@inproceedings{KotheGalkeSchultkeetal., author = {Kothe, Ren{\´e} and Galke, Christian and Schultke, Sabine and Fr{\"o}schke, Henry and Gaede, Steffen and Vierhaus, Heinrich Theodor}, title = {Hardware/Software Based Hierarchical Self Test for SoCs}, series = {Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic}, booktitle = {Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {1-4244-0185-2}, pages = {157 -- 158}, language = {en} } @misc{KotheHabermannVierhaus, author = {Kothe, Ren{\´e} and Habermann, Sven and Vierhaus, Heinrich Theodor}, title = {Selbstreparatur von Logik-Baugruppen in hochintegrierten Schaltungen - M{\"o}glichkeiten und Grenzen}, series = {Forum der Forschung}, volume = {10}, journal = {Forum der Forschung}, number = {19}, issn = {0947-6989}, pages = {125 -- 130}, language = {de} } @inproceedings{ScheitVierhaus, author = {Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Fehlertolerante integrierte Verbindungsstrukturen}, series = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS'2008)}, booktitle = {Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS'2008)}, editor = {Elst, G.}, publisher = {Fraunhofer Institut f{\"u}r integrierte Schaltungen}, address = {Dresden}, isbn = {3-9810287-2-4}, pages = {15 -- 16}, language = {de} } @inproceedings{KotheVierhaus, author = {Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {Fault Diagnosis in Logic Circuits Exploiting Regularity}, series = {Tagungsband, edaWorkshop 08, Hannover, 6. - 7. Mai 2008}, booktitle = {Tagungsband, edaWorkshop 08, Hannover, 6. - 7. Mai 2008}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3101-5}, pages = {57 -- 62}, language = {en} } @inproceedings{ScheitVierhaus, author = {Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Fehlertoleranz und Selbstreparatur von Verbindungsstrukturen auf SoCs}, series = {20. ITG-GI-Workshop, Wien, TUZ 2008}, booktitle = {20. ITG-GI-Workshop, Wien, TUZ 2008}, editor = {Steininger, Andreas}, publisher = {Techn. Univ.}, address = {Wien}, pages = {121 -- 126}, language = {de} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Logic Self Repair Based on Regular Building Blocks}, series = {Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands}, booktitle = {Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands}, publisher = {VDE-Verl.}, address = {Berlin [u.a.]}, isbn = {978-3-8007-3133-6}, pages = {71 -- 76}, language = {en} } @inproceedings{ScheitVierhaus, author = {Scheit, Daniel and Vierhaus, Heinrich Theodor}, title = {Self Repair Technology for Global Interconnects on SoCs}, series = {Design and test technology for dependable systems-on-chip}, booktitle = {Design and test technology for dependable systems-on-chip}, publisher = {Information Science Reference}, address = {Hershay, Pa. [u.a.]}, isbn = {978-1-6096-0212-3}, pages = {195 -- 215}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Built-in Self Repair for Logic Structures}, series = {Design and test technology for dependable systems-on-chip}, booktitle = {Design and test technology for dependable systems-on-chip}, publisher = {Information Science Reference}, address = {Hershay, Pa. [u.a.]}, isbn = {978-1-6096-0212-3}, language = {en} } @inproceedings{KoalKotheVierhaus, author = {Koal, Tobias and Kothe, Ren{\´e} and Vierhaus, Heinrich Theodor}, title = {SoC Self Test Based on a Test Processor}, series = {Design an Test Technology for Dependable Systems on Chip}, booktitle = {Design an Test Technology for Dependable Systems on Chip}, publisher = {IGI Global}, address = {Hershey [u.a.]}, isbn = {978-1-6096-0212-3}, pages = {360 -- 375}, language = {en} } @inproceedings{KoalUlbrichtVierhaus, author = {Koal, Tobias and Ulbricht, Markus and Vierhaus, Heinrich Theodor}, title = {Combining On-Line Fault Detection and Logic Self Repair}, series = {IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012}, booktitle = {IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012}, editor = {Raik, Jaan}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-1185-4}, pages = {288 -- 293}, language = {en} } @inproceedings{KoalUlbrichtEngelkeetal., author = {Koal, Tobias and Ulbricht, Markus and Engelke, Piet and Vierhaus, Heinrich Theodor}, title = {Kombinierte On-Line-Fehlerkompensation und Selbstreparatur f{\"u}r Logik-Baugruppen}, series = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 25. GI/GMM/ITG-Workshop, 24. bis 26. Februar 2013, Dresden}, booktitle = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen, 25. GI/GMM/ITG-Workshop, 24. bis 26. Februar 2013, Dresden}, publisher = {Fraunhofer-Institut}, address = {Dresden}, language = {de} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Combining Fault Tolerance and Self Repair at Minimum Cost in Power and Hardware}, series = {IEEE International Symposium DDECS 2014, Warschau}, booktitle = {IEEE International Symposium DDECS 2014, Warschau}, publisher = {IEEE CS Press}, isbn = {978-1-4799-4560-3}, pages = {153 -- 159}, language = {en} } @inproceedings{UrbanLehnigerHeyneetal., author = {Urban, Roberto and Lehniger, Kai and Heyne, Maximilian and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Vergleich der Beschreibung und Simulation einer Befehlssatzarchitektur in LISA und CoMet}, series = {MBMV 2014, B{\"o}blingen, Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen}, booktitle = {MBMV 2014, B{\"o}blingen, Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen}, publisher = {Cuvillier Verlag}, address = {G{\"o}ttingen}, isbn = {978-3-95404-637-9}, pages = {101 -- 112}, language = {de} } @inproceedings{UrbanSchoelzelVierhaus, author = {Urban, Roberto and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Entwicklungsumgebung f{\"u}r den compilerzentrierten Mikroprozessorentwurf (CoMet)}, series = {DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband}, booktitle = {DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband}, publisher = {Fraunhofer Verlag}, address = {Stuttgart}, isbn = {978-3-8396-0738-1}, language = {de} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Reconfigurable High Performance Architectures}, series = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, booktitle = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, publisher = {IEEE}, isbn = {978-1-4799-3415-7}, pages = {8}, language = {en} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Systematic Generation of Diagnostic Software-Based Self-Test Routines for Processor Components}, series = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, booktitle = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, publisher = {IEEE}, isbn = {978-1-4799-3415-7}, pages = {6}, language = {en} } @inproceedings{MuellerKoalSchoelzeletal., author = {M{\"u}ller, Sebastian and Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Timing for Virtual TMR in Logic Circuits}, series = {IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014}, booktitle = {IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014}, isbn = {978-1-4799-5324-0}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Probleme bei Erzeugung und simulationsbasierten Validierung softwarebasierter Selbsttests zur feingranularen Diagnose}, series = {DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband}, booktitle = {DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband}, publisher = {Fraunhofer Verlag}, address = {Stuttgart}, isbn = {978-3-8396-0738-1}, language = {de} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Diagnostics self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults}, series = {International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014}, booktitle = {International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6155-9}, pages = {27 -- 32}, language = {en} } @inproceedings{ScharobaSchoelzelVierhaus, author = {Scharoba, Stefan and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {On reliability Estimation for Combined Transient and Permanent Fault Handling}, series = {14th Biennial Baltic Electronic Conference (BEC), Tallinn, Estonia, 6-8 October 2014}, booktitle = {14th Biennial Baltic Electronic Conference (BEC), Tallinn, Estonia, 6-8 October 2014}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-9539-7}, pages = {73 -- 76}, language = {en} } @misc{KoalScharobaVierhaus, author = {Koal, Tobias and Scharoba, Stefan and Vierhaus, Heinrich Theodor}, title = {Combining Correction of Delay Faults and Transient Faults}, series = {18th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS 2015}, journal = {18th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6780-3}, pages = {99 -- 102}, language = {en} } @inproceedings{ScharobaKoalVierhaus, author = {Scharoba, Stefan and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Combined Detection and Correction of Transient Faults and Delay Faults}, series = {ZuE 2015, Zuverl{\"a}ssigkeit und Entwurf, Beitr{\"a}ge