@inproceedings{SchoelzelBachmannVierhaus, author = {Sch{\"o}lzel, Mario and Bachmann, Peter and Vierhaus, Heinrich Theodor}, title = {Application Specific Processor Design for Digital Signal Processing}, series = {Signal processing '2004, workshop proceedings, Poznan, 24th September 2004}, booktitle = {Signal processing '2004, workshop proceedings, Poznan, 24th September 2004}, editor = {Dabrowski, Adam}, publisher = {Poznan Univ. of Technology}, address = {Poznan}, isbn = {83-913251-5-6}, pages = {7 -- 15}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors}, series = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, booktitle = {IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011}, isbn = {978-1-4244-9755-3}, pages = {143 -- 146}, abstract = {Tagungsbeitrag DDECS 2011, Cottbus}, language = {en} } @inproceedings{UlbrichtSchoelzelKoaletal., author = {Ulbricht, Markus and Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {A New Hiararchical Built-In SElf Test with On-Chip Diagnosis for VLIW Processors}, abstract = {Tagungsbeitrag 23. ITG-Tagung "Test und Zuverl{\"a}ssigeit von Schaltungen und Systemen", Passau, 2011}, language = {en} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Dependability and Life Time Enhancement for Nano-Electronic Systems}, series = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, booktitle = {Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings}, publisher = {Univ. of Technology, Fac. of Computing, Chair of Control and System Engineering}, address = {Poznan}, isbn = {978-83-62065-02-8}, pages = {61 -- 67}, language = {en} } @inproceedings{KoalScheitSchoelzeletal., author = {Koal, Tobias and Scheit, Daniel and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {On the Feasibility of Built-in Self Repair for Logic Circuits}, series = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4577-1713-0}, pages = {316 -- 324}, language = {en} } @book{VierhausSteiningerPawlaketal., author = {Vierhaus, Heinrich Theodor and Steininger, Andreas and Pawlak, A. and Kraemer, Rolf and Sch{\"o}lzel, Mario and Raik, Jaan}, title = {Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems}, publisher = {Piscataway : IEEE, 2011}, isbn = {978-1-4244-9753-9}, language = {en} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {An Adaptive Self-Test Routine for In-Field Diagnosis of Permanent Faults in Simple RISC Cores}, series = {Proceedings, 15th IEEE Interantional Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, April 2012}, booktitle = {Proceedings, 15th IEEE Interantional Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, April 2012}, editor = {Raik, Jaan}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-4673-1185-4}, pages = {312 -- 317}, language = {en} } @inproceedings{MuellerSchoelzelVierhaus, author = {M{\"u}ller, Sebastian and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Hierarchical Self-repair in Heterogenous Multi-core Systems by Means of a Software-based Reconfiguration}, series = {VEFRE 8th Workshop on Dependability and Fault-Tolerance, Proceedings of ARCS 2012 Workshops}, booktitle = {VEFRE 8th Workshop on Dependability and Fault-Tolerance, Proceedings of ARCS 2012 Workshops}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-1-4673-1913-3}, pages = {7}, language = {en} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Adaptiver softwarebasierter Selbsttest einfacher RISC-Prozessoren zur Lokalisierung von permanenten Fehlern im Feld}, series = {Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband}, booktitle = {Dresdner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband}, publisher = {Fraunhofer IIS, Institutsteil EAS [u.a.]}, address = {Dresden}, isbn = {978-3-8396-0404-5}, pages = {150 -- 155}, language = {de} } @inproceedings{MuellerSchoelzelVierhaus, author = {M{\"u}ller, Sebastian and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Towards a Graceful Degradable Multicore-System by hierarchical Handling of Hard Errors}, series = {DaRMuS 2013, Special Session on Dynamic and Reliable Multicore Systems, Hosted by 21st Euromicro PDP Conference}, booktitle = {DaRMuS 2013, Special Session on Dynamic and Reliable Multicore Systems, Hosted by 21st Euromicro PDP Conference}, publisher = {IEEE}, address = {Piscataway}, isbn = {978-146-735-321-2}, pages = {302 -- 309}, language = {en} } @inproceedings{UrbanSchoelzelVierhaus, author = {Urban, Roberto and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Compilerzentrierter Mikroprozessor}, series = {Tagungsband Dredner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS 2013)}, booktitle = {Tagungsband Dredner Arbeitstagung f{\"u}r Schaltungs- und Systementwurf (DASS 2013)}, editor = {Dietrich, Manfred}, publisher = {Fraunhofer-Verl.