@inproceedings{LauFrankShietal., author = {Lau, Isabella and Frank, Martin and Shi, Kilin and Lurz, Fabian and Talai, Armin and Weigel, Robert and K{\"o}lpin, Alexander}, title = {An Accurate Free Space Method for Material Characterization in W-Band Using Material Samples with Two Different Thicknesses}, series = {Proceedings of the 48th European Microwave Conference, Madrid (Spain), 2018}, booktitle = {Proceedings of the 48th European Microwave Conference, Madrid (Spain), 2018}, doi = {10.23919/EuMC.2018.8541437}, pages = {202 -- 205}, language = {en} } @inproceedings{LauMichlerTalaietal., author = {Lau, Isabella and Michler, Fabian and Talai, Armin and Weigel, Robert and K{\"o}lpin, Alexander}, title = {A Resonant Substrate Integrated Waveguide Measurement System for True Relative Permittivity Extraction of PCB Materials up to 90 GHz}, series = {2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) : 16-18 July 2018}, booktitle = {2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) : 16-18 July 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-5569-6}, doi = {10.1109/IMWS-AMP.2018.8457133}, pages = {3}, language = {en} } @misc{LauHajianMichleretal., author = {Lau, Isabella and Hajian, Ali and Michler, Fabian and Gold, Gerald and Lurz, Fabian and Schmid, Ulrich and Helmreich, Klaus and Weigel, Robert and K{\"o}lpin, Alexander}, title = {Influence of the PCB Manufacturing Process on the Measurement Error of Planar Relative Permittivity Sensors Up To 100 GHz}, series = {IEEE Transactions on Microwave Theory and Techniques}, volume = {67}, journal = {IEEE Transactions on Microwave Theory and Techniques}, number = {7}, issn = {1557-9670}, doi = {10.1109/TMTT.2019.2910114}, pages = {2793 -- 2804}, language = {en} }