@inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Basic Architecture for Logic Self Repair}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Eingebaute Selbstreparatur zur Kompensation von Produktions- und Alterungsfehlern}, language = {de} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Optimal Spare Utilization for Reliability and Men Litetime Improvement for Logic Built-in Self Repair}, series = {Proceedings, IEEE DDECS 2011, Cottbus}, booktitle = {Proceedings, IEEE DDECS 2011, Cottbus}, isbn = {978-1-4244-9753-9}, abstract = {Tagungsbeitrag DDECS 2011, Cottbus}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors}, series = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, booktitle = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, isbn = {978-1-4244-9755-3}, pages = {143 -- 146}, abstract = {Tagungsbeitrag DDECS 2011, Cottbus}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hiararchical Built-In SElf Test with On-Chip Diagnosis for VLIW Processors}, abstract = {Tagungsbeitrag 23. ITG-Tagung "Test und Zuverl{\"a}ssigeit von Schaltungen und Systemen", Passau, 2011}, language = {en} } @inproceedings{KoalBeckVierhaus, author = {Koal, Tobias and Beck, Matthias-Stephan and Vierhaus, Heinrich Theodor}, title = {Rekonfigurierbare Logik f{\"u}r Ausbeute-Optimierung und Verschleiß-Kompensation}, abstract = {Tagungsbeitrag ITG-GI-GMM-Tagung "Zuverl{\"a}ssigeit und Entwurf", Hamburg, 2011}, language = {de} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Schwachstellen und Engp{\"a}sse bei Verfahren zur Fehlerkompensation und Selbstreparatur f{\"u}r hochintegrierte Schaltungen}, series = {Zuverl{\"a}ssigkeit und Entwurf, 4. GMM/GI/ITG-Fachtagung vom 13. bis 15. September 2010 in Wildbad Kreuth}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 4. GMM/GI/ITG-Fachtagung vom 13. bis 15. September 2010 in Wildbad Kreuth}, publisher = {VDE-Verlag}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3299-9}, pages = {57 -- 62}, language = {de} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A Software Based Self Test and Hardware Reconfiguration Solution for VLIW Processors}, series = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, booktitle = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4244-6612-2}, pages = {40 -- 43}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Combining De-Stressing and Self Repair for Long-Term Dependable Systems}, series = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, booktitle = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4244-6613-9}, pages = {99 -- 104}, language = {en} } @inproceedings{GleichnerKoalVierhaus, author = {Gleichner, Christian and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Effiziente Verfahren der Selbstreparatur von Logik}, abstract = {Tagungsbeitrag ITG-GI-GMM Workshop "Test und Zuverl{\"a}ssigkeit von Schaltungen und Systemen", Paderborn, Februar 2010}, language = {de} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {A Comprehensive Scheme for Logic Self Repair}, series = {Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings}, booktitle = {Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings}, publisher = {Univ. of Technology, Fac. of Computing Science and Management}, address = {Poznan}, isbn = {978-83-62065-00-4}, pages = {13 -- 18}, language = {en} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {A Concept for Logic Self Repair}, series = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, booktitle = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-424-44768-8}, pages = {621 -- 624}, language = {en} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Reliability Estimation Process}, series = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, booktitle = {12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-424-44768-8}, pages = {221 -- 224}, language = {en} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Dependability and Life Time Enhancement for Nano-Electronic Systems}, series = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, booktitle = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, publisher = {Univ. of Technology, Fac. of Computing, Chair of Control and System Engineering}, address = {Poznan}, isbn = {978-83-62065-02-8}, pages = {61 -- 67}, language = {en} } @inproceedings{KoalScheitSchoelzeletal., author = {Koal, Tobias and Scheit, Daniel and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {On the Feasibility of Built-in Self Repair for Logic Circuits}, series = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-1713-0}, pages = {316 -- 324}, language = {en} } @inproceedings{GleichnerKoalVierhaus, author = {Gleichner, Christian and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Effective Logic Self Repair Based on Extracted Logic Clusters}, series = {Signal Processing Algorithms, Architectures, Arrangements, and