@inproceedings{GalkeKotheSchultkeetal., author = {Galke, Christian and Kothe, Ren{\´e} and Schultke, Sabine and Winkler, Christin and Honko, Jeanette and Vierhaus, Heinrich Theodor}, title = {Embedded Scan Test with Diagnostic Features for Self-Testing SoCs}, series = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, booktitle = {Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {978-0-7695-2620-1}, pages = {181 -- 182}, language = {en} }