}, address = {Stuttgart}, isbn = {978-3-8396-0545-5}, language = {de} } @inproceedings{SchoelzelKoalRoederetal., author = {Sch{\"o}lzel, Mario and Koal, Tobias and R{\"o}der, Stephanie and Vierhaus, Heinrich Theodor}, title = {Towards an Automatic Generation of Diagnostic In-Field SBST for Processor Components}, series = {Proceedings, 14th IEEE Latin American Test Workshop (LATW 2013)}, booktitle = {Proceedings, 14th IEEE Latin American Test Workshop (LATW 2013)}, publisher = {IEEE}, address = {Piscataway}, pages = {6}, language = {en} } @inproceedings{UrbanSchoelzelVierhaus, author = {Urban, Roberto and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Ein konfigurierbarer Zwischencodesimulator zum compilerzentrierten Mikroprozessorentwurf}, series = {Tagungsband Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV 2013)}, booktitle = {Tagungsband Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV 2013)}, publisher = {Univ., ITMZ}, address = {Rostock}, language = {de} } @inproceedings{KoalSchoelzelVierhaus, author = {Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Combining Fault Tolerance and Self Repair at Minimum Cost in Power and Hardware}, series = {IEEE International Symposium DDECS 2014, Warschau}, booktitle = {IEEE International Symposium DDECS 2014, Warschau}, publisher = {IEEE CS Press}, isbn = {978-1-4799-4560-3}, pages = {153 -- 159}, language = {en} } @inproceedings{UrbanLehnigerHeyneetal., author = {Urban, Roberto and Lehniger, Kai and Heyne, Maximilian and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Vergleich der Beschreibung und Simulation einer Befehlssatzarchitektur in LISA und CoMet}, series = {MBMV 2014, B{\"o}blingen, Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen}, booktitle = {MBMV 2014, B{\"o}blingen, Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen}, publisher = {Cuvillier Verlag}, address = {G{\"o}ttingen}, isbn = {978-3-95404-637-9}, pages = {101 -- 112}, language = {de} } @inproceedings{UrbanSchoelzelVierhaus, author = {Urban, Roberto and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Entwicklungsumgebung f{\"u}r den compilerzentrierten Mikroprozessorentwurf (CoMet)}, series = {DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband}, booktitle = {DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband}, publisher = {Fraunhofer Verlag}, address = {Stuttgart}, isbn = {978-3-8396-0738-1}, language = {de} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Reconfigurable High Performance Architectures}, series = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, booktitle = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, publisher = {IEEE}, isbn = {978-1-4799-3415-7}, pages = {8}, language = {en} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Systematic Generation of Diagnostic Software-Based Self-Test Routines for Processor Components}, series = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, booktitle = {19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn}, publisher = {IEEE}, isbn = {978-1-4799-3415-7}, pages = {6}, language = {en} } @inproceedings{MuellerKoalSchoelzeletal., author = {M{\"u}ller, Sebastian and Koal, Tobias and Sch{\"o}lzel, Mario and Vierhaus, Heinrich Theodor}, title = {Timing for Virtual TMR in Logic Circuits}, series = {IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014}, booktitle = {IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014}, isbn = {978-1-4799-5324-0}, language = {en} } @inproceedings{SchoelzelKoalVierhaus, author = {Sch{\"o}lzel, Mario and Koal, Tobias and Vierhaus, Heinrich Theodor}, title = {Diagnostics self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults}, series = {International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014}, booktitle = {International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-1-4799-6155-9}, pages = {27 -- 32}, language = {en} }