@misc{JenihhinHamdiouiSonzaReordaetal., author = {Jenihhin, Maksim and Hamdioui, Said and Sonza-Reorda, Matteo and Krstic, Milos and Langend{\"o}rfer, Peter and Sauer, Christian and Klotz, Anton and H{\"u}bner, Michael and Nolte, J{\"o}rg and Vierhaus, Heinrich Theodor and Selimis, Georgions and Alexandrescu, Dan and Taouil, Mottaqiallah and Schrijen, Geert-Jan and Sterpone, Luca and Squillero, Giovanni and Dyka, Zoya and Raik, Jaan}, title = {RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems}, series = {ArXiv.org}, journal = {ArXiv.org}, pages = {7}, language = {en} } @misc{AzadNiazmandJansonetal., author = {Azad, Siavoosh Payandeh and Niazmand, Behrad and Janson, Karl and George, Nevin and Oyeniran, Stephen Adeboye and Putkaradze, Tsotne and Kaur, Apneet and Raik, Jaan and Jervan, Gert and Ubar, Raimund and Hollstein, Thomas}, title = {From online fault detection to fault management in Network-on-Chips: A ground-up approach}, series = {IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), Dresden, Germany, 19-21 April 2017}, journal = {IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), Dresden, Germany, 19-21 April 2017}, isbn = {978-1-5386-0472-4}, issn = {2473-2117}, doi = {10.1109/DDECS.2017.7934565}, language = {en} } @book{VierhausSteiningerPawlaketal., author = {Vierhaus, Heinrich Theodor and Steininger, Andreas and Pawlak, A. and Kraemer, Rolf and Sch{\"o}lzel, Mario and Raik, Jaan}, title = {Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems}, publisher = {Piscataway : IEEE, 2011}, isbn = {978-1-4244-9753-9}, language = {en} }