Applications Conference Proceedings (SPA), 2010, Poznan}, booktitle = {Signal Processing Algorithms, Architectures, Arrangements, and Applications Conference Proceedings (SPA), 2010, Poznan}, publisher = {IEEE}, isbn = {978-1-4577-1485-6}, pages = {6}, language = {en} } @inproceedings{GalkeKoalVierhaus, author = {Galke, Christian and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {M{\"o}glichkeiten und Grenzen der automatischen SBST-Generierung f{\"u}r einfache Prozessoren}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS' 2007), 8. - 9. Mai 2007}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS' 2007), 8. - 9. Mai 2007}, publisher = {TUDpress, Verl. der Wissenschaften}, address = {Dresden}, isbn = {978-3-940046-28-4}, pages = {39 -- 44}, language = {de} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {M{\"o}glichkeiten und Grenzen der Selbstreparatur f{\"u}r Logik}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS'2008), Workshop Entwurf integrierter Schaltungen (WEIS'08) 15. - 16. Mai 2008}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS'2008), Workshop Entwurf integrierter Schaltungen (WEIS'08) 15. - 16. Mai 2008}, publisher = {Fraunhofer Institut f{\"u}r integrierte Schaltungen}, address = {Dresden}, isbn = {3-9810287-2-4}, language = {de} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Selbstreparatur durch Regularisierung von Logik-Strukturen}, series = {Zuverl{\"a}ssigkeit und Entwurf, 3. GMM/GI/ITG-Fachtagung vom 21. bis 23. September 2009 in Stuttgart}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 3. GMM/GI/ITG-Fachtagung vom 21. bis 23. September 2009 in Stuttgart}, isbn = {978-3-8007-3178-7}, pages = {29 -- 36}, language = {de} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A Scheme of Logic Self Repair Including Local Interconnects}, series = {12th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS, Liberec, Czech Republic, 15 - 17 April 2009}, booktitle = {12th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS, Liberec, Czech Republic, 15 - 17 April 2009}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4244-3339-1}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Logik-Selbstreparatur auf der Basis elementarer Logik-Bl{\"o}cke mit lokaler Redundanz}, abstract = {Tagunsgbeitrag ITG / GMM / GI- Tagung "Test und Zuverl{\"a}ssigkeit von Schaltungen und Systemen", Bremen, Februar 2009}, language = {de} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Logic Self Repair Based on Regular Buidling Blocks}, abstract = {Tagungsbeitrag ARCS2009-Workshop on Fault Tolerance, Delft, M{\"a}rz 2009}, language = {en} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {M{\"o}glichkeiten und Grenzen der Selbstreparatur f{\"u}r Logik}, series = {Zuverl{\"a}ssigkeit und Entwurf, 2. GMM/GI/ITG-Fachtagung vom 29. September bis 1. Oktober 2008 in Ingolstadt}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 2. GMM/GI/ITG-Fachtagung vom 29. September bis 1. Oktober 2008 in Ingolstadt}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3119-0}, pages = {57 -- 64}, language = {de} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Systematic Generation of Diagnostic Software-Based Self-Test Routines for Processor Components}, series = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, booktitle = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, publisher = {IEEE}, isbn = {978-1-4799-3415-7}, pages = {6}, language = {en} } @inproceedings{SchoelzelKoalScharobaetal., author = {Sch{\"o}lzel, Mario and Koal, Tobias and Scharoba, Stefan and Vierhaus, Heinrich Theodor}, title = {A Multi-Layer Software Based Fault-Tolerance Approach for Heterogenous Multi-Core Systems}, series = {16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015}, booktitle = {16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-6710-3}, pages = {1 -- 6}, language = {en} } @inproceedings{KoalScharobaVierhaus, author = {Koal, Tobias and Scharoba, Stefan and Vierhaus, Heinrich Theodor}, title = {Exploring diagnostic capabilities of software-based self-tests for production and in-field application}, series = {Proceedings of the 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM), June 22-24, 2015, Liberec, Czech Republic}, booktitle = {Proceedings of the 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM), June 22-24, 2015, Liberec, Czech Republic}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6970-8}, pages = {1 -- 6}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Redundancy evaluation process of processor components for permanent fault compensation}, series = {2015 NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2015), Montr{\´e}al, Quebec, Canada, 15-18 June 2015}, booktitle = {2015 NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2015), Montr{\´e}al, Quebec, Canada, 15-18 June 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-7501-6}, pages = {1 -- 6}, language = {en} } @misc{ScharobaKoalVierhaus, author = {Scharoba, Stefan and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Correcting Delay Faults and Transient Faults in Pipelines}, series = {8. GMM/ITG/GI-Symposium Reliability by Design, Siegen, Germany, 21-23 Sept. 2015}, journal = {8. GMM/ITG/GI-Symposium Reliability by Design, Siegen, Germany, 21-23 Sept. 2015}, isbn = {978-3-8007-4071-0}, pages = {7}, language = {en} } @inproceedings{SchoelzelKoalMuelleretal., author = {Sch{\"o}lzel, Mario and Koal, Tobias and M{\"u}ller, Sebastian and Scharoba, Stefan and R{\"o}der, Stefanie and Vierhaus, Heinrich Theodor}, title = {A Comprehensive Software-Based Self-Test and Self-Repair Method for Statically Scheduled Superscalar Processors}, series = {17th IEEE Latin-American Test Symposium - LATS 2016}, booktitle = {17th IEEE Latin-American Test Symposium - LATS 2016}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-1331-9}, pages = {33 -- 38}, language = {en} } @inproceedings{KoalEggersgluessSchoelzel, author = {Koal, Tobias and Eggersgl{\"u}ß, S. and Sch{\"o}lzel, Mario}, title = {Erzeugung diagnostischer Testmuster unter komplexen Contraints}, series = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 27. GI/GMM/ITG-Workshop, 1.-3. M{\"a}rz 2015,}, booktitle = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 27. GI/GMM/ITG-Workshop, 1.-3. M{\"a}rz 2015,}, publisher = {Robert Bosch GmbH}, address = {Reutlingen}, language = {de} } @inproceedings{MuellerKoalSchoelzeletal., author = {M{\"u}ller, Sebastian and Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Timing for Virtual TMR in Logic Circuits}, series = {IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014}, booktitle = {IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014}, isbn = {978-1-4799-5324-0}, language = {en} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Combining Fault Tolerance and Self Repair at Minimum Cost in Power and Hardware}, series = {IEEE International Symposium DDECS 2014, Warschau}, booktitle = {IEEE International Symposium DDECS 2014, Warschau}, publisher = {IEEE CS Press}, isbn = {978-1-4799-4560-3}, pages = {153 -- 159}, language = {en} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {Kombinierte On-Line-Fehlerkompensation und Selbstreparatur f{\"u}r Logik-Baugruppen}, series = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 25. GI/GMM/ITG-Workshop, 24. bis 26. Februar 2013, Dresden}, booktitle = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 25. GI/GMM/ITG-Workshop, 24. bis 26. Februar 2013, Dresden}, publisher = {Fraunhofer-Institut}, address = {Dresden}, language = {de} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Logic Self Repair Based on Regular Building Blocks}, series = {Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands}, booktitle = {Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3133-6}, pages = {71 -- 76}, language = {en} } @inproceedings{ScharobaKoalVierhaus, author = {Scharoba, Stefan and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Combined Detection and Correction of Transient Faults and Delay Faults}, series = {ZuE 2015, Zuverl{\"a}ssigkeit und Entwurf, Beitr{\"a}ge der 8. GMM/ITG/GI-Fachtagung 21. - 23. September 2015 in Siegen}, booktitle = {ZuE 2015, Zuverl{\"a}ssigkeit und Entwurf, Beitr{\"a}ge der 8. GMM/ITG/GI-Fachtagung 21. - 23. September 2015 in Siegen}, publisher = {VDE-Verlag}, address = {Berlin}, isbn = {978-3-8007-4071-0}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Built-in Self Repair for Logic Structures}, series = {Design and test technology for dependable systems-on-chip}, booktitle = {Design and test technology for dependable systems-on-chip}, publisher = {Information Science Reference}, address = {Hershay, Pa. [u.a.]}, isbn = {978-1-6096-0212-3}, language = {en} } @inproceedings{KoalKotheVierhaus, author = {Koal, Tobias and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {SoC Self Test Based on a Test Processor}, series = {Design an Test Technology for Dependable Systems on Chip}, booktitle = {Design an Test Technology for Dependable Systems on Chip}, publisher = {IGI Global}, address = {Hershey [u.a.]