@article{MuellerHoffmannMilkoetal., author = {M{\"u}ller, Klaus and Hoffmann, Patrick and Milko, S. and Burkov, Yevgen and Schmeißer, Dieter}, title = {PEEM and µ-NEXAFS of Cu-In-S-Surfaces}, abstract = {The composition of CuInS2-films tends to differ from the ideal ratio of 1:1:2. A molecularlyvariation of dm=[Cu]/[In]-1 not equal 0 occurs due to the formation of binary phases as segregation's at the surface, as crystallites in the bulk of the film or at the surface of grains [1]. Furthermore, the range of homogeneity of the phase CuInS2 is relatively large caused by a low enthalpy of formation of defects like Cu-vacancies [2]. Segregation's at surfaces can be removed by KCN etching or by an electrochemical process [3, 4] We investigated the effect of an in-situ-heat-treatment of samples, prepared in the Cu-rich regime with additional amounts of copper, deposited on the surface of the Cu-In-S-films.We used Cu-In-S-films on molybdenum, prepared from precursors of Cu/In and a following reactive annealing-process in a sulphur-atmosphere. The experiments were performed as follows: The surface of the films was cleaned in situ to remove CuS-Phases by Argon-bombardment. The thin layers of additional Copper were prepared by evaporation of copper metal in Knudsen-cells. The thickness of this copper-films is in the range of monolayers, revealed by a calibration with copper on iron-substrates. After this deposition the samples were heated up to several temperatures (up to 550 ºC) for ten minutes, respectively. Here the molybdenum back-contact was used as electrical heater.}, language = {en} } @article{MuellerMilkoSchmeisser, author = {M{\"u}ller, Klaus and Milko, S. and Schmeißer, Dieter}, title = {Preparation of stoichiometric CuInS2-surfaces - an XPS, UPS-study}, series = {Thin Solid Films}, volume = {431-432}, journal = {Thin Solid Films}, issn = {0040-6090}, pages = {312 -- 316}, abstract = {CuInS2 films are investigated with photoelectron spectroscopy. We find significant deviation from the stoichiometric composition depending on the preparation on the films. For Cu-rich films (start composition) we show that by Ar sputtering and annealing the surface composition varies along a binary cut of the Cu-In-S ternary phase diagram. We also present a novel technique which brings the surface composition close to the stoichiometric stability range of the CuInS2 phase. The technique used the evaporation of Cu on the sputter cleaned surface.}, language = {en} } @misc{MuellerBurkovSchmeisser, author = {M{\"u}ller, Klaus and Burkov, Yevgen and Schmeißer, Dieter}, title = {PEEM and my-NEXAFS of Cu-In-S2-surfaces}, series = {Thin Solid Films}, volume = {431-432}, journal = {Thin Solid Films}, issn = {0040-6090}, pages = {307 -- 311}, abstract = {Polycrystalline CuInS2 samples are an ideal system for photoemission electron microscope studies. The polycrystalline grains have a diameter of approximately 5 small mu, Greekm and the system is expected to be highly inhomogeneous because of the existence of many sub-phases. We used a recently established procedure to reproducibly obtain stoichiometric CuInS2-surfaces and follow the changes in the morphology, the elemental inhomogeneous distribution, and the development of the electronic structure upon its preparation. We find that the individual grains trend to coagulate, the surface composition becomes more homogeneous, and identify characteristic features of the unoccupied DOS.}, language = {en} } @misc{MuellerPaloumpaSchmeisser, author = {M{\"u}ller, Klaus and Paloumpa, Ioanna and Schmeißer, Dieter}, title = {Carbon-plot-microstructuring for all-polymer-transistors}, series = {Synthetic Metals}, volume = {138}, journal = {Synthetic Metals}, number = {1-2}, issn = {0379-6779}, pages = {271 -- 273}, abstract = {This contribution describes the use of a low-cost technology to produce organic microstructures for electronically applications. With a computer driven plotter, substrates like printing foil and colloidal graphite (diluted in water) for the electrodes, we realised channel lengths of 20±10 microm. Compared with transistor devices, fabricated using conventional photolithographic methods and the same semiconducting material, this technique is a hopeful approach to produce microelectronic structures that are low-cost and all-organic.