@article{ArguirovSeifertKittleretal., author = {Arguirov, Tzanimir V. and Seifert, Winfried and Kittler, Martin and Reif, J{\"u}rgen}, title = {Temperature Behaviour of Extended Defects in Solar Grade Silicon Investigated by Photoluminescence and EBIC}, language = {en} } @article{ArguirovKittlerSeifertetal., author = {Arguirov, Tzanimir V. and Kittler, Martin and Seifert, Winfried and Reif, J{\"u}rgen and Bolze, D. and Ehwald, K.-E. and Formanek, Peter}, title = {Luminescence of Crystal Defects Formed after Annealing of Phosphorus Implanted Silicon}, series = {Solid State Phenomena}, volume = {95-96}, journal = {Solid State Phenomena}, issn = {1012-0394}, pages = {289 -- 296}, language = {en} } @article{RatzkeYuVyvenkoetal., author = {Ratzke, Markus and Yu, Xuegong and Vyvenko, Oleg F. and Reif, J{\"u}rgen and Kittler, Martin and Reiche, Manfred}, title = {Scanning Probe studies of the electrical activity at interfaces formed by silicon wafer direct bonding}, series = {Physica Status Solidi C}, volume = {4}, journal = {Physica Status Solidi C}, number = {8}, issn = {1610-1634}, pages = {2893 -- 3897}, language = {en} } @inproceedings{KittlerArguirovSeifert, author = {Kittler, Martin and Arguirov, Tzanimir V. and Seifert, Winfried}, title = {Silicon-based Light Emission after Ion Implantation}, series = {Optoelectronic integration on silicon, 27 - 28 January 2004, San Jose, California, USA}, booktitle = {Optoelectronic integration on silicon, 27 - 28 January 2004, San Jose, California, USA}, editor = {Robbins, David J.}, publisher = {SPIE}, address = {Bellingham, Wash.}, isbn = {0-8194-5265-3}, pages = {S. 164}, language = {en} } @inproceedings{HoffmannMikaloBatcheloretal., author = {Hoffmann, Patrick and Mikalo, Ricardo Pablo and Batchelor, David R. and Beuckert, Guido and Schmeißer, Dieter and Kittler, Martin and Ourmazd, A. and Lewerenz, Hans-Joachim}, title = {Solare Energieumwandlung in d{\"u}nnen Schichten}, language = {de} } @article{HoffmannMikaloSchmeisseretal., author = {Hoffmann, Patrick and Mikalo, Ricardo Pablo and Schmeißer, Dieter and Kittler, Martin}, title = {A spectro-microscopic approach to study the morphology and elemental distribution of mc-Si surfaces}, language = {en} } @misc{SchmidMankovicsArguirovetal., author = {Schmid, Reiner P. and Mankovics, Daniel and Arguirov, Tzanimir V. and Ratzke, Markus and Mtchedlidze, T. and Kittler, Martin}, title = {Rapid dislocation-related D1-photoluminescence imaging of multicrystalline Si wafers at room temperature}, series = {Physica Status Solidi : A}, volume = {208}, journal = {Physica Status Solidi : A}, number = {4}, issn = {1610-1642}, doi = {10.1002/pssa.201026269}, pages = {888 -- 892}, language = {en} } @misc{SchmidMankovicsArguirovetal., author = {Schmid, Reiner P. and Mankovics, Daniel and Arguirov, Tzanimir V. and Mtchedlidze, T. and Kittler, Martin}, title = {Novel imaging techniques for dislocation-related D1-photo-luminescence of multicrystalline Si wafers - two different approaches}, language = {en} } @misc{SteffensBeckerAmkreutzetal., author = {Steffens, S. and Becker, C. and Amkreutz, Daniel and Klossek, Andr{\´e} and Kittler, Martin and Chen, Y.-Y. and Schnegg, Alexander and Klingsporn, Max and Abou-Ras, Daniel and Lips, Klaus and Rech, Bernd}, title = {Impact of Dislocations and Dangling Bond Defects on The Electrical Performance of Crystalline Silicon Thin Films}, series = {Applied Physics Letters}, volume = {105}, journal = {Applied Physics Letters}, number = {2}, issn = {1077-3118}, doi = {10.1063/1.4890625}, pages = {022108}, language = {en} } @inproceedings{ReicheKittlerKrauseetal., author = {Reiche, Manfred and Kittler, Martin and Krause, M. and {\"U}bensee, Hartmut}, title = {Carrier Transport on Dislocations}, series = {International Conference on Defects in Semiconductors 2013, proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013, Bologna, Italy, 21-26 July 2013}, booktitle = {International Conference on Defects in Semiconductors 2013, proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013, Bologna, Italy, 21-26 July 2013}, editor = {Cavallini, Anna and Estreicher, Stefan K.}, publisher = {AIP Publishing}, address = {Melville, New York}, isbn = {978-0-7354-1215-6}, doi = {10.1063/1.4865599}, language = {en} } @misc{ReicheKittlerUebenseeetal., author = {Reiche, Manfred and Kittler, Martin and {\"U}bensee, Hartmut and Pippel, Eckhard and Hopfe, Sigrid}, title = {Dislocations as Native Nanostructures - Electronic Properties}, series = {Advances in Nano Research}, volume = {2}, journal = {Advances in Nano Research}, number = {1}, issn = {2287-2388}, doi = {10.12989/anr.2014.2.1.001}, pages = {1 -- 14}, language = {en} } @misc{ReicheKittlerErfurthetal., author = {Reiche, Manfred and Kittler, Martin and Erfurth, Wilfried and Pippel, Eckhard and Sklarek, Kornelia and Blumtritt, Horst and Haehnel, Angelika and {\"U}bensee, Hartmut}, title = {On the Electronic Properties of a Single Dislocation}, series = {Journal of Applied Physics}, volume = {115}, journal = {Journal of Applied Physics}, number = {19}, issn = {1089-7550}, doi = {10.1063/1.4876265}, pages = {194303}, language = {en} }