}, isbn = {978-1-6096-0212-3}, pages = {360 -- 375}, language = {en} } @inproceedings{KoalUlbrichtVierhaus, author = {Koal, Tobias and Ulbricht, Markus and Vierhaus, Heinrich Theodor}, title = {Combining On-Line Fault Detection and Logic Self Repair}, series = {IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012}, booktitle = {IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012}, editor = {Raik, Jaan}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-1185-4}, pages = {288 -- 293}, language = {en} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Reconfigurable High Performance Architectures}, series = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, booktitle = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, publisher = {IEEE}, isbn = {978-1-4799-3415-7}, pages = {8}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Probleme bei Erzeugung und simulationsbasierten Validierung softwarebasierter Selbsttests zur feingranularen Diagnose}, series = {DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband}, booktitle = {DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband}, publisher = {Fraunhofer Verlag}, address = {Stuttgart}, isbn = {978-3-8396-0738-1}, language = {de} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Diagnostics self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults}, series = {International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014}, booktitle = {International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6155-9}, pages = {27 -- 32}, language = {en} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {Selbstreparatur f{\"u}r Logik-Baugruppen mit erweiterten F{\"a}higkeiten f{\"u}r die Kompensation von Fertigungsfehlern und Fr{\"u}hausf{\"a}llen}, series = {Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband}, booktitle = {Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband}, publisher = {Fraunhofer IIS, Institutsteil EAS [u.a.]}, address = {Dresden}, isbn = {978-3-8396-0404-5}, language = {de} } @inproceedings{KoalUlbrichtVierhaus, author = {Koal, Tobias and Ulbricht, Markus and Vierhaus, Heinrich Theodor}, title = {Virtual TMR Schemes Combining Fault Tolerance and Self Repair}, series = {16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 Sep 2013, Santander, Spain}, booktitle = {16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 Sep 2013, Santander, Spain}, publisher = {IEEE}, isbn = {978-0-7695-5074-9}, pages = {235 -- 242}, language = {en} } @inproceedings{UlbrichtKoalVierhaus, author = {Ulbricht, Markus and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Activity Migration in M-of-N-Systems by Means of Loading-Balancing}, series = {15th Euromicro Conference on Digital Systems Design (DSD), September 2012}, booktitle = {15th Euromicro Conference on Digital Systems Design (DSD), September 2012}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-4673-2498-4}, pages = {258 -- 263}, language = {en} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {Logic Self Repair Architecture with Self Test Capabilities}, series = {Zuverl{\"a}ssigkeit und Entwurf, 6. GMM/GI/ITG-Fachtagung vom 25. bis 27. September 2012 in Bremen}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 6. GMM/GI/ITG-Fachtagung vom 25. bis 27. September 2012 in Bremen}, editor = {Drechsler, Rolf}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3445-0}, language = {en} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {On-Line-Test, Fehlerkorrektur znd Selbstreparatur mit Time-Shared TMR}, series = {Tagungsband Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), April 2013}, booktitle = {Tagungsband Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), April 2013}, editor = {Dietrich, Manfred}, publisher = {Fraunhofer-Verl.}, address = {Stuttgart}, isbn = {978-3-8396-0545-5}, language = {de} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {On the Feasibility of Combining On-Line-Test and Self Repair for Logic Circuits}, series = {16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2013), Karlovny Vary, April 2013}, booktitle = {16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2013), Karlovny Vary, April 2013}, editor = {Sekanina, Lukas}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-6135-4}, language = {en} } @inproceedings{SchoelzelKoalRoederetal., author = {Sch{\"o}lzel, Mario and Koal, Tobias and R{\"o}der, Stephanie and Vierhaus, Heinrich Theodor}, title = {Towards an Automatic Generation of Diagnostic In-Field SBST for Processor Components}, series = {Proceedings, 14th IEEE Latin American Test Workshop (LATW 2013)}, booktitle = {Proceedings, 14th IEEE Latin American Test Workshop (LATW 2013)}, publisher = {IEEE}, address = {Piscataway}, pages = {6}, language = {en} } @misc{GleichnerKoalVierhaus, author = {Gleichner, Christian and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Effiziente Verfahren der Selbstreparatur von Logik}, abstract = {22. ITG/GI/GMM Workshop "Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen", 28.Feb.-02.M{\"a}rz 2010}, language = {de} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {An Adaptive Self-Test Routine for In-Field Diagnosis of Permanent Faults in Simple RISC Cores}, series = {Proceedings, 15th IEEE Interantional Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, April 2012}, booktitle = {Proceedings, 15th IEEE Interantional Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, April 2012}, editor = {Raik, Jaan}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-4673-1185-4}, pages = {312 -- 317}, language = {en} }