der 8. GMM/ITG/GI-Fachtagung 21. - 23. September 2015 in Siegen}, booktitle = {ZuE 2015, Zuverl{\"a}ssigkeit und Entwurf, Beitr{\"a}ge der 8. GMM/ITG/GI-Fachtagung 21. - 23. September 2015 in Siegen}, publisher = {VDE-Verlag}, address = {Berlin}, isbn = {978-3-8007-4071-0}, language = {en} } @inproceedings{SchoelzelKoalScharobaetal., author = {Sch{\"o}lzel, Mario and Koal, Tobias and Scharoba, Stefan and Vierhaus, Heinrich Theodor}, title = {A Multi-Layer Software Based Fault-Tolerance Approach for Heterogenous Multi-Core Systems}, series = {16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015}, booktitle = {16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-6710-3}, pages = {1 -- 6}, language = {en} } @inproceedings{UrbanSchoelzelVierhausetal., author = {Urban, Roberto and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor and Altmann, Enrico and Seelig, Horst}, title = {Compiler-Centred Microprocessors Design (CoMet) - From C-Code to a VHDL Model of an ASIP}, series = {18th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS 2015, 22-24 April 2015, Belgrade, Serbia, proceedings}, booktitle = {18th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems, DDECS 2015, 22-24 April 2015, Belgrade, Serbia, proceedings}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6779-7}, pages = {17 -- 22}, language = {en} } @inproceedings{KoalScharobaVierhaus, author = {Koal, Tobias and Scharoba, Stefan and Vierhaus, Heinrich Theodor}, title = {Exploring diagnostic capabilities of software-based self-tests for production and in-field application}, series = {Proceedings of the 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM), June 22-24, 2015, Liberec, Czech Republic}, booktitle = {Proceedings of the 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM), June 22-24, 2015, Liberec, Czech Republic}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6970-8}, pages = {1 -- 6}, language = {en} } @inproceedings{ScharobaVierhaus, author = {Scharoba, Stefan and Vierhaus, Heinrich Theodor}, title = {Towards an Interactive Dependability-Aware Design Space Exploration}, series = {Proceedings of the work in progress session held in connection with SEAA 2015, the 41st EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2015, the 18th EUROMICRO Conference on Digital System Design, Funchal, Madeira}, booktitle = {Proceedings of the work in progress session held in connection with SEAA 2015, the 41st EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2015, the 18th EUROMICRO Conference on Digital System Design, Funchal, Madeira}, publisher = {Johannes Kepler Universit{\"a}t}, address = {Linz}, isbn = {978-3-902457-44-8}, language = {en} } @inproceedings{Vierhaus, author = {Vierhaus, Heinrich Theodor}, title = {Error Resilience in Digital Integrated Circuits}, series = {Proceedings of the 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM), June 22-24, 2015, Liberec, Czech Republic}, booktitle = {Proceedings of the 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM), June 22-24, 2015, Liberec, Czech Republic}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6970-8}, language = {en} } @inproceedings{KoalVierhaus, author = {Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Redundancy evaluation process of processor components for permanent fault compensation}, series = {2015 NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2015), Montr{\´e}al, Quebec, Canada, 15-18 June 2015}, booktitle = {2015 NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2015), Montr{\´e}al, Quebec, Canada, 15-18 June 2015}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4673-7501-6}, pages = {1 -- 6}, language = {en} } @inproceedings{GleichnerVierhaus, author = {Gleichner, Christian and Vierhaus, Heinrich Theodor}, title = {Test eingebetteter Prozessoren im Zielsystem mit hoher diagnostischer Aufl{\"o}sung}, series = {Informatik 2015, Tagung vom 28. September - 2. Oktober 2015 in Cottbus}, booktitle = {Informatik 2015, Tagung vom 28. September - 2. Oktober 2015 in Cottbus}, editor = {Cunningham, Douglas William and Hofstedt, Petra and Meer, Klaus and Schmitt, Ingo}, publisher = {Gesellschaft f{\"u}r Informatik}, address = {Bonn}, isbn = {978-3-88579-640-4}, pages = {1399 -- 1414}, language = {de} } @inproceedings{DicoratoVierhaus, author = {Dicorato, Davide and Vierhaus, Heinrich Theodor}, title = {Detection and Correction of Logic Errors Using Extra Time Slots}, series = {Informatik 2015, Tagung vom 28. September - 2. Oktober 2015 in Cottbus}, booktitle = {Informatik 2015, Tagung vom 28. September - 2. Oktober 2015 in Cottbus}, editor = {Cunningham, Douglas William and Hofstedt, Petra and Meer, Klaus and Schmitt, Ingo}, publisher = {Gesellschaft f{\"u}r Informatik}, address = {Bonn}, isbn = {978-3-88579-640-4}, pages = {1431 -- 1444}, language = {de} } @inproceedings{ScharobaLorenzVierhaus, author = {Scharoba, Stefan and Lorenz, Jacob and Vierhaus, Heinrich Theodor}, title = {IDDD: An Interactive Dependability Driven Design Space Exploration}, series = {2016 Design, Automation \& Test in Europe Conference \& Exhibition (DATE), 14 - 18 March 2016 ICC, Dresden, Germany}, booktitle = {2016 Design, Automation \& Test in Europe Conference \& Exhibition (DATE), 14 - 18 March 2016 ICC, Dresden, Germany}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-3-9815370-6-2}, language = {en} } @inproceedings{PfeiferGleichnerVierhaus, author = {Pfeifer, Petr and Gleichner, Christian and Vierhaus, Heinrich Theodor}, title = {Flexible Test, Error Detection and Correction in Dependable Communication Systems incl. Results on 28nm Xilinx and Altera FPGAs}, series = {2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), Kosice, Slovakia, 2016}, booktitle = {2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), Kosice, Slovakia, 2016}, isbn = {978-80-8086-256-5}, pages = {26 -- 31}, language = {en} } @inproceedings{GleichnerVierhaus, author = {Gleichner, Christian and Vierhaus, Heinrich Theodor}, title = {Test of automotive embedded processors with high diagnostic resolution}, series = {2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), Kosice, Slovakia, 2016}, booktitle = {2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), Kosice, Slovakia, 2016}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-80-8086-256-5}, pages = {1 -- 6}, language = {en} } @misc{UrbanVierhausSchoelzeletal., author = {Urban, Roberto and Vierhaus, Heinrich Theodor and Sch{\"o}lzel, Mario and Altmann, Enrico and Seelig, Horst}, title = {Non-Cyclic Design Space Exploration for ASIPS - Compiler-Centered Microprocessor Design (CoMet)}, series = {Journal of Circuits, Systems and Computers}, volume = {25}, journal = {Journal of Circuits, Systems and Computers}, number = {3}, issn = {0218-1266}, doi = {10.1142/S0218126616400120}, pages = {16}, language = {en} } @inproceedings{PfeiferVierhaus, author = {Pfeifer, Petr and Vierhaus, Heinrich Theodor}, title = {Test and Error Correction in a Dependable Wireless Communication System}, series = {BEC 2016, 15th Biennial Baltic Electronics Conference (BEC), Tallinn University of Technology, October 3-5, 2016 Tallinn, Estonia}, booktitle = {BEC 2016, 15th Biennial Baltic Electronics Conference (BEC), Tallinn University of Technology, October 3-5, 2016 Tallinn, Estonia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-1392-0}, pages = {119 -- 122}, language = {en} } @inproceedings{PfeiferVierhaus, author = {Pfeifer, Petr and Vierhaus, Heinrich Theodor}, title = {A New Area-efficient Reconfigurable Encoder Architecture for Flexible Error Detection and Correction in Dependable Communication Systems}, series = {BEC 2016, 15th Biennial Baltic Electronics Conference (BEC), Tallinn University of Technology, October 3-5, 2016 Tallinn, Estonia}, booktitle = {BEC 2016, 15th Biennial Baltic Electronics Conference (BEC), Tallinn University of Technology, October 3-5, 2016 Tallinn, Estonia}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-1392-0}, pages = {87 -- 90}, language = {en} } @inproceedings{PfeiferVierhaus, author = {Pfeifer, Petr and Vierhaus, Heinrich Theodor}, title = {Iterative Error Correction with Double / triple Error Detection}, series = {Signal Processing: Algorithms, Architectures, Arrangements, and Applications (SPA), 21-23 Sept. 2016, Poznan}, booktitle = {Signal Processing: Algorithms, Architectures, Arrangements, and Applications (SPA), 21-23 Sept. 2016, Poznan}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-83-62065-25-7}, pages = {14 -- 19}, language = {en} } @inproceedings{ScharobaVierhaus, author = {Scharoba, Stefan and Vierhaus, Heinrich Theodor}, title = {An Interactive Design Space Exploration Tool for Dependable Integrated Circuits}, series = {DSD 2016, proceedings, 19th Euromicro Conference in Digital System Design, 31 August-2 September 2016, Limassol, Cyprus}, booktitle = {DSD 