@inproceedings{PflanzWaltherVierhaus, author = {Pflanz, Matthias and Walther, Karsten and Vierhaus, Heinrich Theodor}, title = {On-Line Built-In Self-Check Techniken f{\"u}r zuverl{\"a}ssige eingebettete Prozessoren mit hoher Konplexit{\"a}t}, editor = {Alt, J{\"u}rgen}, language = {de} } @inproceedings{PflanzWaltherVierhaus, author = {Pflanz, Matthias and Walther, Karsten and Vierhaus, Heinrich Theodor}, title = {On-line Error Detection Techniques for Depandable Embedded Processors with High Complexity}, series = {Proceedings, Seventh International On-Line Testing Workshop, 9 - 11 July 2001, Giardini Naxos, Taormina, Italy}, booktitle = {Proceedings, Seventh International On-Line Testing Workshop, 9 - 11 July 2001, Giardini Naxos, Taormina, Italy}, isbn = {0-7695-1290-9}, pages = {51 -- 53}, language = {en} } @misc{PflanzVierhaus, author = {Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {Online Check and Recovery Techniques for Depandable Embedded Processors}, series = {IEEE micro}, volume = {21}, journal = {IEEE micro}, number = {5}, issn = {0272-1732}, pages = {24 -- 40}, language = {en} } @incollection{GlaeserStamenkovićVierhaus, author = {Gl{\"a}ser, Uwe and Stamenković, Zoran and Vierhaus, Heinrich Theodor}, title = {Testing of Synchronous Sequential Digital Circuits}, series = {The Computer Engineering Handbook}, booktitle = {The Computer Engineering Handbook}, editor = {Oklobdzija, Vojin G.}, publisher = {CRC Press}, address = {Boca Raton [u.a.]}, isbn = {0-8493-0885-2}, pages = {45-1 -- 45-22}, language = {en} } @inproceedings{PflanzWaltherGalkeetal., author = {Pflanz, Matthias and Walther, Karsten and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check}, series = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, booktitle = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {0-7695-1641-6}, pages = {69 -- 73}, language = {en} } @inproceedings{GalkePflanzVierhaus, author = {Galke, Christian and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {On-Line Detection and Compensation of Transient Errors in Processor Pipeline Structurs}, series = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, booktitle = {Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France}, publisher = {IEEE Computer Society}, address = {Los Alamitos, Calif. [u.a.]}, isbn = {0-7695-1641-6}, pages = {S. 178}, language = {en} } @inproceedings{GalkeMohauptPflanzetal., author = {Galke, Christian and Mohaupt, Thomas and Pflanz, Matthias and Vierhaus, Heinrich Theodor}, title = {Hardware/Software Based Test Techniques for Systems on a Chip with Embedded Processors}, issn = {1437-7969}, language = {en} } @inproceedings{GalkePflanzHennigetal., author = {Galke, Christian and Pflanz, Matthias and Hennig, Hardy and Vierhaus, Heinrich Theodor}, title = {Hardware/Software basierter Selbsttest f{\"u}r System on a Chip (SOCs) mit eingebetteten Prozessoren}, editor = {Wagner, Ralph}, language = {de} } @inproceedings{SchwabeGalkeVierhaus, author = {Schwabe, Hanko and Galke, Christian and Vierhaus, Heinrich Theodor}, title = {Ein funktionales Selbsttest-Konzept f{\"u}r Prozessor-Strukturen am Beispiel des Testprozessors T5016p}, language = {de} } @inproceedings{GaetzschmannVierhaus, author = {G{\"a}tzschmann, Uwe and Vierhaus, Heinrich Theodor}, title = {Ein flexibles Verfahren zur Testdaten-Kompaktierung und -Dekompaktierung f{\"u}r den Scan-Test}, language = {de} }