@inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors}, series = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, booktitle = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, isbn = {978-1-4244-9755-3}, pages = {143 -- 146}, abstract = {Tagungsbeitrag DDECS 2011, Cottbus}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hiararchical Built-In SElf Test with On-Chip Diagnosis for VLIW Processors}, abstract = {Tagungsbeitrag 23. ITG-Tagung "Test und Zuverl{\"a}ssigeit von Schaltungen und Systemen", Passau, 2011}, language = {en} } @inproceedings{KoalScheitVierhaus, author = {Koal, Tobias and Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Schwachstellen und Engp{\"a}sse bei Verfahren zur Fehlerkompensation und Selbstreparatur f{\"u}r hochintegrierte Schaltungen}, series = {Zuverl{\"a}ssigkeit und Entwurf, 4. GMM/GI/ITG-Fachtagung vom 13. bis 15. September 2010 in Wildbad Kreuth}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 4. GMM/GI/ITG-Fachtagung vom 13. bis 15. September 2010 in Wildbad Kreuth}, publisher = {VDE-Verlag}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3299-9}, pages = {57 -- 62}, language = {de} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Combining De-Stressing and Self Repair for Long-Term Dependable Systems}, series = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, booktitle = {2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4244-6613-9}, pages = {99 -- 104}, language = {en} } @inproceedings{KoalScheitSchoelzeletal., author = {Koal, Tobias and Scheit, Daniel and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {On the Feasibility of Built-in Self Repair for Logic Circuits}, series = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-1713-0}, pages = {316 -- 324}, language = {en} } @inproceedings{GalkeKoalVierhaus, author = {Galke, Christian and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {M{\"o}glichkeiten und Grenzen der automatischen SBST-Generierung f{\"u}r einfache Prozessoren}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS' 2007), 8. - 9. Mai 2007}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS' 2007), 8. - 9. Mai 2007}, publisher = {TUDpress, Verl. der Wissenschaften}, address = {Dresden}, isbn = {978-3-940046-28-4}, pages = {39 -- 44}, language = {de} }