrich Theodor}, title = {Selbstreparatur von Logik-Baugruppen in hochintegrierten Schaltungen - M{\"o}glichkeiten und Grenzen}, series = {Forum der Forschung}, volume = {10}, journal = {Forum der Forschung}, number = {19}, issn = {0947-6989}, pages = {125 -- 130}, language = {de} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Fault Diagnosis in Logic Circuits Exploiting Regularity}, series = {Tagungsband, edaWorkshop 08, Hannover, 6. - 7. Mai 2008}, booktitle = {Tagungsband, edaWorkshop 08, Hannover, 6. - 7. Mai 2008}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3101-5}, pages = {57 -- 62}, language = {en} } @inproceedings{KoalKotheVierhaus, author = {Koal, Tobias and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {SoC Self Test Based on a Test Processor}, series = {Design an Test Technology for Dependable Systems on Chip}, booktitle = {Design an Test Technology for Dependable Systems on Chip}, publisher = {IGI Global}, address = {Hershey [u.a.]}, isbn = {978-1-6096-0212-3}, pages = {360 -- 375}, language = {en} }