2016, proceedings, 19th Euromicro Conference in Digital System Design, 31 August-2 September 2016, Limassol, Cyprus}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-2817-7}, pages = {714 -- 717}, language = {en} } @inproceedings{SchoelzelKoalMuelleretal., author = {Sch{\"o}lzel, Mario and Koal, Tobias and M{\"u}ller, Sebastian and Scharoba, Stefan and R{\"o}der, Stephanie and Vierhaus, Heinrich Theodor}, title = {A Comprehensive Software-Based Self-Test and Self-Repair Method for Statically Scheduled Superscalar Processors}, series = {17th IEEE Latin-American Test Symposium - LATS 2016}, booktitle = {17th IEEE Latin-American Test Symposium - LATS 2016}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5090-1331-9}, doi = {10.1109/LATW.2016.7483336}, pages = {33 -- 38}, language = {en} } @inproceedings{DicoratoPfeiferVierhaus, author = {Dicorato, Davide and Pfeifer, Petr and Vierhaus, Heinrich Theodor}, title = {Fault Detection and Self Repair in Hsiao-Code FEC Circuits}, series = {2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), 19-21 April 2017, Dresden, Germany}, booktitle = {2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS), 19-21 April 2017, Dresden, Germany}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0471-7}, pages = {6}, language = {en} } @inproceedings{PfeiferVierhaus, author = {Pfeifer, Petr and Vierhaus, Heinrich Theodor}, title = {On Implementation and Usage of Muller C-element in FPGA-based Dependable Systems}, series = {22nd IEEE International Conference on Applied Electronics, Pilsen, 5-6 September 2017}, booktitle = {22nd IEEE International Conference on Applied Electronics, Pilsen, 5-6 September 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-80-261-0641-8}, pages = {163 -- 166}, language = {en} } @inproceedings{ScharobaVierhaus, author = {Scharoba, Stefan and Vierhaus, Heinrich Theodor}, title = {Fast Power Overhead Prediction for Hardware Redundancy-based Fault Tolerance}, series = {IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), 3-5 July 2017, Hotel Makedonia Palace, Thessaloniki, Greece}, booktitle = {IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), 3-5 July 2017, Hotel Makedonia Palace, Thessaloniki, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0351-2}, pages = {265 -- 270}, language = {en} } @inproceedings{PfeiferHosseinzadehVierhaus, author = {Pfeifer, Petr and Hosseinzadeh, Farnoosh and Vierhaus, Heinrich Theodor}, title = {On Comparison of Configurable Encoders in Xilinx and Altera FPGAs}, series = {22nd 2017 International Conference on Applied Electronics, Pilsen, 5-6 September 2017}, booktitle = {22nd 2017 International Conference on Applied Electronics, Pilsen, 5-6 September 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-80-261-0642-5}, doi = {10.23919/AE.2017.8053605}, pages = {159 -- 162}, language = {en} } @inproceedings{PfeiferHosseinzadehVierhaus, author = {Pfeifer, Petr and Hosseinzadeh, Farnoosh and Vierhaus, Heinrich Theodor}, title = {On Comparison of Robust Configurable FPGA Encoders for Dependable Industrial Communication Systems}, series = {IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), 3-5 July 2017, Thessaloniki, Greece}, booktitle = {IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), 3-5 July 2017, Thessaloniki, Greece}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-0352-9}, pages = {199 -- 200}, language = {en} } @inproceedings{DicoratoPfeiferVierhaus, author = {Dicorato, Davide and Pfeifer, Petr and Vierhaus, Heinrich Theodor}, title = {Hoch-zuverl{\"a}ssige schnelle Encoder / Decoder f{\"u}r drahtlose {\"U}bertragungssysteme}, series = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen (TuZ 2017), 5.-7. M{\"a}rz 2017, L{\"u}beck}, booktitle = {Testmethoden und Zuverl{\"a}ssigkeit von Schaltungen und Systemen (TuZ 2017), 5.