@misc{BielefeldtBasenerKhanetal., author = {Bielefeldt, Jens and Basener, Kai-Uwe and Khan, Siddique R. and Massah, Mozhdeh and Wiesbrock, Hans-Werner and Scharoba, Stefan and H{\"u}bner, Michael}, title = {DeepTest: How Machine Learning Can Improve the Test of Embedded Systems }, series = {10th Mediterranean Conference on Embedded Computing (MECO), 7-10 June 2021}, journal = {10th Mediterranean Conference on Embedded Computing (MECO), 7-10 June 2021}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-6654-3912-1}, doi = {10.1109/meco52532.2021.9460182}, pages = {1 -- 6}, language = {en} } @misc{BielefeldtBasenerKhanetal., author = {Bielefeldt, Jens and Basener, Kai-Uwe and Khan, Siddique R. and Massah, Mozhdeh and Wiesbrock, Hans-Werner and Scharoba, Stefan and H{\"u}bner, Michael}, title = {Einsatz von Deep Learning f{\"u}r den Test Eingebetteter Systeme }, series = {Informatik 2021: computer science \& sustainability, 27. September-01. Oktober 2021, Berlin}, journal = {Informatik 2021: computer science \& sustainability, 27. September-01. Oktober 2021, Berlin}, publisher = {Gesellschaft f{\"u}r Informatik e.V.}, address = {Bonn}, isbn = {978-3-88579-708-1}, doi = {10.18420/INFORMATIK2021-166}, language = {de} }