}, language = {en} } @incollection{MuellerBaerHenkeletal., author = {M{\"u}ller, Klaus and B{\"a}r, Werner and Henkel, Karsten and Jahnke, Agnes and Schwiertz, Carola and Schmeißer, Dieter}, title = {Organische Feldeffekttransistoren als Transducer in der Biosensorik}, publisher = {w.e.b.-Univ.-Verl.}, address = {Dresden}, isbn = {3-935712-92-8}, pages = {119 -- 223}, language = {de} } @misc{MuellerGoryachkoBurkovetal., author = {M{\"u}ller, Klaus and Goryachko, Andriy and Burkov, Yevgen and Schwiertz, Carola and Ratzke, Markus and K{\"o}ble, J. and Reif, J{\"u}rgen and Schmeißer, Dieter}, title = {Scanning Kelvin Probe Microscopy and Photoemission electron microscopy of organic source-drain structures}, series = {Synthetic Metals}, volume = {146}, journal = {Synthetic Metals}, number = {3}, issn = {0379-6779}, pages = {377 -- 382}, abstract = {n order to optimize organic field effect transistors (OFETs), the characterisation of active-layer surfaces in terms of their roughness, chemical composition and distribution of surface potentials is important. We report on high-resolution microscopic mapping of organic source-drain structures with P3HT as the semiconductor by scanning Kelvin probe microscopy (SKPM) and photoemission electron microscopy (PEEM). It was shown that PEEM is able to characterise the surface morphology (roughness), the chemical homogeneity and the composition of organic structures. The two-dimensional mapping of surface potentials by SKPM with applied source-drain voltages is shown to be an important ingredient of OFETs failure mode analysis.}, language = {en} } @article{Mueller, author = {M{\"u}ller, Klaus}, title = {PEEM studies of KCN-etched CuInS2 surfaces}, language = {de} } @article{Mueller, author = {M{\"u}ller, Klaus}, title = {PEEM imaging contrast in an operating organic electronic device}, language = {en} } @article{Mueller, author = {M{\"u}ller, Klaus}, title = {Spectro-Microscopic Characterisation of CuInS2 Surfaces}, abstract = {hotoemission electron microscopy (PEEM) is used to study CuInS2 surfaces. CuInS2 (CIS) is used as polycrystalline absorber layer for thin film solar cells. A characterisation in terms of morphological information, elemental distribution, and of doping inhomogeneities at the surface is very important. We demonstrate that the method is capable for such surface studies in high lateral resolution. The use of synchrotron radiation allows the visualization of chemical inhomogeneities in single grains. By taking PEEM images around the absorption edges of Cu, In, or S, we are able to map elemental distributions, separated from morphology-dependent information in the PEEM image.}, language = {en} } @misc{MuellerPaloumpaHenkeletal., author = {M{\"u}ller, Klaus and Paloumpa, Ioanna and Henkel, Karsten and Schmeißer, Dieter}, title = {A polymer high-k dielectric insulator for organic field effect Transistors}, series = {Journal of Applied Physics}, volume = {98}, journal = {Journal of Applied Physics}, number = {5}, issn = {0021-8979}, pages = {S. 056104}, language = {en} } @misc{HenkelSohalTorcheetal., author = {Henkel, Karsten and Sohal, Rakesh and Torche, Mohamed and Paloumpa, Ioanna and M{\"u}ller, Klaus and Hoffmann, Patrick and Schmeißer, Dieter}, title = {Grenzfl{\"a}chenoptimierung f{\"u}r funktionale D{\"u}nnschichtsysteme: Oxide und Polymere}, series = {Forum der Forschung}, volume = {9}, journal = {Forum der Forschung}, number = {18}, issn = {0947-6989}, pages = {49 -- 56}, language = {de} } @article{MuellerScheerSchmeisseretal., author = {M{\"u}ller, Klaus and Scheer, R. and Schmeißer, Dieter and Burkov, Yevgen}, title = {Preparation of stoichiometric CuInS2-Surfaces}, series = {Thin Solid Films}, volume = {451-452}, journal = {Thin Solid Films}, issn = {0040-6090}, pages = {120 -- 123}, language = {en} } @article{MuellerBurkovSchmeisser, author = {M{\"u}ller, Klaus and Burkov, Yevgen and Schmeißer, Dieter}, title = {Photo-Emission-Electron-Microscopy for Characterization of an Operating Organic Electronic Device}, language = {en} } @article{MuellerPaloumpaSchmeisseretal., author = {M{\"u}ller, Klaus and Paloumpa, Ioanna and Schmeißer, Dieter and Henkel, Karsten}, title = {Organic thin film transistors with polymer high-k dielectric insulator}, language = {en} }