-7. M{\"a}rz 2017, L{\"u}beck}, language = {de} } @inproceedings{PfeiferVierhaus, author = {Pfeifer, Petr and Vierhaus, Heinrich Theodor}, title = {Extended Hsiao-Code Error Correction Considering Double and Triple Bit Errors}, series = {RESCUE 2017, Workshop on Reliability, Security and Quality, ETS17 Fringe Workshop, At Limassol, Cyprus}, booktitle = {RESCUE 2017, Workshop on Reliability, Security and Quality, ETS17 Fringe Workshop, At Limassol, Cyprus}, language = {en} } @inproceedings{PfeiferGleichnerVierhaus, author = {Pfeifer, Petr and Gleichner, Christian and Vierhaus, Heinrich Theodor}, title = {Forward Error Correction in Industrial Wireless Communication}, series = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, booktitle = {Zuverl{\"a}ssigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus}, publisher = {VDE Verlag}, address = {Berlin}, isbn = {978-3-8007-4444-2}, language = {en} } @inproceedings{PfeiferVierhaus, author = {Pfeifer, Petr and Vierhaus, Heinrich Theodor}, title = {Forward Error Correction in Wireless Communication Systems for Industrial Applications}, series = {SPA 2017, Signal Processing: Algorithms, Architectures, Arrangements, and Applications, conference proceedings, Poznan, 20-22nd September 2017}, booktitle = {SPA 2017, Signal Processing: Algorithms, Architectures, Arrangements, and Applications, conference proceedings, Poznan, 20-22nd September 2017}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-83-62065-30-1}, pages = {S. 14}, language = {en} } @misc{HosseinzadehPfeiferVierhaus, author = {Hosseinzadeh, Farnoosh and Pfeifer, Petr and Vierhaus, Heinrich Theodor}, title = {Optimal Dependability and Fine Granular Error Resilience Methodology for Reconfigurable Systems}, series = {21st Euromicro Conference on Digital System Design, DSD 2018, 29-31 August 2018, Prague, Czech Republic, proceedings}, journal = {21st Euromicro Conference on Digital System Design, DSD 2018, 29-31 August 2018, Prague, Czech Republic, proceedings}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-7377-5}, doi = {10.1109/DSD.2018.00048}, pages = {206 -- 213}, language = {en} } @misc{VierhausJenihhinSonzaReorda, author = {Vierhaus, Heinrich Theodor and Jenihhin, Maksim and Sonza-Reorda, Matteo}, title = {RESCUE: Cross-Sectoral PhD Training Concept for Interdependent Reliability, Security and Quality}, series = {2018 Proceedings of the 12th European Workshop on Microelectronics Education (EWME), Braunschweig, 24-26 Sept. 2018}, journal = {2018 Proceedings of the 12th European Workshop on Microelectronics Education (EWME), Braunschweig, 24-26 Sept. 2018}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-5386-9114-4}, doi = {10.1109/EWME.2018.8629465}, pages = {45 -- 50}, language = {en} } @misc{SegabinazziFerreiraGeorgeChenetal., author = {Segabinazzi Ferreira, Raphael and George, Nevin and Chen, Junchao and H{\"u}bner, Michael and Krstic, Milos and Nolte, J{\"o}rg and Vierhaus, Heinrich Theodor}, title = {Configurable Fault Tolerant Circuits and System Level Integration for Self-Awareness}, series = {Proceedings of the Work in Progress Session held in connection with SEAA 2019, the 45th EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2019, the 22nd EUROMICRO Conference on Digital System Design}, journal = {Proceedings of the Work in Progress Session held in connection with SEAA 2019, the 45th EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2019, the 22nd EUROMICRO Conference on Digital System Design}, publisher = {SEA-Publications}, address = {Kallithea, Chalkidiki (Greece)}, isbn = {978-3-902457-54-7}, doi = {10.26127/BTUOpen-5050}, pages = {2}, abstract = {Scaling minimum features of ICs down to the 10nm- area and below has allowed high integration rates in electronics. Scaling at supply voltages of 1V and below also implies a rising level of stress which drives aging effects that reduce switching speed and the expected life time. Additionally, vulnerability from particle radiation is increased. Hence, fault detection and on- line correction become a must for many applications. However, not only fault tolerance but self-awareness becomes also an advantage. Provided that by being aware of its own healthy state allow optimized configurations regarding system operation modes and configurable hardware mechanism. This paper shows a preliminary work in a configurable circuit and explores its configuration possibilities when integrated into a complete system.}, language = {en} } @misc{JenihhinHamdiouiSonzaReordaetal., author = {Jenihhin, Maksim and Hamdioui, Said and Sonza-Reorda, Matteo and Krstic, Milos and Langend{\"o}rfer, Peter and Sauer, Christian and Klotz, Anton and H{\"u}bner, Michael and Nolte, J{\"o}rg and Vierhaus, Heinrich Theodor and Selimis, Georgions and Alexandrescu, Dan and Taouil, Mottaqiallah and Schrijen, Geert-Jan and Sterpone, Luca and Squillero, Giovanni and Dyka, Zoya and Raik, Jaan}, title = {RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems}, series = {ArXiv.org}, journal = {ArXiv.org}, pages = {7}, language = {en} }